Applied Scanning Probe Methods V: Scanning Probe Microscopy Techniques - Rilegato

 
9783540373155: Applied Scanning Probe Methods V: Scanning Probe Microscopy Techniques
Rilegato
ISBN 10: 3540373152 ISBN 13: 9783540373155
Casa editrice: Springer Nature, 2006

Sinossi

The volumes V, VI and VII will examine the physical and technical foundation for recent progress in applied scanning probe techniques. These volumes constitute a timely comprehensive overview of SPM applications. This is the first book summarizing the state-of-the-art of this technique. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.

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Contenuti

Integrated Cantilevers and Atomic Force Microscopes.- Electrostatic Microscanner.- Low-Noise Methods for Optical Measurements of Cantilever Deflections.- Q-controlled Dynamic Force Microscopy in Air and Liquids.- High-Frequency Dynamic Force Microscopy.- Torsional Resonance Microscopy and Its Applications.- Modeling of Tip-Cantilever Dynamics in Atomic Force Microscopy.- Combined Scanning Probe Techniques for In-Situ Electrochemical Imaging at a Nanoscale.- New AFM Developments to Study Elasticity and Adhesion at the Nanoscale.- Near-Field Raman Spectroscopy and Imaging.

Product Description

Book by None

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Editore
Springer Nature
Data di pubblicazione
2006
Lingua
Inglese
ISBN 10 
3540373152
ISBN 13 
9783540373155
Rilegatura
Copertina rigida
Numero di pagine
344
Redattore
Bhushan Bharat, Fuchs Harald, Kawata Satoshi
Contatto del produttore
non disponibile
Persona responsabile
CMN Printpool Inh. Mathis Neumann
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Altre edizioni note dello stesso titolo

9783642072116: Applied Scanning Probe Methods V: Scanning Probe Microscopy Techniques

Edizione in evidenza

ISBN 10:  3642072119 ISBN 13:  9783642072116
Casa editrice: Springer, 2010
Brossura