Infrared Ellipsometry on Semiconductor Layer Structures: Phonons, Plasmons, and Polaritons: 209 - Brossura
Libro 109 di 227: Springer Tracts in Modern Physics
Sinossi
The study of semiconductor-layer structures using infrared ellipsometry is a rapidly growing field within optical spectroscopy. This book offers basic insights into the concepts of phonons, plasmons and polaritons, and the infrared dielectric function of semiconductors in layered structures. It describes how strain, composition, and the state of the atomic order within complex layer structures of multinary alloys can be determined from an infrared ellipsometry examination. Special emphasis is given to free-charge-carrier properties, and magneto-optical effects.
A broad range of experimental examples are described, including multinary alloys of zincblende and wurtzite structure semiconductor materials, and future applications such as organic layer structures and highly correlated electron systems are proposed.
Le informazioni nella sezione "Riassunto" possono far riferimento a edizioni diverse di questo titolo.
Contenuti
Introduction.- Ellipsometry.- Infrared Model Dielectric Functions.- Polaritons in Semiconductor Layer Structures.- Anisotropic Substrates.- Zinsblende-Structure Materials (III-V).- Wurtzite-Structure Materials (Group-III Nitrides, ZnO).- Magneto-optic Ellipsometry.
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Infrared Ellipsometry on Semiconductor Layer Structures (eng)
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Infrared Ellipsometry on Semiconductor Layer Structures
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Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The study of semiconductor-layer structures using infrared ellipsometry is a rapidly growing field within optical spectroscopy. This book offers basic insights into the concepts of phonons, plasmons and polaritons, and the infrared dielectric function of semiconductors in layered structures. It describes how strain, composition, and the state of the atomic order within complex layer structures of multinary alloys can be determined from an infrared ellipsometry examination. Special emphasis is given to free-charge-carrier properties, and magneto-optical effects. A broad range of experimental examples are described, including multinary alloys of zincblende and wurtzite structure semiconductor materials, and future applications such as organic layer structures and highly correlated electron systems are proposed. 208 pp. Englisch. Codice articolo 9783642062285
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Infrared Ellipsometry on Semiconductor Layer Structures
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Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Describes a powerful new method for investigating semiconductor layer structuresAuthor is a leading expert in the fieldThe study of semiconductor-layer structures using infrared ellipsometry is a rapidly growing field within optical spe. Codice articolo 5045342
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Taschenbuch. Condizione: Neu. Infrared Ellipsometry on Semiconductor Layer Structures | Phonons, Plasmons, and Polaritons | Mathias Schubert | Taschenbuch | Springer Tracts in Modern Physics | xi | Englisch | 2010 | Springer | EAN 9783642062285 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu. Codice articolo 107176075
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Infrared Ellipsometry on Semiconductor Layer Structures
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Taschenbuch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -The study of semiconductor-layer structures using infrared ellipsometry is a rapidly growing field within optical spectroscopy. This book offers basic insights into the concepts of phonons, plasmons and polaritons, and the infrared dielectric function of semiconductors in layered structures. It describes how strain, composition, and the state of the atomic order within complex layer structures of multinary alloys can be determined from an infrared ellipsometry examination. Special emphasis is given to free-charge-carrier properties, and magneto-optical effects. A broad range of experimental examples are described, including multinary alloys of zincblende and wurtzite structure semiconductor materials, and future applications such as organic layer structures and highly correlated electron systems are proposed.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 208 pp. Englisch. Codice articolo 9783642062285
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Infrared Ellipsometry on Semiconductor Layer Structures : Phonons, Plasmons, and Polaritons
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Springer Berlin Heidelberg, Springer Berlin Heidelberg, 2010
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ISBN 13: 9783642062285
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Taschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - The study of semiconductor-layer structures using infrared ellipsometry is a rapidly growing field within optical spectroscopy. This book offers basic insights into the concepts of phonons, plasmons and polaritons, and the infrared dielectric function of semiconductors in layered structures. It describes how strain, composition, and the state of the atomic order within complex layer structures of multinary alloys can be determined from an infrared ellipsometry examination. Special emphasis is given to free-charge-carrier properties, and magneto-optical effects. A broad range of experimental examples are described, including multinary alloys of zincblende and wurtzite structure semiconductor materials, and future applications such as organic layer structures and highly correlated electron systems are proposed. Codice articolo 9783642062285
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Infrared Ellipsometry on Semiconductor Layer Structures: Phonons, Plasmons, and Polaritons (Springer Tracts in Modern Physics)
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