9783642062285 - infrared ellipsometry on semiconductor layer structures: phonons, plasmons, and polaritons: 209 di schubert, mathias (9 risultati)
Lingua: Inglese
Editore: Springer, 2010
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Da: Ria Christie Collections, Uxbridge, Regno UnitoRia Christie Collections
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Altre immaginiLingua: Inglese
Editore: Springer, 2010
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Da: preigu, Osnabrück, Germaniapreigu
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Taschenbuch. Condizione: Neu. Infrared Ellipsometry on Semiconductor Layer Structures | Phonons, Plasmons, and Polaritons | Mathias Schubert | Taschenbuch | Springer Tracts in Modern Physics | xi | Englisch | 2010 | Springer | EAN 9783642062285 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 H…eidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
Lingua: Inglese
Editore: Springer Spektrum, 2010
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Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH
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Taschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - The study of semiconductor-layer structures using infrared ellipsometry is a rapidly growing field within optical spectroscopy. This book offers basic insights into the concepts of phonons, plasmons and polaritons, and the infrared dielectric func…tion of semiconductors in layered structures. It describes how strain, composition, and the state of the atomic order within complex layer structures of multinary alloys can be determined from an infrared ellipsometry examination. Special emphasis is given to free-charge-carrier properties, and magneto-optical effects. A broad range of experimental examples are described, including multinary alloys of zincblende and wurtzite structure semiconductor materials, and future applications such as organic layer structures and highly correlated electron systems are proposed.
Lingua: Inglese
Editore: Springer Berlin Heidelberg, 2005
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Da: Revaluation Books, Exeter, Regno UnitoRevaluation Books
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Paperback. Condizione: Brand New. 193 pages. 9.30x6.00x0.47 inches. In Stock.
Lingua: Inglese
Editore: Springer, 2010
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Condizione: Brand New. New. US edition. Print on demand title. Delivery takes 20-25 days. Excellent Customer Service.
Lingua: Inglese
Editore: Springer, 2010
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Da: Brook Bookstore On Demand, Napoli, NA, ItaliaBrook Bookstore On Demand
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Condizione: new. Questo è un articolo print on demand.
Lingua: Inglese
Editore: Springer Berlin Heidelberg Nov 2010, 2010
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Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermaniaBuchWeltWeit Ludwig Meier e.K.
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Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The study of semiconductor-layer structures using infrared ellipsometry is a rapidly growing field within optical spectroscopy. This book offers basic insights into the concepts of phonons, plasmons and polaritons, and the infrared… dielectric function of semiconductors in layered structures. It describes how strain, composition, and the state of the atomic order within complex layer structures of multinary alloys can be determined from an infrared ellipsometry examination. Special emphasis is given to free-charge-carrier properties, and magneto-optical effects. A broad range of experimental examples are described, including multinary alloys of zincblende and wurtzite structure semiconductor materials, and future applications such as organic layer structures and highly correlated electron systems are proposed. 208 pp. Englisch.
Lingua: Inglese
Editore: Springer Berlin Heidelberg, 2010
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Da: moluna, Greven, Germaniamoluna
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Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Describes a powerful new method for investigating semiconductor layer structuresAuthor is a leading expert in the fieldThe study of semiconductor-layer structures using infrared ellipsometry is a rapidly growing fiel…d within optical spe.
Lingua: Inglese
Editore: Springer, Springer Vieweg Nov 2010, 2010
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Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germaniabuchversandmimpf2000
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Taschenbuch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -The study of semiconductor-layer structures using infrared ellipsometry is a rapidly growing field within optical spectroscopy. This book offers basic insights into the concepts of phonons, plasmons and polaritons, and the infrared die…lectric function of semiconductors in layered structures. It describes how strain, composition, and the state of the atomic order within complex layer structures of multinary alloys can be determined from an infrared ellipsometry examination. Special emphasis is given to free-charge-carrier properties, and magneto-optical effects. A broad range of experimental examples are described, including multinary alloys of zincblende and wurtzite structure semiconductor materials, and future applications such as organic layer structures and highly correlated electron systems are proposed.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 208 pp. Englisch.
