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Reconfigurable Field Programmable Gate Arrays (FPGAs) are extensively employed in various application domains due to their flexibility, high–density functionality, high performance and low–cost development. However, the challenge that must be tackled during system design is their high susceptibility to the radiation induced faults such as Single Event Effects (SEEs). These radiation induced faults are a major concern in safety and mission critical systems such as automotive and avionics systems. In general, most of today’s commercial off-the shelf (COTS) FPGAs are not designed to work under these harsh environments, except for specific circuits that have been radiation–hardened at the fabrication process level, but at a very high cost overhead, which makes them less interesting from an economic and performance point of view. The work presented in this manuscript is a contribution to a multi-partner project, aims to develop a low–cost reliable FPGA architecture with supporting EDA tool-suite that offers a complete environment for a fault tolerant system design.

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Chagun Basha Basheer Ahmed
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Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Reconfigurable Field Programmable Gate Arrays (FPGAs) are extensively employed in various application domains due to their flexibility, high-density functionality, high performance and low-cost development. However, the challenge that must be tackled during system design is their high susceptibility to the radiation induced faults such as Single Event Effects (SEEs). These radiation induced faults are a major concern in safety and mission critical systems such as automotive and avionics systems. In general, most of today's commercial off-the shelf (COTS) FPGAs are not designed to work under these harsh environments, except for specific circuits that have been radiation-hardened at the fabrication process level, but at a very high cost overhead, which makes them less interesting from an economic and performance point of view. The work presented in this manuscript is a contribution to a multi-partner project, aims to develop a low-cost reliable FPGA architecture with supporting EDA tool-suite that offers a complete environment for a fault tolerant system design. 176 pp. Englisch. Codice articolo 9783659917028

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Chagun Basha Basheer Ahmed
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Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: Basheer Ahmed Chagun BashaB. Chagun Basha is a research fellow in the field of fault-tolerant computing and reliable computer architectures. He was associated with CNRS-IETR (Nantes) and INRIS-IRISA (Lannion), France. Prior to that, . Codice articolo 158248887

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Chagun Basha Basheer Ahmed
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Taschenbuch. Condizione: Neu. Neuware -Reconfigurable Field Programmable Gate Arrays (FPGAs) are extensively employed in various application domains due to their flexibility, high¿density functionality, high performance and low¿cost development. However, the challenge that must be tackled during system design is their high susceptibility to the radiation induced faults such as Single Event Effects (SEEs). These radiation induced faults are a major concern in safety and mission critical systems such as automotive and avionics systems. In general, most of today¿s commercial off-the shelf (COTS) FPGAs are not designed to work under these harsh environments, except for specific circuits that have been radiation¿hardened at the fabrication process level, but at a very high cost overhead, which makes them less interesting from an economic and performance point of view. The work presented in this manuscript is a contribution to a multi-partner project, aims to develop a low¿cost reliable FPGA architecture with supporting EDA tool-suite that offers a complete environment for a fault tolerant system design.Books on Demand GmbH, Überseering 33, 22297 Hamburg 176 pp. Englisch. Codice articolo 9783659917028

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Taschenbuch. Condizione: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - Reconfigurable Field Programmable Gate Arrays (FPGAs) are extensively employed in various application domains due to their flexibility, high-density functionality, high performance and low-cost development. However, the challenge that must be tackled during system design is their high susceptibility to the radiation induced faults such as Single Event Effects (SEEs). These radiation induced faults are a major concern in safety and mission critical systems such as automotive and avionics systems. In general, most of today's commercial off-the shelf (COTS) FPGAs are not designed to work under these harsh environments, except for specific circuits that have been radiation-hardened at the fabrication process level, but at a very high cost overhead, which makes them less interesting from an economic and performance point of view. The work presented in this manuscript is a contribution to a multi-partner project, aims to develop a low-cost reliable FPGA architecture with supporting EDA tool-suite that offers a complete environment for a fault tolerant system design. Codice articolo 9783659917028

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