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A Fresh View on Impact Ionization Process: Multistage Scattering Model: Estimation of Ionization Rates of Charge Carriers in Different Semiconductors and in Monolayer Graphene Nanoribbons - Brossura
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This book is presenting a new way of looking into the well-known impact ionization phenomena in reverse biased p-n junctions. It is intended as a text for postgraduate students in applied physics, electrical and electronics engineering and material science. It can exclusively serve as a reference for the scientists who are working in the area of semiconductor device simulation and modeling. The analytical approach of representing impact ionization phenomena based on multistage scattering model will be extremely helpful for the researchers working in the above-mentioned areas of research. The procedure of estimating the ionization rate of charge carriers in different semiconductors and monolayer grapheme nanoribbons via multistage scattering model has been presented in different chapters of this book. The influences of acoustic phonon scattering as well as externally applied steady magnetic field on the ionization rates has also been described in detail in subsequent chapters.
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A Fresh View on Impact Ionization Process: Multistage Scattering Model
Editore:
LAP LAMBERT Academic Publishing Okt 2017, 2017
ISBN 10: 3659932590
ISBN 13: 9783659932595
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Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germania
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Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book is presenting a new way of looking into the well-known impact ionization phenomena in reverse biased p-n junctions. It is intended as a text for postgraduate students in applied physics, electrical and electronics engineering and material science. It can exclusively serve as a reference for the scientists who are working in the area of semiconductor device simulation and modeling. The analytical approach of representing impact ionization phenomena based on multistage scattering model will be extremely helpful for the researchers working in the above-mentioned areas of research. The procedure of estimating the ionization rate of charge carriers in different semiconductors and monolayer grapheme nanoribbons via multistage scattering model has been presented in different chapters of this book. The influences of acoustic phonon scattering as well as externally applied steady magnetic field on the ionization rates has also been described in detail in subsequent chapters. 116 pp. Englisch. Codice articolo 9783659932595
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A Fresh View on Impact Ionization Process: Multistage Scattering Model : Estimation of Ionization Rates of Charge Carriers in Different Semiconductors and in Monolayer Graphene Nanoribbons
Editore:
LAP LAMBERT Academic Publishing, 2017
ISBN 10: 3659932590
ISBN 13: 9783659932595
Nuovo
Taschenbuch
Da: AHA-BUCH GmbH, Einbeck, Germania
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Taschenbuch. Condizione: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - This book is presenting a new way of looking into the well-known impact ionization phenomena in reverse biased p-n junctions. It is intended as a text for postgraduate students in applied physics, electrical and electronics engineering and material science. It can exclusively serve as a reference for the scientists who are working in the area of semiconductor device simulation and modeling. The analytical approach of representing impact ionization phenomena based on multistage scattering model will be extremely helpful for the researchers working in the above-mentioned areas of research. The procedure of estimating the ionization rate of charge carriers in different semiconductors and monolayer grapheme nanoribbons via multistage scattering model has been presented in different chapters of this book. The influences of acoustic phonon scattering as well as externally applied steady magnetic field on the ionization rates has also been described in detail in subsequent chapters. Codice articolo 9783659932595
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A Fresh View on Impact Ionization Process: Multistage Scattering Model
Editore:
LAP LAMBERT Academic Publishing, 2017
ISBN 10: 3659932590
ISBN 13: 9783659932595
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Brossura
Da: moluna, Greven, Germania
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Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: Acharyya AritraDr. Aritra Acharyya is currently working as an Assistant Professor of Department of ECE, Cooch Behar Government Engineering College, W.B., India. His research interests are high speed semiconductor devices, transport p. Codice articolo 385770932
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A Fresh View on Impact Ionization Process: Multistage Scattering Model
Editore:
LAP LAMBERT Academic Publishing Okt 2017, 2017
ISBN 10: 3659932590
ISBN 13: 9783659932595
Nuovo
Taschenbuch
Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germania
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Taschenbuch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book is presenting a new way of looking into the well-known impact ionization phenomena in reverse biased p-n junctions. It is intended as a text for postgraduate students in applied physics, electrical and electronics engineering and material science. It can exclusively serve as a reference for the scientists who are working in the area of semiconductor device simulation and modeling. The analytical approach of representing impact ionization phenomena based on multistage scattering model will be extremely helpful for the researchers working in the above-mentioned areas of research. The procedure of estimating the ionization rate of charge carriers in different semiconductors and monolayer grapheme nanoribbons via multistage scattering model has been presented in different chapters of this book. The influences of acoustic phonon scattering as well as externally applied steady magnetic field on the ionization rates has also been described in detail in subsequent chapters.VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 116 pp. Englisch. Codice articolo 9783659932595
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