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Genetic Analysis in Soybean: Study of Genetic Variability, Correlation Coefficient, Path Analysis and Genetic Divergence in Soybean - Brossura
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A field experiment was carried out at Navsari Agriculture University, Gujarat (India) for the estimation of Genetic Variability, Heritability, Genetic Advance, Correlation, Path Analysis and Genetic Divergence in 36 soybean genotypes obtained from different eco-geographical regions of India. The highest genotypic and phenotypic coefficient of variances were observed for plant height followed by seed yield per plant and pods per plant and it was lowest for days to 50% flowering, days to maturity, protein content and pod length. High heritability and genetic advance were observed for plant height, seed yield per plant and pods per plant. Seed yield per plant was positively and significantly correlated with plant height, pods per plant, days to 50 per cent flowering and days to maturity. Pod per plant recorded highest positive direct effect on seed yield per plant followed plant height. However, there was a substantial genetic diversity between the genotypes with D2 values ranging from 33.64 to 379.08. Thirty six genotypes were grouped into six clusters. The clustering pattern revealed that genetic diversity was not necessarily associated with geographical diversity in this crop.
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L'autore
Sunil S. Patil completed his Post Graduation in Genetics and Plant Breeding from N.A.U.,Navsari and presently doing Ph. D. in Genetic and Plant Breeding from Navsari Agricultural University, Navsari, Gujarat (India). Sunil have an experience of working in different research schemes of univ. as a ‘Senior Research Fellow'.
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Genetic Analysis in Soybean
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LAP LAMBERT Academic Publishing Mai 2012, 2012
ISBN 10: 3847340654
ISBN 13: 9783847340652
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Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -A field experiment was carried out at Navsari Agriculture University, Gujarat (India) for the estimation of Genetic Variability, Heritability, Genetic Advance, Correlation, Path Analysis and Genetic Divergence in 36 soybean genotypes obtained from different eco-geographical regions of India. The highest genotypic and phenotypic coefficient of variances were observed for plant height followed by seed yield per plant and pods per plant and it was lowest for days to 50% flowering, days to maturity, protein content and pod length. High heritability and genetic advance were observed for plant height, seed yield per plant and pods per plant. Seed yield per plant was positively and significantly correlated with plant height, pods per plant, days to 50 per cent flowering and days to maturity. Pod per plant recorded highest positive direct effect on seed yield per plant followed plant height. However, there was a substantial genetic diversity between the genotypes with D2 values ranging from 33.64 to 379.08. Thirty six genotypes were grouped into six clusters. The clustering pattern revealed that genetic diversity was not necessarily associated with geographical diversity in this crop. 112 pp. Englisch. Codice articolo 9783847340652
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Genetic Analysis in Soybean
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VDM Verlag Dr. Mueller Aktiengesellschaft & Co. KG, 2012
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Condizione: New. pp. 112. Codice articolo 26126946802
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Genetic Analysis in Soybean : Study of Genetic Variability, Correlation Coefficient, Path Analysis and Genetic Divergence in Soybean
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LAP LAMBERT Academic Publishing, 2012
ISBN 10: 3847340654
ISBN 13: 9783847340652
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Taschenbuch. Condizione: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - A field experiment was carried out at Navsari Agriculture University, Gujarat (India) for the estimation of Genetic Variability, Heritability, Genetic Advance, Correlation, Path Analysis and Genetic Divergence in 36 soybean genotypes obtained from different eco-geographical regions of India. The highest genotypic and phenotypic coefficient of variances were observed for plant height followed by seed yield per plant and pods per plant and it was lowest for days to 50% flowering, days to maturity, protein content and pod length. High heritability and genetic advance were observed for plant height, seed yield per plant and pods per plant. Seed yield per plant was positively and significantly correlated with plant height, pods per plant, days to 50 per cent flowering and days to maturity. Pod per plant recorded highest positive direct effect on seed yield per plant followed plant height. However, there was a substantial genetic diversity between the genotypes with D2 values ranging from 33.64 to 379.08. Thirty six genotypes were grouped into six clusters. The clustering pattern revealed that genetic diversity was not necessarily associated with geographical diversity in this crop. Codice articolo 9783847340652
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Genetic Analysis in Soybean
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VDM Verlag Dr. Mueller Aktiengesellschaft & Co. KG, 2012
ISBN 10: 3847340654
ISBN 13: 9783847340652
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Condizione: New. Print on Demand pp. 112 2:B&W 6 x 9 in or 229 x 152 mm Perfect Bound on Creme w/Gloss Lam. Codice articolo 132559405
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Genetic Analysis in Soybean
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VDM Verlag Dr. Mueller Aktiengesellschaft & Co. KG, 2012
ISBN 10: 3847340654
ISBN 13: 9783847340652
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Condizione: New. PRINT ON DEMAND pp. 112. Codice articolo 18126946808
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Genetic Analysis in Soybean
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ISBN 13: 9783847340652
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Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: Patil Sunil S.Sunil S. Patil completed his Post Graduation in Genetics and Plant Breeding from N.A.U.,Navsari and presently doing Ph. D. in Genetic and Plant Breeding from Navsari Agricultural University, Navsari, Gujarat (India). Su. Codice articolo 5511217
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Genetic Analysis in Soybean
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LAP LAMBERT Academic Publishing Mai 2012, 2012
ISBN 10: 3847340654
ISBN 13: 9783847340652
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Taschenbuch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -A field experiment was carried out at Navsari Agriculture University, Gujarat (India) for the estimation of Genetic Variability, Heritability, Genetic Advance, Correlation, Path Analysis and Genetic Divergence in 36 soybean genotypes obtained from different eco-geographical regions of India. The highest genotypic and phenotypic coefficient of variances were observed for plant height followed by seed yield per plant and pods per plant and it was lowest for days to 50% flowering, days to maturity, protein content and pod length. High heritability and genetic advance were observed for plant height, seed yield per plant and pods per plant. Seed yield per plant was positively and significantly correlated with plant height, pods per plant, days to 50 per cent flowering and days to maturity. Pod per plant recorded highest positive direct effect on seed yield per plant followed plant height. However, there was a substantial genetic diversity between the genotypes with D2 values ranging from 33.64 to 379.08. Thirty six genotypes were grouped into six clusters. The clustering pattern revealed that genetic diversity was not necessarily associated with geographical diversity in this crop.VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 112 pp. Englisch. Codice articolo 9783847340652
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Genetic Analysis in Soybean | Study of Genetic Variability, Correlation Coefficient, Path Analysis and Genetic Divergence in Soybean
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LAP LAMBERT Academic Publishing, 2012
ISBN 10: 3847340654
ISBN 13: 9783847340652
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Taschenbuch. Condizione: Neu. Genetic Analysis in Soybean | Study of Genetic Variability, Correlation Coefficient, Path Analysis and Genetic Divergence in Soybean | Sunil S. Patil (u. a.) | Taschenbuch | 112 S. | Englisch | 2012 | LAP LAMBERT Academic Publishing | EAN 9783847340652 | Verantwortliche Person für die EU: BoD - Books on Demand, In de Tarpen 42, 22848 Norderstedt, info[at]bod[dot]de | Anbieter: preigu. Codice articolo 106407880
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