Atomic force microscopy: Scanning probe microscopy, Scanning tunneling microscope, Heinrich Rohrer, IBM Research - Zurich, Piezoelectricity, Nanometre - Brossura

 
9786132722157: Atomic force microscopy: Scanning probe microscopy, Scanning tunneling microscope, Heinrich Rohrer, IBM Research - Zurich, Piezoelectricity, Nanometre
Brossura
ISBN 10: 6132722157 ISBN 13: 9786132722157
Casa editrice: Alphascript Publishing, 2010

Sinossi

Please note that the content of this book primarily consists of articles available from Wikipedia or other free sources online. Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. The precursor to the AFM, the scanning tunneling microscope, was developed by Gerd Binnig and Heinrich Rohrer in the early 1980s at IBM Research - Zurich, a development that earned them the Nobel Prize for Physics in 1986. Binnig, Quate and Gerber invented the first atomic force microscope (also abbreviated as AFM) in 1986.

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Editore
Alphascript Publishing
Data di pubblicazione
2010
Lingua
Inglese
ISBN 10 
6132722157
ISBN 13 
9786132722157
Rilegatura
Copertina flessibile
Numero di pagine
72
Redattore
Miller Frederic P., Vandome Agnes F., McBrewster John
Contatto del produttore
non disponibile
Persona responsabile
non disponibile