Sinossi
The charged particles can cause adverse effects on spacecraft and electronics components. Radiation effects from high energy particles cause spacecraft surface charging, degradation or permanent failure of the electronic components and sub systems by single event effects, displacement damages and ionizing dose effects in the spacecraft. The effects of ion-induced charge transients can be divided in the basic three categories: Total ionizing dose (TID), linear energy transfer (LET) and Single event upset (SEU).TID effect is accumulation of ionizing energy deposited over a long period on semiconductor materials. TID occurs mostly due to the electrons and protons, which can cause failure of device. The total energy loss or transfer to the material per unit distance of travel trough the material is called LET Electronic devices can be disturbed by the passage of energetic electrons, protons or heavier ions that may alter the state of a circuit, producing "single event effects". SEU and multiple-bit upset (MBU) which change the logic state of internal nodes of the circuit. It can be reset by different electrical operations. These errors are called soft errors which are recoverable.
Le informazioni nella sezione "Riassunto" possono far riferimento a edizioni diverse di questo titolo.
L'autore
Keyur Mahant was born in Cambay, India on August 2, 1986. He received B.Tech in Electronics and communication from C U Shah College of engineering and technology, India in 2008. He has also received M.Tech in Communication system from CHARUSAT University, India in 2011. Currently, he is pursuing his PhD in the field of RF and Microwave.
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Space Radiation Monitoring Instrumentation
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LAP LAMBERT Academic Publishing Jan 2018, 2018
ISBN 10: 6136718251
ISBN 13: 9786136718255
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Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The charged particles can cause adverse effects on spacecraft and electronics components. Radiation effects from high energy particles cause spacecraft surface charging, degradation or permanent failure of the electronic components and sub systems by single event effects, displacement damages and ionizing dose effects in the spacecraft. The effects of ion-induced charge transients can be divided in the basic three categories: Total ionizing dose (TID), linear energy transfer (LET) and Single event upset (SEU).TID effect is accumulation of ionizing energy deposited over a long period on semiconductor materials. TID occurs mostly due to the electrons and protons, which can cause failure of device. The total energy loss or transfer to the material per unit distance of travel trough the material is called LET Electronic devices can be disturbed by the passage of energetic electrons, protons or heavier ions that may alter the state of a circuit, producing 'single event effects'. SEU and multiple-bit upset (MBU) which change the logic state of internal nodes of the circuit. It can be reset by different electrical operations. These errors are called soft errors which are recoverable. 56 pp. Englisch. Codice articolo 9786136718255
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Taschenbuch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -The charged particles can cause adverse effects on spacecraft and electronics components. Radiation effects from high energy particles cause spacecraft surface charging, degradation or permanent failure of the electronic components and sub systems by single event effects, displacement damages and ionizing dose effects in the spacecraft. The effects of ion-induced charge transients can be divided in the basic three categories: Total ionizing dose (TID), linear energy transfer (LET) and Single event upset (SEU).TID effect is accumulation of ionizing energy deposited over a long period on semiconductor materials. TID occurs mostly due to the electrons and protons, which can cause failure of device. The total energy loss or transfer to the material per unit distance of travel trough the material is called LET Electronic devices can be disturbed by the passage of energetic electrons, protons or heavier ions that may alter the state of a circuit, producing 'single event effects'. SEU and multiple-bit upset (MBU) which change the logic state of internal nodes of the circuit. It can be reset by different electrical operations. These errors are called soft errors which are recoverable.VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 56 pp. Englisch. Codice articolo 9786136718255
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Space Radiation Monitoring Instrumentation
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Taschenbuch. Condizione: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - The charged particles can cause adverse effects on spacecraft and electronics components. Radiation effects from high energy particles cause spacecraft surface charging, degradation or permanent failure of the electronic components and sub systems by single event effects, displacement damages and ionizing dose effects in the spacecraft. The effects of ion-induced charge transients can be divided in the basic three categories: Total ionizing dose (TID), linear energy transfer (LET) and Single event upset (SEU).TID effect is accumulation of ionizing energy deposited over a long period on semiconductor materials. TID occurs mostly due to the electrons and protons, which can cause failure of device. The total energy loss or transfer to the material per unit distance of travel trough the material is called LET Electronic devices can be disturbed by the passage of energetic electrons, protons or heavier ions that may alter the state of a circuit, producing 'single event effects'. SEU and multiple-bit upset (MBU) which change the logic state of internal nodes of the circuit. It can be reset by different electrical operations. These errors are called soft errors which are recoverable. Codice articolo 9786136718255
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Taschenbuch. Condizione: Neu. Space Radiation Monitoring Instrumentation | Keyur Mahant (u. a.) | Taschenbuch | 56 S. | Englisch | 2018 | LAP LAMBERT Academic Publishing | EAN 9786136718255 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de | Anbieter: preigu. Codice articolo 111328961
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Space Radiation Monitoring Instrumentation
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ISBN 13: 9786136718255
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