9786136718255 - space radiation monitoring instrumentation di mahant, keyur; mewada, hiren; patel, amit (6 risultati)
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Da: Revaluation Books, Exeter, Regno UnitoRevaluation Books
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 62,41
EUR 11,70 spedizioneSpedito da Regno Unito a U.S.A.Quantità: 1 disponibili
Paperback. Condizione: Brand New. 56 pages. 8.66x5.91x0.13 inches. In Stock.
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Da: preigu, Osnabrück, Germaniapreigu
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 33,25
EUR 70,00 spedizioneSpedito da Germania a U.S.A.Quantità: 5 disponibili
Taschenbuch. Condizione: Neu. Space Radiation Monitoring Instrumentation | Keyur Mahant (u. a.) | Taschenbuch | 56 S. | Englisch | 2018 | LAP LAMBERT Academic Publishing | EAN 9786136718255 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de | Anbieter: preig…u.
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Da: Mispah books, Redhill, SURRE, Regno UnitoMispah books
Contatta il venditoreVenditore con 4 stelleCondizione: Nuovo
EUR 141,03
EUR 29,26 spedizioneSpedito da Regno Unito a U.S.A.Quantità: 1 disponibili
paperback. Condizione: New. NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
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- Print on Demand
Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermaniaBuchWeltWeit Ludwig Meier e.K.
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 35,90
EUR 23,00 spedizioneSpedito da Germania a U.S.A.Quantità: 1 disponibili
Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The charged particles can cause adverse effects on spacecraft and electronics components. Radiation effects from high energy particles cause spacecraft surface charging, degradation or permanent failure of the electronic components… and sub systems by single event effects, displacement damages and ionizing dose effects in the spacecraft. The effects of ion-induced charge transients can be divided in the basic three categories: Total ionizing dose (TID), linear energy transfer (LET) and Single event upset (SEU).TID effect is accumulation of ionizing energy deposited over a long period on semiconductor materials. TID occurs mostly due to the electrons and protons, which can cause failure of device. The total energy loss or transfer to the material per unit distance of travel trough the material is called LET Electronic devices can be disturbed by the passage of energetic electrons, protons or heavier ions that may alter the state of a circuit, producing 'single event effects'. SEU and multiple-bit upset (MBU) which change the logic state of internal nodes of the circuit. It can be reset by different electrical operations. These errors are called soft errors which are recoverable. 56 pp. Englisch.
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- Print on Demand
Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germaniabuchversandmimpf2000
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 35,90
EUR 60,00 spedizioneSpedito da Germania a U.S.A.Quantità: 1 disponibili
Taschenbuch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -The charged particles can cause adverse effects on spacecraft and electronics components. Radiation effects from high energy particles cause spacecraft surface charging, degradation or permanent failure of the electronic components and… sub systems by single event effects, displacement damages and ionizing dose effects in the spacecraft. The effects of ion-induced charge transients can be divided in the basic three categories: Total ionizing dose (TID), linear energy transfer (LET) and Single event upset (SEU).TID effect is accumulation of ionizing energy deposited over a long period on semiconductor materials. TID occurs mostly due to the electrons and protons, which can cause failure of device. The total energy loss or transfer to the material per unit distance of travel trough the material is called LET Electronic devices can be disturbed by the passage of energetic electrons, protons or heavier ions that may alter the state of a circuit, producing 'single event effects'. SEU and multiple-bit upset (MBU) which change the logic state of internal nodes of the circuit. It can be reset by different electrical operations. These errors are called soft errors which are recoverable.VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 56 pp. Englisch.
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- Print on Demand
Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 37,20
EUR 60,51 spedizioneSpedito da Germania a U.S.A.Quantità: 1 disponibili
Taschenbuch. Condizione: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - The charged particles can cause adverse effects on spacecraft and electronics components. Radiation effects from high energy particles cause spacecraft surface charging, degradation or permanent failure of the electronic components and…sub systems by single event effects, displacement damages and ionizing dose effects in the spacecraft. The effects of ion-induced charge transients can be divided in the basic three categories: Total ionizing dose (TID), linear energy transfer (LET) and Single event upset (SEU).TID effect is accumulation of ionizing energy deposited over a long period on semiconductor materials. TID occurs mostly due to the electrons and protons, which can cause failure of device. The total energy loss or transfer to the material per unit distance of travel trough the material is called LET Electronic devices can be disturbed by the passage of energetic electrons, protons or heavier ions that may alter the state of a circuit, producing 'single event effects'. SEU and multiple-bit upset (MBU) which change the logic state of internal nodes of the circuit. It can be reset by different electrical operations. These errors are called soft errors which are recoverable.
