TESTING OF eSRAM USING MMC- Algorithm And Parasitic Extraction Method - Brossura

Parvathi, Muddapu; Vasantha, N.; Satya Prasad, K.

 
9786202095464: TESTING OF eSRAM USING MMC- Algorithm And Parasitic Extraction Method
Brossura
ISBN 10: 6202095466 ISBN 13: 9786202095464
Casa editrice: LAP LAMBERT Academic Publishing, 2017

Sinossi

The intention of the book is to highlight core issues of current technology relevant to embedded SRAM, testing methods and need of new test requirements. The importance of March algorithms and in depth working including examples were clearly shown. The failures of existing March algorithms and hence the development of MMC- (Modified March C-) algorithm will increase the reader interest in exploring much more test algorithms required for e-SRAM. Above this, the testing method using Parasitic extraction of R & C developed using Cadence tools and Microwind is highlight of the investigations. The layout level parasitic extraction of R&C method was applied on all possible SRAM fault models using 'bridge/short' created in electrical circuit environment. Using parasitic memory effect, fault detection dictionary was an outcome this research in which each fault model behavior is highlighted in terms of R & C at different technology nodes. The chosen technology nodes are 90nm, 120nm, and 180nm. This method was extended to few two cell fault models and discussed on coupling faults.

Le informazioni nella sezione "Riassunto" possono far riferimento a edizioni diverse di questo titolo.

Editore
LAP LAMBERT Academic Publishing
Data di pubblicazione
2017
Lingua
Inglese
ISBN 10 
6202095466
ISBN 13 
9786202095464
Rilegatura
Copertina flessibile
Numero di pagine
252
Contatto del produttore
non disponibile
Persona responsabile
KreGa Onlinehandel GmbH
4950000000000
info@krega-onlinehandel.de

Birkenweg 31
Brakel
33034
Germania