Sinossi
Very Large Scale Integration (VLSI) is a process of creating an integrated circuit by linking a large number of transistors into a single chip. A 3D IC provides a positive effect on both execution and wirelength in a power system. A three dimensional integrated circuit would become a developing process where connection delays and power get reduced. The several layers of 3D IC which have been linked could be performed by utilizing through silicon via method. It offers better performance than the conventional approach due to decreased length and power consumption. A test access mechanism technique has become significant owing to the impact of sinking routing cost. If a large number of TSV has been employed, then it leads to superior area consumption and increases ultimate chip cost. Uneven distribution of TSV is occurred owing to the bonding stratum procedure. It affects not only the area but also wirelength and temperature. At the routing phase, through silicon via could be done by identifying whitespace from integrated circuit system.
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OPTIMIZATION OF THERMAL AWARE MULTILEVEL ROUTING FOR 3D IC
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LAP LAMBERT Academic Publishing Jan 2022, 2022
ISBN 10: 6204741314
ISBN 13: 9786204741314
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Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Very Large Scale Integration (VLSI) is a process of creating an integrated circuit by linking a large number of transistors into a single chip. A 3D IC provides a positive effect on both execution and wirelength in a power system. A three dimensional integrated circuit would become a developing process where connection delays and power get reduced. The several layers of 3D IC which have been linked could be performed by utilizing through silicon via method. It offers better performance than the conventional approach due to decreased length and power consumption. A test access mechanism technique has become significant owing to the impact of sinking routing cost. If a large number of TSV has been employed, then it leads to superior area consumption and increases ultimate chip cost. Uneven distribution of TSV is occurred owing to the bonding stratum procedure. It affects not only the area but also wirelength and temperature. At the routing phase, through silicon via could be done by identifying whitespace from integrated circuit system. 188 pp. Englisch. Codice articolo 9786204741314
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OPTIMIZATION OF THERMAL AWARE MULTILEVEL ROUTING FOR 3D IC
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LAP Lambert Academic Publishing, 2022
ISBN 10: 6204741314
ISBN 13: 9786204741314
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Kartoniert / Broschiert. Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Very Large Scale Integration (VLSI) is a process of creating an integrated circuit by linking a large number of transistors into a single chip. A 3D IC provides a positive effect on both execution and wirelength in a power system. A three dimensional integr. Codice articolo 567324681
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OPTIMIZATION OF THERMAL AWARE MULTILEVEL ROUTING FOR 3D IC | VLSI PHYSICAL DESIGN
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LAP LAMBERT Academic Publishing, 2022
ISBN 10: 6204741314
ISBN 13: 9786204741314
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Taschenbuch. Condizione: Neu. OPTIMIZATION OF THERMAL AWARE MULTILEVEL ROUTING FOR 3D IC | VLSI PHYSICAL DESIGN | Pandiaraj K | Taschenbuch | Englisch | 2022 | LAP LAMBERT Academic Publishing | EAN 9786204741314 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de | Anbieter: preigu. Codice articolo 121292738
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OPTIMIZATION OF THERMAL AWARE MULTILEVEL ROUTING FOR 3D IC
Editore:
LAP LAMBERT Academic Publishing Jan 2022, 2022
ISBN 10: 6204741314
ISBN 13: 9786204741314
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Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germania
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Taschenbuch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Very Large Scale Integration (VLSI) is a process of creating an integrated circuit by linking a large number of transistors into a single chip. A 3D IC provides a positive effect on both execution and wirelength in a power system. A three dimensional integrated circuit would become a developing process where connection delays and power get reduced. The several layers of 3D IC which have been linked could be performed by utilizing through silicon via method. It offers better performance than the conventional approach due to decreased length and power consumption. A test access mechanism technique has become significant owing to the impact of sinking routing cost. If a large number of TSV has been employed, then it leads to superior area consumption and increases ultimate chip cost. Uneven distribution of TSV is occurred owing to the bonding stratum procedure. It affects not only the area but also wirelength and temperature. At the routing phase, through silicon via could be done by identifying whitespace from integrated circuit system.VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 188 pp. Englisch. Codice articolo 9786204741314
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OPTIMIZATION OF THERMAL AWARE MULTILEVEL ROUTING FOR 3D IC : VLSI PHYSICAL DESIGN
Editore:
LAP LAMBERT Academic Publishing, 2022
ISBN 10: 6204741314
ISBN 13: 9786204741314
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Da: AHA-BUCH GmbH, Einbeck, Germania
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Taschenbuch. Condizione: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - Very Large Scale Integration (VLSI) is a process of creating an integrated circuit by linking a large number of transistors into a single chip. A 3D IC provides a positive effect on both execution and wirelength in a power system. A three dimensional integrated circuit would become a developing process where connection delays and power get reduced. The several layers of 3D IC which have been linked could be performed by utilizing through silicon via method. It offers better performance than the conventional approach due to decreased length and power consumption. A test access mechanism technique has become significant owing to the impact of sinking routing cost. If a large number of TSV has been employed, then it leads to superior area consumption and increases ultimate chip cost. Uneven distribution of TSV is occurred owing to the bonding stratum procedure. It affects not only the area but also wirelength and temperature. At the routing phase, through silicon via could be done by identifying whitespace from integrated circuit system. Codice articolo 9786204741314
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