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Graphical Introduction - Semiconductor Device Defect and Failure Analysis Technology Lecture Reliability Technology Series Editorial Committee(Chinese Edition)
Da: liu xing, Nanjing, JS, Cina
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paperback. Condizione: New. Language:Chinese.Paperback. Pub Date: 2024-03 Pages: 168 Publisher: China Machinery Press This book is divided into 4 chapters. including an overview of semiconductor device defects and failure analysis technology. failure analysis technology of silicon integrated circuits (li). defects and failure analysis technology of power devices. and defects and failure analysis technology of compound semiconductor light-emitting devices. The author has opened columns in various places in the book to in. Codice articolo DS054453
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