ISBN: 9787111749622 - 图解入门半导体器件缺陷与失效分析技术精讲山本秀和半导体芯片集成电路半导体制造半导体器件机工社【金辉荣丰图书】 (1 risultati)

Graphical Introduction - Semiconductor Device Defect and Failure Analysis Technology Lecture Reliability Technology Series Editorial Committee(Chinese Edition)
KE KAO XING JI SHU CONG SHU JI WEI YUAN HUI ( RI )
Lingua: Inglese
Editore: Mechanical Industry Press, 2024
7111749626 / 9787111749622
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Da: liu xing, Nanjing, JS, Cinaliu xing
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paperback. Condizione: New. Language:Chinese.Paperback. Pub Date: 2024-03 Pages: 168 Publisher: China Machinery Press This book is divided into 4 chapters. including an overview of semiconductor device defects and failure analysis technology. failure analysis technology of silicon integrated circuits (li). defects and failure analysis technology of power devices. and defects and failure analysis technology of compound semiconductor light-emitting devices. The author has opened columns in various places in the book to in.…