ISBN 10: 7305274097 ISBN 13: 9787305274091
Da: liu xing, Nanjing, JS, Cina
EUR 92,58
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Aggiungi al carrellopaperback. Condizione: New. Language:Chinese.Paperback. Pub Date: 2023-12 Pages: 204 Publisher: Nanjing University Press Focused Ion Beam (FIB) is one of the core technical equipment for micro-nano processing. chip failure analysis. and microstructure scientific research. With the microscale of materials and devices (nano or even atomic scale). high integration (more than 1 billion functional units integrated per square centimeter). and multifunctionality (working under a variety of external field conditions). more and .