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Electronics and Communication Engineering Series: semiconductor physics test(Chinese Edition)
Editore:
Harbin Institute of Technology Press, 2000
ISBN 10: 7560336485
ISBN 13: 9787560336480
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Da: liu xing, Nanjing, JS, Cina
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paperback. Condizione: New. Paperback. Pub Date: 2012 08 Pages: 152 Language: Chinese in Publisher: Harbin Institute of Technology Electronics and Communication Engineering Series: semiconductor physics test analysis more comprehensive introduction to the basics of semiconductor physics test analysis. Mainly includes: the basic nature of the semiconductor; semiconductor impurity and defect levels. and silicon dislocations and stacking fault observed; statistical distribution of the carriers in the equilibrium state semi. Codice articolo CD016326
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