Optical and Electronic Process of Nano-Matters: 8 - Brossura

Brossura

ISBN 10: 9048157072 ISBN 13: 9789048157075

Casa editrice: Springer, 2010

Riassunto

Sizes of electronic and photonic devices are decreasing drastically in order to increase the degree of integration for large-capacity and ultrahigh­ speed signal transmission and information processing. This miniaturization must be rapidly progressed from now onward. For this progress, the sizes of materials for composing these devices will be also decreased to several nanometers. If such a nanometer-sized material is combined with the photons and/or some other fields, it can exhibit specific characters, which are considerably different from those ofbulky macroscopic systems. This combined system has been called as a mesoscopic system. The first purpose of this book is to study the physics of the mesoscopic system. For this study, it is essential to diagnose the characteristics of miniaturized devices and materials with the spatial resolution as high as several nanometers or even higher. Therefore, novel methods, e.g., scanning probe microscopy, should be developed for such the high-resolution diagnostics. The second purpose of this book is to explore the possibility of developing new methods for these diagnostics by utilizing local interaction between materials and electron, photon, atomic force, and so on. Conformation and structure of the materials of the mesoscopic system can be modified by enhancing the local interaction between the materials and electromagnetic field. This modification can suggest the possibility of novel nano-fabrication methods. The third purpose of this book is to explore the methods for such nano-fabrication.

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Contenuti

Preface. 1. Electronic and Electromagnetic Properties in Nanometer Scales. 2. Electron Transport in Semiconductor Quantum Dots. 3. Electron Energy Modulation with Optical Evanescent Waves. 4. Interactions of Electrons and Electromagnetic Fields in a Single Molecule. 5. Theory of Electronic and Atomic Processes in Scanning Probe Microscopy. 6. Tunneling-Electron Luminescence Microscopy for Multifunctional and Real-Space Characterization of Semiconductor Nanostructures. 7. Near-Field Optical Spectroscopy of Single Quantum Dots. 8. Chemical Vapor Deposition of Nanometric Materials by Optical Near-Fields: Toward Nano-Photonic Integration. 9. Noncontact Atomic Force Microscopy. 10. Correlation between Interface States and Structures Deduced from Atomic-Scale Surface Roughness in Ultrathin SiO2/Si System. 11. Characterization of Molecular Films by a Scanning Probe Microscope. Index.

Dettagli dell?edizione

• Editore: Springer
• Data di pubblicazione: 2010
• Lingua: Inglese
• ISBN 10: 9048157072
• ISBN 13: 9789048157075
• Rilegatura: Copertina flessibile
• Numero di pagine: 348
• Redattore: Ohtsu Motoichi
• Contatto del produttore: non disponibile
• Persona responsabile: Springer Nature Customer Service Center GmbH; ProductSafety@springernature.com; ; Europaplatz 3,69115 Heidelberg, Germany; Heidelberg; 69115; Germania