Articoli correlati a Radiation Effects And Soft Errors In Integrated Circuits...

Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices: 34 - Rilegato

Fleetwood, Daniel M.

 
9789812389404: Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices: 34
Rilegato
ISBN 10: 9812389407 ISBN 13: 9789812389404
Casa editrice: World Scientific Pub Co Inc, 2004

Sinossi

This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal–oxide–semiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.

Le informazioni nella sezione "Riassunto" possono far riferimento a edizioni diverse di questo titolo.

Product Description

HARD TO FIND

Le informazioni nella sezione "Su questo libro" possono far riferimento a edizioni diverse di questo titolo.

Editore
World Scientific Pub Co Inc
Data di pubblicazione
2004
Lingua
Inglese
ISBN 10 
9812389407
ISBN 13 
9789812389404
Rilegatura
Copertina rigida
Numero di pagine
338
Redattore
Schrimpf R. D.
Contatto del produttore
non disponibile
Persona responsabile
gpsr@libri.de
gpsr@libri.de

Europaallee 1
Bad Hersfeld
36244
Germania