Advances in Imaging and Electron Physics: Selected Problems of Computational Charged Particle Optics

Dmitry Greenfield

ISBN 10: 0323284329 / ISBN 13: 9780323284325

Editore: Academic Press, 2013

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364 pages. 9.00x6.00x0.82 inches. In Stock.

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Dati bibliografici

• Titolo: Advances in Imaging and Electron Physics: Selected Problems of Computational Charged Particle Optics
• Editore: Academic Press
• Data di pubblicazione: 2013
• Lingua: Inglese
• ISBN 10: 0323284329
• ISBN 13: 9780323284325
• Rilegatura: Paperback
• Condizione: Brand New

Descrizione articolo

Riassunto

Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. This monograph summarizes the authors' knowledge and experience acquired over many years in their work on computational charged particle optics. Its main message is that even in this era of powerful computers with a multitude of general-purpose and problem-oriented programs, asymptotic analysis based on perturbation theory remains one of the most effective tools to penetrate deeply into the essence of the problem in question.

L'autore

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the university of Cambridge, whre he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Optical Society of America. He is a member of the editorial boards of several microscopy journals.