Built-in-Self-Test and Digital Self-Calibration for RF SoCs (SpringerBriefs in Electrical and Computer Engineering)

Bou-Sleiman, Sleiman

ISBN 10: 1441995471 / ISBN 13: 9781441995476

Editore: Springer, 2011

Riguardo questo articolo

Codice articolo I-9781441995476

Dati bibliografici

• Titolo: Built-in-Self-Test and Digital Self-Calibration for RF SoCs (SpringerBriefs in Electrical and Computer Engineering)
• Editore: Springer
• Data di pubblicazione: 2011
• Lingua: Inglese
• ISBN 10: 1441995471
• ISBN 13: 9781441995476
• Rilegatura: Brossura
• Condizione: New

Descrizione articolo

Riassunto

This book introduces design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs).

Contenuti

Introduction and Motivation.- Radio Systems Overview: Architecture, Performance and Built-in-Test.- Efficient Testing for RF SoCs.- RF Built-in-Self-Test.- RF Built-in-Self-Calibration.- Conclusions.