Electron and Ion Microscopy and Microanalysis: Principles and Applications, Second Edition,: 29 (Optical Science and Engineering)

ISBN 10: 0367402947 / ISBN 13: 9780367402945

Editore: CRC Press, 2019

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pp. 856.

Codice articolo 18379213051

Dati bibliografici

• Titolo: Electron and Ion Microscopy and Microanalysis: Principles and Applications, Second Edition,: 29 (Optical Science and Engineering)
• Editore: CRC Press
• Data di pubblicazione: 2019
• Lingua: Inglese
• ISBN 10: 0367402947
• ISBN 13: 9780367402945
• Rilegatura: Brossura
• Edizione: seconda edizione
• Condizione: New

Descrizione articolo

Riassunto

The publication date of the first edition is not stated, but the new edition is apparently considerably revised and expanded. It was written to serve as a multi-purpose text at the senior or graduate level and as a reference for the practicing scientist or engineer. Readers should have a math backgr

Informazioni sull?autore

Lawrence E. Murr