Growth and Characterization of Semiconductors: Papers Contributing to a Short Course Organized by the Departments of Materials and Physics With the

Stradling, R. A.

ISBN 10: 0852741316 / ISBN 13: 9780852741313

Editore: Institute of Physics Publishing, 1989

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Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher.

Codice articolo 42588455/202

Dati bibliografici

• Titolo: Growth and Characterization of Semiconductors: Papers Contributing to a Short Course Organized by the Departments of Materials and Physics With the
• Editore: Institute of Physics Publishing
• Data di pubblicazione: 1989
• Lingua: Inglese
• ISBN 10: 0852741316
• ISBN 13: 9780852741313
• Rilegatura: Brossura
• Condizione: Sehr gut
• Cataloghi dei venditori:
  • Bücher

Descrizione articolo

Riassunto

This book explains and evaluates methods used to grow and characterise low-dimensional semiconductor structures. It is based on course material developed in association with the London University Interdisciplinary Research Centre for Semiconductor Materials. It is written for graduates in physics, materials science and electrical engineering working in the research and development of semiconductors.

Contenuti

The basics of epitaxy (D W Pashley). Metal organic chemical vapour deposition (MOCVD) for the preparation of semiconductor materials and devices (J O Williams). Growth of thin films and heterostructures of III-V compounds by molecular beam epitaxy (C T Foxon and B A Joyce). Scanning electron microscopy (SEM) microcharacterisation of semiconducting materials and devices (D B Holt). Depth profiling of semiconductor materials by secondary ion mass spectrometry (J B Clegg). Localised vibrational mode spectroscopy of impurities in semiconductor crystals (R C Newman). Point defect studies using electron paramagnetic resonance (R C Newman). Photoluminescence characterisation (E C Lightowlers). Hall, magnetoresistance and infrared conductivity measurements (R A Stradling). Characterisation of semiconductors by capacitance methods (D W Palmer). High resolution electron microscopy of semiconductors (J L Hutchison).