Modeling and Characterization of RF and Microwave Power FETs

Peter Aaen

ISBN 10: 0521870666 / ISBN 13: 9780521870665

Editore: Cambridge University Press, 2007

Riguardo questo articolo

Druck auf Anfrage Neuware - Printed after ordering - This is a book about the compact modeling of RF power FETs. In it, you will find descriptions of characterization and measurement techniques, analysis methods, and the simulator implementation, model verification and validation procedures that are needed to produce a transistor model that can be used with confidence by the circuit designer. Written by semiconductor industry professionals with many years' device modeling experience in LDMOS and III-V technologies, this is the first book to address the modeling requirements specific to high-power RF transistors. A technology-independent approach is described, addressing thermal effects, scaling issues, nonlinear modeling, and in-package matching networks. These are illustrated using the current market-leading high-power RF technology, LDMOS, as well as with III-V power devices. This book is a comprehensive exposition of FET modeling, and is a must-have resource for seasoned professionals and new graduates in the RF and microwave power amplifier design and modeling community. All three authors work in the RF Division at Freescale Semiconductor, Inc., in Tempe Arizona. Peter H. Aaen is Modeling Group Manager, Jaime A. Plá is Design Organization Manager, and John Wood is Senior Technical Contributor responsible for RF CAD and Modeling, and a Fellow of the IEEE.

Codice articolo 9780521870665

Dati bibliografici

• Titolo: Modeling and Characterization of RF and Microwave Power FETs
• Editore: Cambridge University Press
• Data di pubblicazione: 2007
• Lingua: Inglese
• ISBN 10: 0521870666
• ISBN 13: 9780521870665
• Rilegatura: Buch
• Condizione: Neu

Descrizione articolo

Riassunto

This book was the first to be devoted to the compact modeling of RF power FETs.

Recensione

Review of the hardback: '... a well-written and useful text ... a coherent review of the advanced state of power FET modelling and characterisation.' IEEE Microwave Magazine