Modeling of Electrical Overstress in Integrated Circuits

Lingua: inglese

Editore: Springer, Springer Nov 1994, 1994

0792395050 / 9780792395058

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This item is printed on demand - Print on Demand Titel. Neuware -Electrical overstress (EOS) and Electrostatic discharge (ESD) pose one of the most dominant threats to integrated circuits (ICs). These reliability concerns are becoming more serious with the downward scaling of device feature sizes. Modeling of Electrical Overstress in Integrated Circuits presents a comprehensive analysis of EOS/ESD-related failures in I/O protection devices in integrated circuits.The design of I/O protection circuits has been done in a hit-or-miss way due to the lack of systematic analysis tools and concrete design guidelines. In general, the development of on-chip protection structures is a lengthy expensive iterative process that involves tester design, fabrication, testing and redesign. When the technology is changed, the same process has to be repeated almost entirely. This can be attributed to the lack of efficient CAD tools capable of simulating the device behavior up to the onset of failure which is a 3-D electrothermal problem. For these reasons, it is important to develop and use an adequate measure of the EOS robustness of integrated circuits in order to address the on-chip EOS protection issue. Fundamental understanding of the physical phenomena leading to device failures under ESD/EOS events is needed for the development of device models and CAD tools that can efficiently describe the device behavior up to the onset of thermal failure.Modeling of Electrical Overstress in Integrated Circuits is for VLSI designers and reliability engineers, particularly those who are working on the development of EOS/ESD analysis tools. CAD engineers working on development of circuit level and device level electrothermal simulators will also benefit from the material covered. This book will also be of interest to researchers and first and second year graduate students working in semiconductor devices and IC reliability fields.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 178 pp. Englisch.…

Codice articolo 9780792395058

Titolo
Modeling of Electrical Overstress in Integrated Circuits
Autore
Carlos H. Diaz
Editore
Springer, Springer Nov 1994
Anno di pubblicazione
1994
Condizione
Neu
Rilegatura
Buch
Lingua
inglese
ISBN 10
0792395050
ISBN 13
9780792395058
Peso dell'articolo
439 grammi
Dimensioni
241x160x15 mm

buchversandmimpf2000

Emtmannsberg, BAYE, Germania

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