Nanoscale Characterisation of Ferroelectric Materials: Scanning Probe Microscopy Approach

Marin Alexe et Alexei Gruverman

ISBN 10: 3540206620 / ISBN 13: 9783540206620

Editore: Springer-Verlag Berlin and Heidelberg GmbH & Co. K, 2004

Ancien livre de bibliothèque. Salissures sur la tranche. Edition 2004. Ammareal reverse jusqu'à 15% du prix net de cet article à des organisations caritatives. ENGLISH DESCRIPTION Book Condition: Used, Good. Former library book. Stains on the edge. Edition 2004. Ammareal gives back up to 15% of this item's net price to charity organizations. Codice articolo C-310-427

Riassunto:

This book presents recent advances in the field of nanoscale characterization of ferroelectric materials using scanning probe microscopy (SPM). It addresses various imaging mechanisms of ferroelectric domains in SPM, quantitative analysis of the piezoresponse signals as well as basic physics of ferroelectrics at the nanoscale level, such as nanoscale switching, scaling effects, and transport behavior. This state-of-the-art review of theory and experiments on nanoscale polarization phenomena will be a useful reference for advanced readers as well for newcomers and graduate students interested in the SPM techniques. The non-specialists will obtain valuable information about different approaches to electrical characterization by SPM, while researchers in the ferroelectric field will be provided with details of SPM-based measurements of ferroelectrics.

Dalla quarta di copertina:

This book presents recent advances in the field of nanoscale characterization of ferroelectric materials using scanning probe microscopy (SPM). It addresses various imaging mechanisms of ferroelectric domains in SPM, quantitative analysis of the piezoresponse signals as well as basic physics of ferroelectrics at the nanoscale level, such as nanoscale switching, scaling effects, and transport behavior. This state-of-the-art review of theory and experiments on nanoscale polarization phenomena will be a useful reference for advanced readers as well for newcomers and graduate students interested in the SPM techniques. The non-specialists will obtain valuable information about different approaches to electrical characterization by SPM, while researchers in the ferroelectric field will be provided with details of SPM-based measurements of ferroelectrics.

Dati bibliografici

Titolo: Nanoscale Characterisation of Ferroelectric ...
Casa editrice: Springer-Verlag Berlin and Heidelberg GmbH & Co. K
Data di pubblicazione: 2004
Legatura: Hardcover
Condizione: Bon