On-Line Testing for VLSI (Hardcover)

Michael Nicolaidis

ISBN 10: 0792381327 / ISBN 13: 9780792381327

Editore: Kluwer Academic Publishers, Dordrecht, 1998

Riguardo questo articolo

Hardcover. Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. This text contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE international on-line testing workshops. Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.

Codice articolo 9780792381327

Dati bibliografici

• Titolo: On-Line Testing for VLSI (Hardcover)
• Editore: Kluwer Academic Publishers, Dordrecht
• Data di pubblicazione: 1998
• Lingua: Inglese
• ISBN 10: 0792381327
• ISBN 13: 9780792381327
• Rilegatura: Hardcover
• Condizione: new

Descrizione articolo

Riassunto

Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. This text contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE international on-line testing workshops.

Contenuti

Foreword; V. Agrawal. 1: Introduction. 1.1. On-Testing for VLSI-A Compendium of Approaches; M. Nicolaidis, Y. Zorian. 2: Self-Checking Design. 2.1. On-Line Fault Monitoring; J.J. Stiffler. 2.2. Efficient Totally Self-Checking Shifter Design; R.O. Duarte, et al. 2.3. A New Design Method for Self-Checking Unidirectional Combinational Circuits; V.S. Saposhnikov, et al. 2.4. Concurrent Delay Detection in Duplication Systems; A. Paschalis, et al. 3: Self-Checking Checkers. 3.1. Design of Self-Testing Checkers for m-out-of-n Codes Using Parallel Counters; S.J. Piestrak. 3.2. Self-Testing Embedded Two-Rail Checkers; D. Nikolos. 4: On-Line Monitoring of Reliability Indicators. 4.1. Thermal Monitoring of Self-Checking Systems; V. Székeley, et al. 4.2. Integrated Temperature Sensors for On-Line Thermal Monitoring of Microelectronics Structures; K. Arabi, B. Kaminska. 4.3. Clocked Dosimeter Compatible Digital CMOS; E.G. Moreno, et al. 5: Built-In Self-Test. 5.1. Design of Scalable Hardware Test Generators for On-Line BIST; H. Al-Asaad, et al. 5.2. Mixed Mode BIST Using Embedded Processors; S. Hellebrand, et al. 5.3. A BIST Scheme for Non-Volatile Memories; P. Olivo, M. Dalpasso. 6: Fault Tolerant Systems. 6.1. On-Line Fault Resilience through Gracefully Degradable ASICs; A. Orailoglu. 6.2. Delivering Dependable Telecommunication Services Using Off-the-Shelf System Components; Y. Levendel.