Michael nicolaidis (47 risultati)
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Da: Lacey Books Ltd, Cirencester, Regno UnitoLacey Books Ltd
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Hardcover. Condizione: Very Good. Condizione sovraccoperta: Very Good. 2023 OUP hardcover edition. Light reading wear else very good condition. Contents List of Contributors List of Abbreviations 1. European Constitutional Imaginaries: Utopias, Ideologies, and the Other : Jan Komarek PART I: CONSTITUTIONAL IMAGINARIES OF THE PAS…T, PRESENT, AND FUTURE OF EUROPE 2. European Constitutional Imaginaries: On Pluralism, Calculemus, Imperium, and Communitas : Jiri Priban 3. European Constitutional Imagination: A Whig Interpretation of the Process of European Integration? : Marco Dani and Agustin Jose Menendez 4. The European Union as 'Militant Democracy'? : Signe Rehling Larsen 5. Ideologies and Imaginaries of Legitimacy from the 1950s to Today: Trajectories of EU-Official Discourses Read against Rosanvallon's Democratic Legitimacy : Claudia Schrag Sternberg PART II: AT THE ORIGINS OF CONSTITUTIONAL IMAGINARY—THE WORK OF SELECTED EUROPEAN CONSTITUTIONALISTS REVISITED 6. Why Read The Transformation of Europe Today? On the Limits of a Liberal Constitutional Imaginary : Jan Komarek 7. Messianism, Exodus, and the Empty Signifier of European Integration : Alexander Somek and Jakob Rendl 8. From Constitutional Pyramid to Constitutional Pluralism: The Transformation of the European Constitutional Imaginary : Hugo Canihac 9. The Imaginary and the Unconscious: Situating Constitutional Pluralism : Amnon Lev PART III: RETHINKING CONSTITUTIONAL IMAGINARIES FOR THE PRESENT 10. The Constitutional Imaginary and the Metabolic Realities of European Integration : Peter L Lindseth 11. The European Public Good and European Public Goods : Neil Walker 12. The Peoples Imagined: Constituting a Demoicratic European Polity : Kalypso Nicolaidis 13. Constitutional Patriotism as Europe's Public Philosophy? On the Responsiveness of Post-National Law : Paul Linden-Retek PART IV: WITHOUT POLITICAL ECONOMY, THERE CAN BE NO CONSTITUTIONAL IMAGINARY 14. On the New German Ideology : Michael A Wilkinson 15. Beyond Neoliberal Federalism? The Ideological Shade of the Eurozone's Constitutional Order after the Eurozone Crisis : Hjalte Lokdam 16. The Failure to Grapple with Racial Capitalism in European Constitutionalism : Jeffrey Miller and Fernanda G Nicola 17. Constitutionalism and Powerlessness : Damjan Kukovec 18. Imaginaries of Prosperity as Constitutional Imaginaries : Marija Bartl 19. Conclusion: Making 'the Other' Explicit : Jan Komarek Index.

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Condizione: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has soft covers. In good all round condition. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,500grams, ISBN:9781441950338.

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Da: Ria Christie Collections, Uxbridge, Regno UnitoRia Christie Collections
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Condizione: New. In.

Lingua: Inglese
Editore: Springer, 1998
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Condizione: New.

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Da: Books Puddle, New York, NY, U.S.A.Books Puddle
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Condizione: New. pp. 164.

Lingua: Inglese
Editore: Springer, 1998
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Condizione: New. pp. 168.

Lingua: Inglese
Editore: Kluwer Academic Publishers, 1998
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Da: Kennys Bookshop and Art Galleries Ltd., Galway, GY, IrlandaKennys Bookshop and Art Galleries Ltd.
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Condizione: New. Test functions (fault detection, diagnosis, error correction, repair, and more) that are applied concurrently while the system continues its intended function are defined as on-line testing. This book contains a selected set of articles that discuss many of the modern aspects of on-line testing. Editor(s): Nicol…aidis, Michael; Zorian, Yervant; Pradhan, Dhiraj K. Series: Frontiers in Electronic Testing. Num Pages: 164 pages, biography. BIC Classification: TJFD; UY. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 264 x 187 x 16. Weight in Grams: 520. . 1998. Reprinted from THE JOURNAL OF ELECTRONIC TESTING, Hardback. . . . .

On Line-Testing for VLSI
Nicolaidis, Michael (Edited by)/ Zorian, Yervant (Edited by)/ Pradhan, Dhiraj K. (Edited by)
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Da: Revaluation Books, Exeter, Regno UnitoRevaluation Books
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Paperback. Condizione: Brand New. 164 pages. 11.00x8.25x0.37 inches. In Stock.
Altre immagini- Brossura
Da: preigu, Osnabrück, Germaniapreigu
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Taschenbuch. Condizione: Neu. On-Line Testing for VLSI | Michael Nicolaidis (u. a.) | Taschenbuch | Frontiers in Electronic Testing | iv | Englisch | 2010 | Springer | EAN 9781441950338 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbie…ter: preigu.

Lingua: Inglese
Editore: Kluwer Academic Publishers, 1998
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Da: Kennys Bookstore, Olney, MD, U.S.A.Kennys Bookstore
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EUR 167,44
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Condizione: New. Test functions (fault detection, diagnosis, error correction, repair, and more) that are applied concurrently while the system continues its intended function are defined as on-line testing. This book contains a selected set of articles that discuss many of the modern aspects of on-line testing. Editor(s): Nicol…aidis, Michael; Zorian, Yervant; Pradhan, Dhiraj K. Series: Frontiers in Electronic Testing. Num Pages: 164 pages, biography. BIC Classification: TJFD; UY. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 264 x 187 x 16. Weight in Grams: 520. . 1998. Reprinted from THE JOURNAL OF ELECTRONIC TESTING, Hardback. . . . . Books ship from the US and Ireland.

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Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH
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Taschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design o…f concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties. On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers.

Lingua: Inglese
Editore: Springer, 2010
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Da: Ria Christie Collections, Uxbridge, Regno UnitoRia Christie Collections
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Condizione: New. In.

Lingua: Inglese
Editore: Springer, Springer, 1998
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Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH
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Buch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concu…rrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties. On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers.

Lingua: Inglese
Editore: Springer, 2010
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Da: California Books, Miami, FL, U.S.A.California Books
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Da: GreatBookPricesUK, Woodford Green, Regno UnitoGreatBookPricesUK
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Paperback. Condizione: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

Lingua: Inglese
Editore: Springer, 1998
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Da: Mispah books, Redhill, SURRE, Regno UnitoMispah books
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Condizione: As New. Unread book in perfect condition.

Lingua: Inglese
Editore: Springer, 2012
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Da: preigu, Osnabrück, Germaniapreigu
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Taschenbuch. Condizione: Neu. Soft Errors in Modern Electronic Systems | Michael Nicolaidis | Taschenbuch | Frontiers in Electronic Testing | xviii | Englisch | 2012 | Springer | EAN 9781461426899 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]…com | Anbieter: preigu.

Lingua: Inglese
Editore: Springer, 2012
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Condizione: New. pp. 336.

Lingua: Inglese
Editore: Springer, 2012
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Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH
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Taschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics, including the fundamental physic…al mechanisms of radiation induced soft errors, the various steps that lead to a system failure, the modelling and simulation of soft error at various levels (including physical, electrical, netlist, event driven, RTL, and system level modelling and simulation), hardware fault injection, accelerated radiation testing and natural environment testing, soft error oriented test structures, process-level, device-level, cell-level, circuit-level, architectural-level, software level and system level soft error mitigation techniques. The book contains a comprehensive presentation of most recent advances on understanding, qualifying and mitigating the soft error effect in advanced electronic systems, presented by academia and industry expertsin reliability, fault tolerance, EDA, processor, SoC and system design, and in particular, experts from industries that have faced the soft error impact in terms of product reliability and related business issues and were in the forefront of the countermeasures taken by these companies at multiple levels in order to mitigate the soft error effects at a cost acceptable for commercial products. In a fast moving field, where the impact on ground level electronics is very recent and its severity is steadily increasing at each new process node, impacting one after another various industry sectors (as an example, the Automotive Electronics Council comes to publish qualification requirements on soft errors), research and technology developments and industrial practices have evolve very fast, outdating the most recent books edited at 2004.

Lingua: Inglese
Editore: Springer Us, 2010
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Buch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics, including the fundamental physical mech…anisms of radiation induced soft errors, the various steps that lead to a system failure, the modelling and simulation of soft error at various levels (including physical, electrical, netlist, event driven, RTL, and system level modelling and simulation), hardware fault injection, accelerated radiation testing and natural environment testing, soft error oriented test structures, process-level, device-level, cell-level, circuit-level, architectural-level, software level and system level soft error mitigation techniques. The book contains a comprehensive presentation of most recent advances on understanding, qualifying and mitigating the soft error effect in advanced electronic systems, presented by academia and industry expertsin reliability, fault tolerance, EDA, processor, SoC and system design, and in particular, experts from industries that have faced the soft error impact in terms of product reliability and related business issues and were in the forefront of the countermeasures taken by these companies at multiple levels in order to mitigate the soft error effects at a cost acceptable for commercial products. In a fast moving field, where the impact on ground level electronics is very recent and its severity is steadily increasing at each new process node, impacting one after another various industry sectors (as an example, the Automotive Electronics Council comes to publish qualification requirements on soft errors), research and technology developments and industrial practices have evolve very fast, outdating the most recent books edited at 2004.

Lingua: Inglese
Editore: Springer Verlag, 2010
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Hardcover. Condizione: Brand New. 316 pages. 9.25x6.25x1.00 inches. In Stock.

Lingua: Inglese
Editore: Springer, 2012
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Paperback. Condizione: Brand New. 336 pages. 9.25x6.10x0.76 inches. In Stock.

Lingua: Inglese
Editore: Springer, 2012
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Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing inclu…des the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties. On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers. 164 pp. Englisch.

Lingua: Inglese
Editore: Springer, 2012
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Da: Brook Bookstore On Demand, Napoli, NA, ItaliaBrook Bookstore On Demand
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Condizione: new. Questo è un articolo print on demand.