Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices

Ronald D Schrimpf

ISBN 10: 9812389407 / ISBN 13: 9789812389404

Editore: World Scientific Publishing Co Pte Ltd, SG, 2004

This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level. Codice articolo LU-9789812389404

Riassunto:

This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.

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Titolo: Radiation Effects And Soft Errors In ...
Casa editrice: World Scientific Publishing Co Pte Ltd, SG
Data di pubblicazione: 2004
Legatura: Hardback
Condizione: New