STRUCTURE AND ELECTRONIC PROPERTIES OF ULTRATHIN DIELECTRIC FILMS ON SILICON AND RELATED STRUCTURES

D. A. BUCHANAN, IBM T J WATSON RESEARCH CENTER, NEW YORKARTHUR H. EDWARDS, AIR FORCE RESEARCH LABORATORY, U.S.A.H. J. VON BARDELEBEN, UNIVERSITÃ DE PARIS VI (PIERRE ET MARIE CURIE)T. HATTORI, MUSASHI INSTITUTE OF TECHNOLOGY, JAPAN

ISBN 10: 1558995005 / ISBN 13: 9781558995000

Editore: Cambridge University Press, 2000

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Codice articolo ABEJUNE24-189432

Dati bibliografici

• Titolo: STRUCTURE AND ELECTRONIC PROPERTIES OF ULTRATHIN DIELECTRIC FILMS ON SILICON AND RELATED STRUCTURES
• Editore: Cambridge University Press
• Data di pubblicazione: 2000
• Lingua: Inglese
• ISBN 10: 1558995005
• ISBN 13: 9781558995000
• Rilegatura: Rilegato
• Condizione: Brand New

Descrizione articolo

Riassunto

The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners. This volume was first published in 2000.

Descrizione del libro

The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners. The book, first published in 2000, includes detailed theoretical studies of the nature of SiO2 and its interface with silicon, electron paramagnetic resonance for the study of defects, electron tunneling, and band alignment among others.