Surface and Interface Characterization by Electron Optical Methods

Lingua: inglese

Editore: Springer, Springer Nov 2012, 2012

1461595398 / 9781461595397

Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germaniabuchversandmimpf2000

Venditore con 5 stelle

Venditore AbeBooks dal 23 gennaio 2017

Brossura

Condizione: Nuovo

EUR 53,49

EUR 60,00 spedizione 
Spedito da Germania a U.S.A.

Quantità: 1 disponibile

Aggiungi al carrello
Resi gratuiti per 30 giorni

Descrizione dell’articolo da parte del venditore

This item is printed on demand - Print on Demand Titel. Neuware -The importance of real space imaging and spatially-resolved spectroscopy in many of the most significant problems of surface and interface behaviour is almost self evident. To join the expertise of the tradi tional surface scientist with that of the electron microscopist has however been a slow and difficult process. In the past few years remarkable progress has been achieved, including the development of new techniques of scanning transmission and reflection imaging as well as low energy microscopy, all carried out in greatly improved vacuum conditions. Most astonishing of all has been the advent of the scanning tunneling electron microscope providing atomic resolution in a manner readily compatible with most surface science diagnostic procedures. The problem of beam damage, though often serious, is increasingly well understood so that we can assess the reliability and usefulness of the results which can now be obtained in catalysis studies and a wide range of surface science applications. These new developments and many others in more established surface techniques are all described in this book, based on lectures given at a NATO Advanced Study Institute held in Erice, Sicily, at Easter 1987. It is regretted that a few lectures on low energy electron diffraction and channeling effects could not be included. Fifteen lecturers from seven different Countries and 67 students from 23 Countries and a wide variety of backgrounds attended the school.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 332 pp. Englisch.…

Codice articolo 9781461595397

Titolo
Surface and Interface Characterization by Electron Optical Methods
Autore
Ugo Valdre
Editore
Springer, Springer Nov 2012
Anno di pubblicazione
2012
Condizione
Neu
Rilegatura
Taschenbuch
Lingua
inglese
ISBN 10
1461595398
ISBN 13
9781461595397
Peso dell'articolo
575 grammi
Dimensioni
244x170x19 mm

buchversandmimpf2000

Emtmannsberg, BAYE, Germania

Venditore con 5 stelle

Venditore AbeBooks dal 23 gennaio 2017

Tariffe di spedizione da Germania a U.S.A.

ArticoloDa 60 a 60 giorni lavorativiDa 60 a 60 giorni lavorativi
Primo articoloEUR 60,00EUR 75,00
I tempi di consegna sono stabiliti dai venditori e variano in base al corriere e al paese. Gli ordini che devono attraversare una dogana possono subire ritardi e spetta agli acquirenti pagare eventuali tariffe o dazi associati. I venditori possono contattarti in merito ad addebiti aggiuntivi dovuti a eventuali maggiorazioni dei costi di spedizione dei tuoi articoli.

Metodi di pagamento

  • Visa
  • Mastercard
  • American Express
  • Carte Bleue
  • Apple Pay
  • Google Pay
  • Assegno
  • PayPal

Descrizione dello Store

Impressum Thorsten Retsch Buchversand Mimpf2000 Oberölschnitz 16 95517 Emtmannsberg Deutschland Telefon: 09209-2023188 Email: mimpf2000@online.de USt-ID-Nr.: DE 235096871 Wir führen gebrauchte Bücher aus allen Sparten der Literatur

Specializzazione

Modernes Antiquariat - Bücher von 1960 bis heute

Informazioni sull’azienda del venditore

buchversandmimpf2000

Germania