Sinossi
The importance of real space imaging and spatially-resolved spectroscopy in many of the most significant problems of surface and interface behaviour is almost self evident. To join the expertise of the tradi tional surface scientist with that of the electron microscopist has however been a slow and difficult process. In the past few years remarkable progress has been achieved, including the development of new techniques of scanning transmission and reflection imaging as well as low energy microscopy, all carried out in greatly improved vacuum conditions. Most astonishing of all has been the advent of the scanning tunneling electron microscope providing atomic resolution in a manner readily compatible with most surface science diagnostic procedures. The problem of beam damage, though often serious, is increasingly well understood so that we can assess the reliability and usefulness of the results which can now be obtained in catalysis studies and a wide range of surface science applications. These new developments and many others in more established surface techniques are all described in this book, based on lectures given at a NATO Advanced Study Institute held in Erice, Sicily, at Easter 1987. It is regretted that a few lectures on low energy electron diffraction and channeling effects could not be included. Fifteen lecturers from seven different Countries and 67 students from 23 Countries and a wide variety of backgrounds attended the school.
Le informazioni nella sezione "Riassunto" possono far riferimento a edizioni diverse di questo titolo.
Contenuti
Principles and techniques of transmission imaging of surfaces.- Catalyst studies by scanning transmission electron microscopy.- Localised surface imaging and spectroscopy in the scanning transmission electron microscope.- Fundamentals of high resolution transmission electron microscopy.- Profile imaging of small particles, extended surfaces and dynamic surface phenomena.- Transmission electron microscopy and diffraction from semiconductor interfaces and surfaces.- The transmission electron microscopy of interfaces and multilayers.- Surface microanalysis and microscopy by X-ray photoelectron spectroscopy (XPS), core-loss spectroscopy (CLS) and Auger electron spectroscopy (AES).- Reflection electron microscopy.- An introduction to reflection high energy electron diffraction.- Intensity oscillations in reflection high energy electron diffraction during epitaxial growth.- Emission and low energy reflection electron microscopy.- Scanning tunneling microscopy and spectroscopy.- Spin-polarized secondary electrons from ferromagnets.- Electronically stimulated desorption: mechanisms, applications and implications.- Structure and catalytic activity of surfaces.
Le informazioni nella sezione "Su questo libro" possono far riferimento a edizioni diverse di questo titolo.
Altre edizioni note dello stesso titolo
Risultati della ricerca per Surface and Interface Characterization by Electron...
Foto dell'editore
Surface and Interface Characterization by Electron Optical Methods: (Closed)) (Nato ASI Subseries B:)
Da: Lucky's Textbooks, Dallas, TX, U.S.A.
Valutazione del venditore 5 su 5 stelle
Condizione: New. Codice articolo ABLIING23Mar2716030038567
Compra nuovo
EUR 52,86
Spese di spedizione:
EUR 3,44
In U.S.A.
Quantità: Più di 20 disponibili
Immagini fornite dal venditore
Surface and Interface Characterization by Electron Optical Methods
Editore:
Springer US, Chapman And Hall/CRC Nov 2012, 2012
ISBN 10: 1461595398
ISBN 13: 9781461595397
Nuovo
Taschenbuch
Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germania
Valutazione del venditore 5 su 5 stelle
Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The importance of real space imaging and spatially-resolved spectroscopy in many of the most significant problems of surface and interface behaviour is almost self evident. To join the expertise of the tradi tional surface scientist with that of the electron microscopist has however been a slow and difficult process. In the past few years remarkable progress has been achieved, including the development of new techniques of scanning transmission and reflection imaging as well as low energy microscopy, all carried out in greatly improved vacuum conditions. Most astonishing of all has been the advent of the scanning tunneling electron microscope providing atomic resolution in a manner readily compatible with most surface science diagnostic procedures. The problem of beam damage, though often serious, is increasingly well understood so that we can assess the reliability and usefulness of the results which can now be obtained in catalysis studies and a wide range of surface science applications. These new developments and many others in more established surface techniques are all described in this book, based on lectures given at a NATO Advanced Study Institute held in Erice, Sicily, at Easter 1987. It is regretted that a few lectures on low energy electron diffraction and channeling effects could not be included. Fifteen lecturers from seven different Countries and 67 students from 23 Countries and a wide variety of backgrounds attended the school. 332 pp. Englisch. Codice articolo 9781461595397
Compra nuovo
EUR 53,49
Spese di spedizione:
EUR 23,00
Da: Germania a: U.S.A.
Quantità: 2 disponibili
Foto dell'editore
Surface and Interface Characterization by Electron Optical Methods: (Closed)) (Nato ASI Subseries B:)
Da: Ria Christie Collections, Uxbridge, Regno Unito
Valutazione del venditore 5 su 5 stelle
Condizione: New. In. Codice articolo ria9781461595397_new
Compra nuovo
EUR 81,28
Spese di spedizione:
EUR 13,68
Da: Regno Unito a: U.S.A.
Quantità: Più di 20 disponibili
Immagini fornite dal venditore
Surface and Interface Characterization by Electron Optical Methods
Print on DemandDa: moluna, Greven, Germania
Valutazione del venditore 4 su 5 stelle
Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. The importance of real space imaging and spatially-resolved spectroscopy in many of the most significant problems of surface and interface behaviour is almost self evident. To join the expertise of the tradi tional surface scientist with that of the electro. Codice articolo 4200860
Compra nuovo
EUR 48,37
Spese di spedizione:
EUR 48,99
Da: Germania a: U.S.A.
Quantità: Più di 20 disponibili
Foto dell'editore
Surface and Interface Characterization by Electron Optical Methods
Da: Chiron Media, Wallingford, Regno Unito
Valutazione del venditore 4 su 5 stelle
PF. Condizione: New. Codice articolo 6666-IUK-9781461595397
Compra nuovo
EUR 80,79
Spese di spedizione:
EUR 17,68
Da: Regno Unito a: U.S.A.
Quantità: 10 disponibili
Immagini fornite dal venditore
Surface and Interface Characterization by Electron Optical Methods
Editore:
Springer US, Springer US Nov 2012, 2012
ISBN 10: 1461595398
ISBN 13: 9781461595397
Nuovo
Taschenbuch
Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germania
Valutazione del venditore 5 su 5 stelle
Taschenbuch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -The importance of real space imaging and spatially-resolved spectroscopy in many of the most significant problems of surface and interface behaviour is almost self evident. To join the expertise of the tradi tional surface scientist with that of the electron microscopist has however been a slow and difficult process. In the past few years remarkable progress has been achieved, including the development of new techniques of scanning transmission and reflection imaging as well as low energy microscopy, all carried out in greatly improved vacuum conditions. Most astonishing of all has been the advent of the scanning tunneling electron microscope providing atomic resolution in a manner readily compatible with most surface science diagnostic procedures. The problem of beam damage, though often serious, is increasingly well understood so that we can assess the reliability and usefulness of the results which can now be obtained in catalysis studies and a wide range of surface science applications. These new developments and many others in more established surface techniques are all described in this book, based on lectures given at a NATO Advanced Study Institute held in Erice, Sicily, at Easter 1987. It is regretted that a few lectures on low energy electron diffraction and channeling effects could not be included. Fifteen lecturers from seven different Countries and 67 students from 23 Countries and a wide variety of backgrounds attended the school.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 332 pp. Englisch. Codice articolo 9781461595397
Compra nuovo
EUR 53,49
Spese di spedizione:
EUR 60,00
Da: Germania a: U.S.A.
Quantità: 1 disponibili
Immagini fornite dal venditore
Surface and Interface Characterization by Electron Optical Methods
Da: AHA-BUCH GmbH, Einbeck, Germania
Valutazione del venditore 5 su 5 stelle
Taschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - The importance of real space imaging and spatially-resolved spectroscopy in many of the most significant problems of surface and interface behaviour is almost self evident. To join the expertise of the tradi tional surface scientist with that of the electron microscopist has however been a slow and difficult process. In the past few years remarkable progress has been achieved, including the development of new techniques of scanning transmission and reflection imaging as well as low energy microscopy, all carried out in greatly improved vacuum conditions. Most astonishing of all has been the advent of the scanning tunneling electron microscope providing atomic resolution in a manner readily compatible with most surface science diagnostic procedures. The problem of beam damage, though often serious, is increasingly well understood so that we can assess the reliability and usefulness of the results which can now be obtained in catalysis studies and a wide range of surface science applications. These new developments and many others in more established surface techniques are all described in this book, based on lectures given at a NATO Advanced Study Institute held in Erice, Sicily, at Easter 1987. It is regretted that a few lectures on low energy electron diffraction and channeling effects could not be included. Fifteen lecturers from seven different Countries and 67 students from 23 Countries and a wide variety of backgrounds attended the school. Codice articolo 9781461595397
Compra nuovo
EUR 59,97
Spese di spedizione:
EUR 62,88
Da: Germania a: U.S.A.
Quantità: 1 disponibili