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  • Lingua: Inglese

    Editore: Springer, 2012

    1461595398 / 9781461595397

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    Da: California Books, Miami, FL, U.S.A.California Books

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  • Lingua: Inglese

    Editore: Springer-Verlag New York Inc., 2012

    1461595398 / 9781461595397

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    Da: THE SAINT BOOKSTORE, Southport, Regno UnitoTHE SAINT BOOKSTORE

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    EUR 69,45

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    Paperback / softback. Condizione: New. New copy - Usually dispatched within 7-11 working days.

  • Lingua: Inglese

    Editore: Springer, Springer, 2012

    1461595398 / 9781461595397

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    Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH

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    EUR 61,97

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    Taschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - The importance of real space imaging and spatially-resolved spectroscopy in many of the most significant problems of surface and interface behaviour is almost self evident. To join the expertise of the tradi tional surface scientist with that of the electron microscopist has however been a slow and difficult process. In the past few years remarkable progress has been achieved, including the development of new techniques of scanning transmission and reflection imaging as well as low energy microscopy, all carried out in greatly improved vacuum conditions. Most astonishing of all has been the advent of the scanning tunneling electron microscope providing atomic resolution in a manner readily compatible with most surface science diagnostic procedures. The problem of beam damage, though often serious, is increasingly well understood so that we can assess the reliability and usefulness of the results which can now be obtained in catalysis studies and a wide range of surface science applications. These new developments and many others in more established surface techniques are all described in this book, based on lectures given at a NATO Advanced Study Institute held in Erice, Sicily, at Easter 1987. It is regretted that a few lectures on low energy electron diffraction and channeling effects could not be included. Fifteen lecturers from seven different Countries and 67 students from 23 Countries and a wide variety of backgrounds attended the school.

  • Lingua: Inglese

    Editore: Springer, 2012

    1461595398 / 9781461595397

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    Da: Ria Christie Collections, Uxbridge, Regno UnitoRia Christie Collections

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  • Lingua: Inglese

    Editore: Springer 2012-11, 2012

    1461595398 / 9781461595397

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  • Lingua: Inglese

    Editore: Springer, 2008

    0792359402 / 9780792359401

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  • Lingua: Inglese

    Editore: Springer, 1999

    0792359399 / 9780792359395

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    Da: Ria Christie Collections, Uxbridge, Regno UnitoRia Christie Collections

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  • Lingua: Inglese

    Editore: Springer, 2008

    0792359402 / 9780792359401

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  • Lingua: Inglese

    Editore: Springer, 2008

    0792359402 / 9780792359401

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  • Lingua: Inglese

    Editore: Springer, 2008

    0792359402 / 9780792359401

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  • Lingua: Inglese

    Editore: Springer, 2008

    0792359402 / 9780792359401

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  • Lingua: Inglese

    Editore: Kluwer Academic Publishers, 1999

    0792359402 / 9780792359401

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    Da: Kennys Bookshop and Art Galleries Ltd., Galway, GY, IrlandaKennys Bookshop and Art Galleries Ltd.

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    EUR 136,40

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    Condizione: New. Proceedings of the NATO Advanced Study Institute, held in Erice, Italy, 14-25 April, 1999 Editor(s): Rickerby, David G.; Valdre, Giovanni (Dept. of Earth and Geo-Environmental Sciences, University of Bologna, Italy); Valdre, Ugo. Series: NATO Science Series E. Num Pages: 513 pages, biography. BIC Classification: TGMT1. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly. Dimension: 240 x 160 x 26. Weight in Grams: 716. . 1999. Softcover reprint of the original 1st ed. 1999. Paperback. . . . .

  • Lingua: Inglese

    Editore: Kluwer Academic Publishers, 1999

    0792359399 / 9780792359395

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    Da: Kennys Bookshop and Art Galleries Ltd., Galway, GY, IrlandaKennys Bookshop and Art Galleries Ltd.

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    Condizione: New. Proceedings of the NATO Advanced Study Institute, held in Erice, Italy, 14-25 April, 1999 Editor(s): Rickerby, David G.; Valdre, Giovanni (Dept. of Earth and Geo-Environmental Sciences, University of Bologna, Italy); Valdre, Ugo. Series: NATO Science Series E. Num Pages: 513 pages, biography. BIC Classification: TGMT1. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly. Dimension: 244 x 170 x 28. Weight in Grams: 896. . 1999. Hardback. . . . .

  • Lingua: Inglese

    Editore: Springer, 2008

    0792359402 / 9780792359401

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    Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH

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    EUR 118,16

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    Taschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - The Advanced Study Institute provided an opportunity for researchers in universities, industry and National and International Laboratories, from the disciplines ofmaterials science, physics, chemistry and engineering to meet together in an assessment of the impact of electron and scanning probe microscopy on advanced material research. Since these researchers have traditionally relied upon different approaches, due to their different scientific background, to advanced materials problem solving, presentations and discussion within the Institute sessions were initially devoted to developing a set ofmutually understood basic concepts, inherently related to different techniques ofcharacterization by microscopy and spectroscopy. Particular importance was placed on Electron Energy Loss Spectroscopy (EELS), Scanning Probe Microscopy (SPM), High Resolution Transmission and Scanning Electron Microscopy (HRTEM, HRSTEM) and Environmental Scanning Electron Microscopy (ESEM). It was recognized that the electronic structure derived directly from EELS analysis as well as from atomic positions in HRTEM or High Angle Annular Dark Field STEM can be used to understand the macroscopic behaviour of materials. The emphasis, however, was upon the analysis of the electronic band structure of grain boundaries, fundamental for the understanding of macroscopic quantities such as strength, cohesion, plasticity, etc.

  • Lingua: Inglese

    Editore: Springer, 1999

    0792359399 / 9780792359395

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    Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH

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    Buch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - The Advanced Study Institute provided an opportunity for researchers in universities, industry and National and International Laboratories, from the disciplines ofmaterials science, physics, chemistry and engineering to meet together in an assessment of the impact of electron and scanning probe microscopy on advanced material research. Since these researchers have traditionally relied upon different approaches, due to their different scientific background, to advanced materials problem solving, presentations and discussion within the Institute sessions were initially devoted to developing a set ofmutually understood basic concepts, inherently related to different techniques ofcharacterization by microscopy and spectroscopy. Particular importance was placed on Electron Energy Loss Spectroscopy (EELS), Scanning Probe Microscopy (SPM), High Resolution Transmission and Scanning Electron Microscopy (HRTEM, HRSTEM) and Environmental Scanning Electron Microscopy (ESEM). It was recognized that the electronic structure derived directly from EELS analysis as well as from atomic positions in HRTEM or High Angle Annular Dark Field STEM can be used to understand the macroscopic behaviour of materials. The emphasis, however, was upon the analysis of the electronic band structure of grain boundaries, fundamental for the understanding of macroscopic quantities such as strength, cohesion, plasticity, etc.

  • Lingua: Inglese

    Editore: Springer, 1999

    0792359399 / 9780792359395

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    EUR 166,00

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    Quantità: 4 disponibili

    Condizione: New. pp. 516.

  • Condizione: Nuovo

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    Condizione: New. Proceedings of the NATO Advanced Study Institute, held in Erice, Italy, 14-25 April, 1999 Editor(s): Rickerby, David G.; Valdre, Giovanni (Dept. of Earth and Geo-Environmental Sciences, University of Bologna, Italy); Valdre, Ugo. Series: NATO Science Series E. Num Pages: 513 pages, biography. BIC Classification: TGMT1. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly. Dimension: 240 x 160 x 26. Weight in Grams: 716. . 1999. Softcover reprint of the original 1st ed. 1999. Paperback. . . . . Books ship from the US and Ireland.

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    EUR 172,32

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    Condizione: New. Proceedings of the NATO Advanced Study Institute, held in Erice, Italy, 14-25 April, 1999 Editor(s): Rickerby, David G.; Valdre, Giovanni (Dept. of Earth and Geo-Environmental Sciences, University of Bologna, Italy); Valdre, Ugo. Series: NATO Science Series E. Num Pages: 513 pages, biography. BIC Classification: TGMT1. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly. Dimension: 244 x 170 x 28. Weight in Grams: 896. . 1999. Hardback. . . . . Books ship from the US and Ireland.

  • Lingua: Inglese

    Editore: Springer, 1999

    0792359399 / 9780792359395

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    Da: Mispah books, Redhill, SURRE, Regno UnitoMispah books

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    EUR 165,54

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    Hardcover. Condizione: Like New. Like New. book.

  • Lingua: Inglese

    Editore: Springer, 2012

    1461595398 / 9781461595397

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    Da: Brook Bookstore On Demand, Napoli, NA, ItaliaBrook Bookstore On Demand

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    Condizione: new. Questo è un articolo print on demand.

  • Lingua: Inglese

    Editore: Springer US, Chapman And Hall/CRC Nov 2012, 2012

    1461595398 / 9781461595397

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    Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermaniaBuchWeltWeit Ludwig Meier e.K.

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    EUR 53,49

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    Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The importance of real space imaging and spatially-resolved spectroscopy in many of the most significant problems of surface and interface behaviour is almost self evident. To join the expertise of the tradi tional surface scientist with that of the electron microscopist has however been a slow and difficult process. In the past few years remarkable progress has been achieved, including the development of new techniques of scanning transmission and reflection imaging as well as low energy microscopy, all carried out in greatly improved vacuum conditions. Most astonishing of all has been the advent of the scanning tunneling electron microscope providing atomic resolution in a manner readily compatible with most surface science diagnostic procedures. The problem of beam damage, though often serious, is increasingly well understood so that we can assess the reliability and usefulness of the results which can now be obtained in catalysis studies and a wide range of surface science applications. These new developments and many others in more established surface techniques are all described in this book, based on lectures given at a NATO Advanced Study Institute held in Erice, Sicily, at Easter 1987. It is regretted that a few lectures on low energy electron diffraction and channeling effects could not be included. Fifteen lecturers from seven different Countries and 67 students from 23 Countries and a wide variety of backgrounds attended the school. 332 pp. Englisch.

  • Lingua: Inglese

    Editore: Springer US, 2012

    1461595398 / 9781461595397

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    Da: moluna, Greven, Germaniamoluna

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    EUR 48,37

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    Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. The importance of real space imaging and spatially-resolved spectroscopy in many of the most significant problems of surface and interface behaviour is almost self evident. To join the expertise of the tradi tional surface scientist with that of the electro.

  • Lingua: Inglese

    Editore: Springer, Springer Nov 2012, 2012

    1461595398 / 9781461595397

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    Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germaniabuchversandmimpf2000

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    EUR 53,49

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    Taschenbuch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -The importance of real space imaging and spatially-resolved spectroscopy in many of the most significant problems of surface and interface behaviour is almost self evident. To join the expertise of the tradi tional surface scientist with that of the electron microscopist has however been a slow and difficult process. In the past few years remarkable progress has been achieved, including the development of new techniques of scanning transmission and reflection imaging as well as low energy microscopy, all carried out in greatly improved vacuum conditions. Most astonishing of all has been the advent of the scanning tunneling electron microscope providing atomic resolution in a manner readily compatible with most surface science diagnostic procedures. The problem of beam damage, though often serious, is increasingly well understood so that we can assess the reliability and usefulness of the results which can now be obtained in catalysis studies and a wide range of surface science applications. These new developments and many others in more established surface techniques are all described in this book, based on lectures given at a NATO Advanced Study Institute held in Erice, Sicily, at Easter 1987. It is regretted that a few lectures on low energy electron diffraction and channeling effects could not be included. Fifteen lecturers from seven different Countries and 67 students from 23 Countries and a wide variety of backgrounds attended the school.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 332 pp. Englisch.

  • Lingua: Inglese

    Editore: Springer Netherlands, Springer Netherlands Sep 1999, 1999

    0792359402 / 9780792359401

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    Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermaniaBuchWeltWeit Ludwig Meier e.K.

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    EUR 106,99

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    Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The Advanced Study Institute provided an opportunity for researchers in universities, industry and National and International Laboratories, from the disciplines ofmaterials science, physics, chemistry and engineering to meet together in an assessment of the impact of electron and scanning probe microscopy on advanced material research. Since these researchers have traditionally relied upon different approaches, due to their different scientific background, to advanced materials problem solving, presentations and discussion within the Institute sessions were initially devoted to developing a set ofmutually understood basic concepts, inherently related to different techniques ofcharacterization by microscopy and spectroscopy. Particular importance was placed on Electron Energy Loss Spectroscopy (EELS), Scanning Probe Microscopy (SPM), High Resolution Transmission and Scanning Electron Microscopy (HRTEM, HRSTEM) and Environmental Scanning Electron Microscopy (ESEM). It was recognized that the electronic structure derived directly from EELS analysis as well as from atomic positions in HRTEM or High Angle Annular Dark Field STEM can be used to understand the macroscopic behaviour of materials. The emphasis, however, was upon the analysis of the electronic band structure of grain boundaries, fundamental for the understanding of macroscopic quantities such as strength, cohesion, plasticity, etc. 516 pp. Englisch.

  • Lingua: Inglese

    Editore: Springer Netherlands, 1999

    0792359399 / 9780792359395

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    Da: moluna, Greven, Germaniamoluna

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    EUR 92,27

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    Gebunden. Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Proceedings of the NATO Advanced Study Institute, held in Erice, Italy, 14-25 April, 1999 The Advanced Study Institute provided an opportunity for researchers in universities, industry and National and International Laboratories, from the disciplin.

  • Lingua: Inglese

    Editore: Springer Netherlands, 1999

    0792359402 / 9780792359401

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    Da: moluna, Greven, Germaniamoluna

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    EUR 92,27

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    Kartoniert / Broschiert. Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Proceedings of the NATO Advanced Study Institute, held in Erice, Italy, 14-25 April, 1999 The Advanced Study Institute provided an opportunity for researchers in universities, industry and National and International Laboratories, from the disciplin.

  • Altre immagini

    Lingua: Inglese

    Editore: Springer, 1999

    0792359402 / 9780792359401

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    Da: preigu, Osnabrück, Germaniapreigu

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    Taschenbuch. Condizione: Neu. Impact of Electron and Scanning Probe Microscopy on Materials Research | David G. Rickerby (u. a.) | Taschenbuch | Einband - flex.(Paperback) | Englisch | 1999 | Springer | EAN 9780792359401 | Verantwortliche Person für die EU: Springer Nature Customer Service Center GmbH, Europaplatz 3, 69115 Heidelberg, productsafety[at]springernature[dot]com | Anbieter: preigu Print on Demand.

  • Altre immagini

    Lingua: Inglese

    Editore: Springer Netherland, 1999

    0792359399 / 9780792359395

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    Buch. Condizione: Neu. Impact of Electron and Scanning Probe Microscopy on Materials Research | David G. Rickerby (u. a.) | Buch | Einband - fest (Hardcover) | Englisch | 1999 | Springer Netherland | EAN 9780792359395 | Verantwortliche Person für die EU: Springer Netherlands, Haberstr. 7, 69126 Heidelberg, buchhandel-buch[at]springer[dot]com | Anbieter: preigu Print on Demand.

  • Lingua: Inglese

    Editore: Springer, Springer Sep 1999, 1999

    0792359402 / 9780792359401

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    Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germaniabuchversandmimpf2000

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    EUR 106,99

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    Taschenbuch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -The Advanced Study Institute provided an opportunity for researchers in universities, industry and National and International Laboratories, from the disciplines ofmaterials science, physics, chemistry and engineering to meet together in an assessment of the impact of electron and scanning probe microscopy on advanced material research. Since these researchers have traditionally relied upon different approaches, due to their different scientific background, to advanced materials problem solving, presentations and discussion within the Institute sessions were initially devoted to developing a set ofmutually understood basic concepts, inherently related to different techniques ofcharacterization by microscopy and spectroscopy. Particular importance was placed on Electron Energy Loss Spectroscopy (EELS), Scanning Probe Microscopy (SPM), High Resolution Transmission and Scanning Electron Microscopy (HRTEM, HRSTEM) and Environmental Scanning Electron Microscopy (ESEM). It was recognized that the electronic structure derived directly from EELS analysis as well as from atomic positions in HRTEM or High Angle Annular Dark Field STEM can be used to understand the macroscopic behaviour of materials. The emphasis, however, was upon the analysis of the electronic band structure of grain boundaries, fundamental for the understanding of macroscopic quantities such as strength, cohesion, plasticity, etc.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 516 pp. Englisch.

  • Lingua: Inglese

    Editore: Springer Netherlands, Springer Netherlands Okt 1999, 1999

    0792359399 / 9780792359395

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    Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germaniabuchversandmimpf2000

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    EUR 106,99

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    Buch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -The Advanced Study Institute provided an opportunity for researchers in universities, industry and National and International Laboratories, from the disciplines ofmaterials science, physics, chemistry and engineering to meet together in an assessment of the impact of electron and scanning probe microscopy on advanced material research. Since these researchers have traditionally relied upon different approaches, due to their different scientific background, to advanced materials problem solving, presentations and discussion within the Institute sessions were initially devoted to developing a set ofmutually understood basic concepts, inherently related to different techniques ofcharacterization by microscopy and spectroscopy. Particular importance was placed on Electron Energy Loss Spectroscopy (EELS), Scanning Probe Microscopy (SPM), High Resolution Transmission and Scanning Electron Microscopy (HRTEM, HRSTEM) and Environmental Scanning Electron Microscopy (ESEM). It was recognized that the electronic structure derived directly from EELS analysis as well as from atomic positions in HRTEM or High Angle Annular Dark Field STEM can be used to understand the macroscopic behaviour of materials. The emphasis, however, was upon the analysis of the electronic band structure of grain boundaries, fundamental for the understanding of macroscopic quantities such as strength, cohesion, plasticity, etc. 516 pp. Englisch.