Transmission Electron Microscopy: Physics of Image Formation (Springer Series in Optical Sciences, 36)
L. Reimer
ISBN 10: 0387400931 ISBN 13: 9780387400938
Editore: Springer-Verlag New York, LLC, 2008
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Transmission Electron Microscopy presents the theory of image and contrast formation, and the analytical modes in transmission electron microscopy. The principles of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also discussed are the kinematical and dynamical theories of electron diffraction and their applications for crystal-structure analysis and imaging of lattices and their defects. X-ray micronanalysis and electron energy-loss spectroscopy are treated as analytical methods. Specimen damage and contamination by electron irradiation limits the resolution for biological and some inorganic specimens. This fifth edition includes discussion of recent progress, especially in the area of aberration corrector, and energy filtering; moreover the new topics of the forth edition have been updated again. USP: -Standard reference book -Now updated by the successor of the original author -New topics of the field included -Gives a comprehensive review of recent progresses in TEM
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Transmission Electron Microscopy: Physics of Image Formation presents the theory of image and contrast formation, and the analytical modes in transmission electron microscopy. The principles of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also discussed are the kinematical and dynamical theories of electron diffraction and their applications for crystal-structure analysis and imaging of lattices and their defects. X-ray microanalysis and electron energy-loss spectroscopy are treated as analytical methods. Specimen damage and contamination by electron irradiation limits the resolution for biological and some inorganic specimens. This fifth edition includes discussion of recent progress, especially in the area of aberration correction and energy filtering; moreover, the topics introduced in the fourth edition have been updated.
Transmission Electron Microscopy: Physics of Image Formation is written for scientists and application engineers in fields such as physics, chemistry, mineralogy, materials science and biology. Researchers, students, and other users of a transmission electron microscope can also benefit from this text.
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Titolo: Transmission Electron Microscopy: Physics of...
Casa editrice: Springer-Verlag New York, LLC
Data di pubblicazione: 2008
Legatura: hardcover
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Edizione: quinta edizione o successive
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Transmission Electron Microscopy: Physics of Image Formation (Springer Series in Optical Sciences, 36, Band 36)
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Transmission Electron Microscopy
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Springer-Verlag New York Inc., US, 2008
ISBN 10: 0387400931
ISBN 13: 9780387400938
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Hardback. Condizione: New. Fifth Edition 2008. Transmission Electron Microscopy presents the theory of image and contrast formation, and the analytical modes in transmission electron microscopy. The principles of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also discussed are the kinematical and dynamical theories of electron diffraction and their applications for crystal-structure analysis and imaging of lattices and their defects. X-ray micronanalysis and electron energy-loss spectroscopy are treated as analytical methods. Specimen damage and contamination by electron irradiation limits the resolution for biological and some inorganic specimens. This fifth edition includes discussion of recent progress, especially in the area of aberration corrector, and energy filtering; moreover the new topics of the forth edition have been updated again. USP: -Standard reference book -Now updated by the successor of the original author -New topics of the field included -Gives a comprehensive review of recent progresses in TEM. Codice articolo LU-9780387400938
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Transmission Electron Microscopy
Editore:
Springer-Verlag New York Inc., US, 2008
ISBN 10: 0387400931
ISBN 13: 9780387400938
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Hardback. Condizione: New. Fifth Edition 2008. Transmission Electron Microscopy presents the theory of image and contrast formation, and the analytical modes in transmission electron microscopy. The principles of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also discussed are the kinematical and dynamical theories of electron diffraction and their applications for crystal-structure analysis and imaging of lattices and their defects. X-ray micronanalysis and electron energy-loss spectroscopy are treated as analytical methods. Specimen damage and contamination by electron irradiation limits the resolution for biological and some inorganic specimens. This fifth edition includes discussion of recent progress, especially in the area of aberration corrector, and energy filtering; moreover the new topics of the forth edition have been updated again. USP: -Standard reference book -Now updated by the successor of the original author -New topics of the field included -Gives a comprehensive review of recent progresses in TEM. Codice articolo LU-9780387400938
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Transmission Electron Microscopy : Physics of Image Formation
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Buch. Condizione: Neu. Neuware - The aim of this monograph is to outline the physics of image formation, electron-specimen interactions, and image interpretation in transmission el- tron microscopy. Since the last edition, transmission electron microscopy has undergone a rapid evolution. The introduction of monochromators and - proved energy lters has allowed electron energy-loss spectra with an energy resolution down to about 0.1 eV to be obtained, and aberration correctors are now available that push the point-to-point resolution limit down below 0.1 nm. After the untimely death of Ludwig Reimer, Dr. Koelsch from Springer- Verlag asked me if I would be willing to prepare a new edition of the book. As it had served me as a reference for more than 20 years, I agreed without hesitation. Distinct from more specialized books on speci c topics and from books intended for classroom teaching, the Reimer book starts with the basic principles and gives a broad survey of the state-of-the-art methods, comp- mented by a list of references to allow the reader to nd further details in the literature. The main objective of this revised edition was therefore to include the new developments but leave the character of the book intact. The presentation of the material follows the format of the previous e- tion as outlined in the preface to that volume, which immediately follows. A few derivations have been modi ed to correspond more closely to modern textbooks on quantum mechanics, scattering theory, or solid state physics. Codice articolo 9780387400938
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