Unconventional electron microscopy for molecular structure determination (Advances in structure research by diffraction methods)

W. Hoppe

ISBN 10: 3528081171 / ISBN 13: 9783528081171

Editore: Vieweg 1979-01-01, 1979

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Dati bibliografici

• Titolo: Unconventional electron microscopy for molecular structure determination (Advances in structure research by diffraction methods)
• Editore: Vieweg 1979-01-01
• Data di pubblicazione: 1979
• Lingua: Tedesco
• ISBN 10: 3528081171
• ISBN 13: 9783528081171
• Rilegatura: Paperback
• Condizione: New

Descrizione articolo

Riassunto

Generally it is not sufficiently appreciated that electron microscopy is in fact a diffraction method. In essential aspects electron microscopes are more closely related to X-ray diffracto· meters than to light microscopes. In electron microscopes monochromatized radiation and coherent illumination (never used in light microscopy) correspond in X-ray diffractometers to the primary beam with a small divergence. Imaging ina general sense can take place in interference experiments between a primary beam and a scattered beam, or between diffe­ rent deflected scattered beams. This leads to the realization of an old dream in diffracto­ metry, namely to a general experimental solution of the "phase problem". The most im­ pressive analogy, however, concerns the potential of the electron microscope as a tool for structure determination (where the radiation wavelenght is smaller than the atomic distan­ ces). It was therefore considered timely to treat this topic in this series. It was a fortunate cioncidence that in 1976 a Workshop on "Unconventional Electron Microscope Methods for the Investigation of Molecular Structures" (sponsored by the European Molecular Biology Organisation, the Deutsche Forschungsgemeinschaft and the Max-Planck-Gesell­ schaft) took place, and that most speakers presenting introductory lectures agreed to publish their contributions in an expanded version in this volume. This volume is thus not a symposium report in the usual sense since it contains the majority of these introductory lectures only.

Contenuti

Instrumentation: Progress and Problems.- Progress in Scanning Transmission Electron Microscopy at the University of Chicago.- The Physics of Specimen Preparation.- Radiation Damage: Experimental Work.- Radiation Damage: The Theoretical Background.- The Electron Microscope, a Diffractometer to Measure Scattering Amplitudes and Phases.- Three-Dimensional Reconstruction of Aperiodic Objects in Electron Microscopy.- Three-Dimensional Low Dose Reconstruction of Periodical Aggregates.