Lingua: Inglese
Editore: Braunschweig, Wiesbaden : Vieweg, 1979
ISBN 10: 3528081171 ISBN 13: 9783528081171
Da: NEPO UG, Rüsselsheim am Main, Germania
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Aggiungi al carrelloLw. Condizione: Gut. 225 S. : Ill., graph. Darst. ; 24 cm ex Library Book aus einer wissenschafltichen Bibliothek Sprache: Englisch Gewicht in Gramm: 550.
Da: GreatBookPrices, Columbia, MD, U.S.A.
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Da: Chiron Media, Wallingford, Regno Unito
EUR 57,99
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Aggiungi al carrelloPaperback. Condizione: New.
Da: Ria Christie Collections, Uxbridge, Regno Unito
EUR 61,69
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Aggiungi al carrelloCondizione: New. In.
Da: GreatBookPrices, Columbia, MD, U.S.A.
Condizione: New.
Lingua: Tedesco
Editore: Vieweg Verlag, Friedr, & Sohn Verlagsgesellschaft mbH, 1979
ISBN 10: 3528081171 ISBN 13: 9783528081171
Da: Books Puddle, New York, NY, U.S.A.
Condizione: New. pp. 232.
Editore: Vieweg 1964-1979., Braunschweig, 1964
ISBN 10: 3528081171 ISBN 13: 9783528081171
Da: Emile Kerssemakers ILAB, Heerlen, Paesi Bassi
EUR 80,00
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Aggiungi al carrello7 volumes. 24 cm. original cloth. approx 1600 pp. many ills. references. index. german and english texts. -(libr label, library stamps, with plasticized cover (einbandfolie), some volumes with slightly browned pages, otherwise (very) good). 777g.
Lingua: Tedesco
Editore: Vieweg+Teubner Verlag, Vieweg+Teubner Verlag, 1979
ISBN 10: 3528081171 ISBN 13: 9783528081171
Da: AHA-BUCH GmbH, Einbeck, Germania
EUR 54,99
Quantità: 1 disponibili
Aggiungi al carrelloTaschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - Generally it is not sufficiently appreciated that electron microscopy is in fact a diffraction method. In essential aspects electron microscopes are more closely related to X-ray diffracto meters than to light microscopes. In electron microscopes monochromatized radiation and coherent illumination (never used in light microscopy) correspond in X-ray diffractometers to the primary beam with a small divergence. Imaging ina general sense can take place in interference experiments between a primary beam and a scattered beam, or between diffe rent deflected scattered beams. This leads to the realization of an old dream in diffracto metry, namely to a general experimental solution of the 'phase problem'. The most im pressive analogy, however, concerns the potential of the electron microscope as a tool for structure determination (where the radiation wavelenght is smaller than the atomic distan ces). It was therefore considered timely to treat this topic in this series. It was a fortunate cioncidence that in 1976 a Workshop on 'Unconventional Electron Microscope Methods for the Investigation of Molecular Structures' (sponsored by the European Molecular Biology Organisation, the Deutsche Forschungsgemeinschaft and the Max-Planck-Gesell schaft) took place, and that most speakers presenting introductory lectures agreed to publish their contributions in an expanded version in this volume. This volume is thus not a symposium report in the usual sense since it contains the majority of these introductory lectures only.
Da: preigu, Osnabrück, Germania
EUR 54,99
Quantità: 5 disponibili
Aggiungi al carrelloTaschenbuch. Condizione: Neu. Unconventional Electron Microscopy for Molecular Structure Determination | W. Hoppe (u. a.) | Taschenbuch | vi | Deutsch | 1979 | Vieweg & Teubner | EAN 9783528081171 | Verantwortliche Person für die EU: Springer Vieweg in Springer Science + Business Media, Abraham-Lincoln-Str. 46, 65189 Wiesbaden, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
Da: Mispah books, Redhill, SURRE, Regno Unito
EUR 113,10
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Aggiungi al carrelloPaperback. Condizione: Very Good. Dust Jacket may NOT BE INCLUDED.CDs may be missing. SHIPS FROM MULTIPLE LOCATIONS. book.
Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germania
EUR 54,99
Quantità: 2 disponibili
Aggiungi al carrelloTaschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Generally it is not sufficiently appreciated that electron microscopy is in fact a diffraction method. In essential aspects electron microscopes are more closely related to X-ray diffracto meters than to light microscopes. In electron microscopes monochromatized radiation and coherent illumination (never used in light microscopy) correspond in X-ray diffractometers to the primary beam with a small divergence. Imaging ina general sense can take place in interference experiments between a primary beam and a scattered beam, or between diffe rent deflected scattered beams. This leads to the realization of an old dream in diffracto metry, namely to a general experimental solution of the 'phase problem'. The most im pressive analogy, however, concerns the potential of the electron microscope as a tool for structure determination (where the radiation wavelenght is smaller than the atomic distan ces). It was therefore considered timely to treat this topic in this series. It was a fortunate cioncidence that in 1976 a Workshop on 'Unconventional Electron Microscope Methods for the Investigation of Molecular Structures' (sponsored by the European Molecular Biology Organisation, the Deutsche Forschungsgemeinschaft and the Max-Planck-Gesell schaft) took place, and that most speakers presenting introductory lectures agreed to publish their contributions in an expanded version in this volume. This volume is thus not a symposium report in the usual sense since it contains the majority of these introductory lectures only. 226 pp. Deutsch.
Lingua: Tedesco
Editore: Vieweg Verlag, Friedr, & Sohn Verlagsgesellschaft mbH, 1979
ISBN 10: 3528081171 ISBN 13: 9783528081171
Da: Majestic Books, Hounslow, Regno Unito
EUR 80,23
Quantità: 4 disponibili
Aggiungi al carrelloCondizione: New. Print on Demand pp. 232 49:B&W 6.14 x 9.21 in or 234 x 156 mm (Royal 8vo) Perfect Bound on White w/Gloss Lam.
Lingua: Tedesco
Editore: Vieweg Verlag, Friedr, & Sohn Verlagsgesellschaft mbH, 1979
ISBN 10: 3528081171 ISBN 13: 9783528081171
Da: Biblios, Frankfurt am main, HESSE, Germania
EUR 80,92
Quantità: 4 disponibili
Aggiungi al carrelloCondizione: New. PRINT ON DEMAND pp. 232.
Da: moluna, Greven, Germania
EUR 54,99
Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Instrumentation: Progress and Problems.- Progress in Scanning Transmission Electron Microscopy at the University of Chicago.- The Physics of Specimen Preparation.- Radiation Damage: Experimental Work.- Radiation Damage: The Theoretical Background.- The Elec.
Lingua: Tedesco
Editore: Vieweg+Teubner Verlag, Vieweg+Teubner Verlag Jan 1979, 1979
ISBN 10: 3528081171 ISBN 13: 9783528081171
Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germania
EUR 54,99
Quantità: 1 disponibili
Aggiungi al carrelloTaschenbuch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Generally it is not sufficiently appreciated that electron microscopy is in fact a diffraction method. In essential aspects electron microscopes are more closely related to X-ray diffracto meters than to light microscopes. In electron microscopes monochromatized radiation and coherent illumination (never used in light microscopy) correspond in X-ray diffractometers to the primary beam with a small divergence. Imaging ina general sense can take place in interference experiments between a primary beam and a scattered beam, or between diffe rent deflected scattered beams. This leads to the realization of an old dream in diffracto metry, namely to a general experimental solution of the 'phase problem'. The most im pressive analogy, however, concerns the potential of the electron microscope as a tool for structure determination (where the radiation wavelenght is smaller than the atomic distan ces). It was therefore considered timely to treat this topic in this series. It was a fortunate cioncidence that in 1976 a Workshop on 'Unconventional Electron Microscope Methods for the Investigation of Molecular Structures' (sponsored by the European Molecular Biology Organisation, the Deutsche Forschungsgemeinschaft and the Max-Planck-Gesell schaft) took place, and that most speakers presenting introductory lectures agreed to publish their contributions in an expanded version in this volume. This volume is thus not a symposium report in the usual sense since it contains the majority of these introductory lectures only.Vieweg+Teubner Verlag, Abraham-Lincoln-Straße 46, 65189 Wiesbaden 232 pp. Deutsch.