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  • Lingua: Inglese

    Editore: Springer-Verlag New York Inc., 2007

    0387736603 / 9780387736600

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    Da: World of Books (was SecondSale), Montgomery, IL, U.S.A.World of Books (was SecondSale)

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    Condizione: Usato - Buono

    EUR 6,29

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    Quantità: 3 disponibili

    Hardback. Condizione: Good. This book contains extended and revised versions of the best papers that were presented during the thirteenth edition of the IFIP TC10/WG10.5 International Conference on Very Large Scale Integration, a Global System-on-a-Chip Design & CAD conference. The 13th conference was held at the Parmelia Hilton Hotel, Perth, Western Australia (October 17-19, 2005). Previous conferences have taken place in Edinburgh, Trondheim, Vancouver, Munich, Grenoble, Tokyo, Gramado, Lisbon, Montpellier and Darmstadt. The purpose of this conference, sponsored by IFIP TC 10 Working Group 10.5, is to provide a forum to exchange ideas and show industrial and academic research results in the field of mic- electronics design. The current trend toward increasing chip integ- tion and technology process advancements brings about stimulating new challenges both at the physical and system-design levels, as well in the test of these systems. VLSI-SOC conferences aim to address these exciting new issues. The 2005 edition of VLSI-SoC maintained the traditional structure, which has been successful at the previous VLSI-SOC conferences. The quality of submissions (107 papers from 26 countries) made the selection process difficult, but finally 63 papers and 25 posters were accepted for presentation in VLSI-SoC 2005. Out of the 63 full papers presented at the conference, 20 were chosen by a selection committee to have an extended and revised version included in this book. These selected papers came from Australia, Brazil, France, Germany, Italy, Korea, Portugal, Sweden, Switzerland, United Kingdom and the United States of America. x Preface.…

  • Lingua: Inglese

    Editore: Springer-Verlag New York Inc., 2007

    0387736603 / 9780387736600

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    Da: World of Books Inc, Montgomery, IL, U.S.A.World of Books Inc

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    Condizione: Usato - Buono

    EUR 8,14

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    Quantità: 3 disponibili

    Hardback. Condizione: Good. This book contains extended and revised versions of the best papers that were presented during the thirteenth edition of the IFIP TC10/WG10.5 International Conference on Very Large Scale Integration, a Global System-on-a-Chip Design & CAD conference. The 13th conference was held at the Parmelia Hilton Hotel, Perth, Western Australia (October 17-19, 2005). Previous conferences have taken place in Edinburgh, Trondheim, Vancouver, Munich, Grenoble, Tokyo, Gramado, Lisbon, Montpellier and Darmstadt. The purpose of this conference, sponsored by IFIP TC 10 Working Group 10.5, is to provide a forum to exchange ideas and show industrial and academic research results in the field of mic- electronics design. The current trend toward increasing chip integ- tion and technology process advancements brings about stimulating new challenges both at the physical and system-design levels, as well in the test of these systems. VLSI-SOC conferences aim to address these exciting new issues. The 2005 edition of VLSI-SoC maintained the traditional structure, which has been successful at the previous VLSI-SOC conferences. The quality of submissions (107 papers from 26 countries) made the selection process difficult, but finally 63 papers and 25 posters were accepted for presentation in VLSI-SoC 2005. Out of the 63 full papers presented at the conference, 20 were chosen by a selection committee to have an extended and revised version included in this book. These selected papers came from Australia, Brazil, France, Germany, Italy, Korea, Portugal, Sweden, Switzerland, United Kingdom and the United States of America. x Preface.…

  • Lingua: Inglese

    Editore: Springer, 2007

    0387736603 / 9780387736600

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    Da: Basi6 International, Irving, TX, U.S.A.Basi6 International

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    Condizione: Nuovo

    EUR 45,81

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    Quantità: 8 disponibili

    Condizione: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.

  • Lingua: Inglese

    Editore: Springer, 2007

    0387736603 / 9780387736600

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    EUR 46,42

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    Quantità: 5 disponibili

    Condizione: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.

  • Lingua: Inglese

    Editore: Springer, 2007

    0387736603 / 9780387736600

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    EUR 48,05

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  • Lingua: Inglese

    Editore: Springer, 2007

    0387736603 / 9780387736600

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    EUR 69,96

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    Quantità: 8 disponibili

    Condizione: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.

  • Lingua: Inglese

    Editore: Springer, 2007

    0387736603 / 9780387736600

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    EUR 70,89

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    Condizione: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.

  • Lingua: Inglese

    Editore: Springer, 2007

    0387736603 / 9780387736600

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    EUR 73,37

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    Quantità: 5 disponibili

    Condizione: New. Brand New Original US Edition. Customer service! Satisfaction Guaranteed.

  • Lingua: Inglese

    Editore: Springer, 2007

    0387736603 / 9780387736600

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    EUR 78,27

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    Quantità: 1 disponibile

    Condizione: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.

  • Lingua: Inglese

    Editore: Springer, 2007

    0387736603 / 9780387736600

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    Condizione: Nuovo

    EUR 79,33

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    Quantità: 1 disponibile

    Condizione: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.

  • Lingua: Inglese

    Editore: Springer, 1999

    0792386868 / 9780792386865

    Serie: Libro 35 di 40 - Frontiers in Electronic Testing

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    Da: HPB-Red, Dallas, TX, U.S.A.HPB-Red

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    Condizione: Usato - Buono

    EUR 86,28

    EUR 3,36 spedizione 
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    Quantità: 1 disponibile

    Hardcover. Condizione: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority.

  • Condizione: Nuovo

    EUR 94,94

    EUR 4,47 spedizione 
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    Quantità: 1 disponibile

    Soft cover. Condizione: New. US SELLER SHIPS FAST FROM USA.

  • Lingua: Inglese

    Editore: SP SPRINGER, 2007

    0387736603 / 9780387736600

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    • Edizione Internazionale

    Da: UK BOOKS STORE, London, LONDO, Regno UnitoUK BOOKS STORE

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    EUR 93,31

    EUR 7,14 spedizione 
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    Quantità: Più di 20 disponibili

    Condizione: New. Brand New! Fast Delivery This is an International Edition and ship within 24-48 hours. Deliver by FedEx and Dhl, & Aramex, UPS, & USPS and we do accept APO and PO BOX Addresses. Order can be delivered worldwide within 6-10 days and we do have flat rate for up to 2LB. Extra shipping charges will be requested if the Book weight is more than 5 LB. This Item May be shipped from India, United states & United Kingdom. Depending on your location and availability.…

  • Lingua: Inglese

    Editore: Springer, 1999

    0792386868 / 9780792386865

    Serie: Libro 35 di 40 - Frontiers in Electronic Testing

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    EUR 125,01

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    Quantità: 1 disponibile

    Condizione: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.

  • Lingua: Inglese

    Editore: Springer, 1999

    0792386868 / 9780792386865

    Serie: Libro 35 di 40 - Frontiers in Electronic Testing

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    Da: Romtrade Corp., STERLING HEIGHTS, MI, U.S.A.Romtrade Corp.

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    EUR 126,70

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    Condizione: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.

  • Condizione: Usato - Ottimo

    EUR 30,31

    EUR 105,00 spedizione 
    Spedito da Germania a U.S.A.

    Quantità: 1 disponibile

    Condizione: Sehr gut. Zustand: Sehr gut | Seiten: 344 | Sprache: Englisch | Produktart: Bücher | International Federation for Information ProcessingThe IFIP series publishes state-of-the-art results in the sciences and technologies of information and communication.  The scope of the series includes: foundations of computer science; software theory and practice; education; computer applications in technology; communication systems; systems modeling and optimization; information systems; computers and society; computer systems technology; security and protection in information processing systems; artificial intelligence; and human-computer interaction.  Proceedings and post-proceedings of referred international conferences in computer science and interdisciplinary fields are featured.  These results often precede journal publication and represent the most current research.  The principal aim of the IFIP series is to encourage education and the dissemination and exchange of information about all aspects of computing. For more information about the 300 other books in the IFIP series, please visit [LINK ENTFERNT] more information about IFIP, please visit [LINK ENTFERNT].…

  • Condizione: Nuovo

    EUR 131,20

    EUR 13,48 spedizione 
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    Condizione: New. In English.

  • Lingua: Inglese

    Editore: Springer US, 2010

    1441944672 / 9781441944672

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    Da: moluna, Greven, Germaniamoluna

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    EUR 92,27

    EUR 48,99 spedizione 
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    Condizione: New.

  • Lingua: Inglese

    Editore: Springer US, 2007

    0387736603 / 9780387736600

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    EUR 93,00

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    Gebunden. Condizione: New.

  • Lingua: Inglese

    Editore: Kluwer Academic, 1999

    0792386868 / 9780792386865

    Serie: Libro 35 di 40 - Frontiers in Electronic Testing

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    EUR 119,33

    EUR 38,19 spedizione 
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    Quantità: 1 disponibile

    Condizione: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. Clean from markings. In good all round condition. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,500grams, ISBN:9780792386865. …

  • Lingua: Inglese

    Editore: Springer, 2010

    1441944672 / 9781441944672

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    Da: Books Puddle, Woodside, NY, U.S.A.Books Puddle

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    EUR 160,84

    EUR 3,57 spedizione 
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    Quantità: 4 disponibili

    Condizione: New. pp. 356.

  • Condizione: Nuovo

    EUR 124,85

    EUR 35,00 spedizione 
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    Quantità: 2 disponibili

    Buch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book contains extended and revised versions of the best papers that were presented during the thirteenth edition of the IFIP TC10/WG10.5 International Conference on Very Large Scale Integration, a Global System-on-a-Chip Design & CAD conference. The 13th conference was held at the Parmelia Hilton Hotel, Perth, Western Australia (October 17-19, 2005). Previous conferences have taken place in Edinburgh, Trondheim, Vancouver, Munich, Grenoble, Tokyo, Gramado, Lisbon, Montpellier and Darmstadt. The purpose of this conference, sponsored by IFIP TC 10 Working Group 10.5, is to provide a forum to exchange ideas and show industrial and academic research results in the field of mic- electronics design. The current trend toward increasing chip integ- tion and technology process advancements brings about stimulating new challenges both at the physical and system-design levels, as well in the test of these systems. VLSI-SOC conferences aim to address these exciting new issues. The 2005 edition of VLSI-SoC maintained the traditional structure, which has been successful at the previous VLSI-SOC conferences. The quality of submissions (107 papers from 26 countries) made the selection process difficult, but finally 63 papers and 25 posters were accepted for presentation in VLSI-SoC 2005. Out of the 63 full papers presented at the conference, 20 were chosen by a selection committee to have an extended and revised version included in this book. These selected papers came from Australia, Brazil, France, Germany, Italy, Korea, Portugal, Sweden, Switzerland, United Kingdom and the United States of America. x Preface.…

  • Condizione: Nuovo

    EUR 124,85

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    Quantità: 1 disponibile

    Taschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book contains extended and revised versions of the best papers that were presented during the thirteenth edition of the IFIP TC10/WG10.5 International Conference on Very Large Scale Integration, a Global System-on-a-Chip Design & CAD conference. The 13th conference was held at the Parmelia Hilton Hotel, Perth, Western Australia (October 17-19, 2005). Previous conferences have taken place in Edinburgh, Trondheim, Vancouver, Munich, Grenoble, Tokyo, Gramado, Lisbon, Montpellier and Darmstadt. The purpose of this conference, sponsored by IFIP TC 10 Working Group 10.5, is to provide a forum to exchange ideas and show industrial and academic research results in the field of mic- electronics design. The current trend toward increasing chip integ- tion and technology process advancements brings about stimulating new challenges both at the physical and system-design levels, as well in the test of these systems. VLSI-SOC conferences aim to address these exciting new issues. The 2005 edition of VLSI-SoC maintained the traditional structure, which has been successful at the previous VLSI-SOC conferences. The quality of submissions (107 papers from 26 countries) made the selection process difficult, but finally 63 papers and 25 posters were accepted for presentation in VLSI-SoC 2005. Out of the 63 full papers presented at the conference, 20 were chosen by a selection committee to have an extended and revised version included in this book. These selected papers came from Australia, Brazil, France, Germany, Italy, Korea, Portugal, Sweden, Switzerland, United Kingdom and the United States of America. x Preface.…

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    Condizione: Nuovo

    EUR 95,25

    EUR 70,00 spedizione 
    Spedito da Germania a U.S.A.

    Quantità: 5 disponibili

    Taschenbuch. Condizione: Neu. VLSI-SoC: From Systems to Silicon | IFIP TC10/ WG 10.5 Thirteenth International Conference on Very Large Scale Integration of System on Chip (VLSI-SoC2005), October 17-19, 2005, Perth, Australia | Ricardo Reis (u. a.) | Taschenbuch | IFIP Advances in Information and Communication Technology | x | Englisch | 2010 | Springer | EAN 9781441944672 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.…

  • Condizione: Nuovo

    EUR 159,10

    EUR 14,93 spedizione 
    Spedito da Regno Unito a U.S.A.

    Quantità: 2 disponibili

    Paperback. Condizione: Brand New. 354 pages. 9.25x6.25x0.75 inches. In Stock.

  • Condizione: Nuovo

    EUR 161,83

    EUR 14,93 spedizione 
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    Quantità: 2 disponibili

    Hardcover. Condizione: Brand New. 1st edition. 344 pages. 9.25x6.25x1.00 inches. In Stock.

  • Condizione: Nuovo

    EUR 165,97

    EUR 13,48 spedizione 
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    Condizione: New. In English.

  • Lingua: Inglese

    Editore: Springer, 2010

    1441951156 / 9781441951151

    Serie: Libro 35 di 40 - Frontiers in Electronic Testing

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    Da: Ria Christie Collections, Uxbridge, Regno UnitoRia Christie Collections

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    EUR 186,76

    EUR 11,19 spedizione 
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    Condizione: New. In English.

  • Lingua: Inglese

    Editore: Springer, 1999

    0792386868 / 9780792386865

    Serie: Libro 35 di 40 - Frontiers in Electronic Testing

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    Da: Ria Christie Collections, Uxbridge, Regno UnitoRia Christie Collections

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    EUR 186,70

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    Condizione: New. In English.

  • Lingua: Inglese

    Editore: Kluwer Academic Publishers, 1999

    0792386868 / 9780792386865

    Serie: Libro 35 di 40 - Frontiers in Electronic Testing

    • Rilegato

    Da: Kennys Bookshop and Art Galleries Ltd., Galway, GY, IrlandaKennys Bookshop and Art Galleries Ltd.

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    EUR 199,18

    EUR 9,50 spedizione 
    Spedito da Irlanda a U.S.A.

    Quantità: 15 disponibili

    Condizione: New. The Mixed-Signal Boundary-Scan Test Bus is the natural complement to the widely used Boundary-Scan IEEE Standard 1149.1, commonly known as JTAG. This title presents a comprehensive treatment of the design, application and structure of the IEEE 1149.4. It is suitable for researchers and professionals who need to understand IEEE Standard 1149.4. Editor(s): Osseiran, Adam. Series: Frontiers in Electronic Testing. Num Pages: 174 pages, biography. BIC Classification: TJFC; TJFD. Category: (P) Professional & Vocational; (XV) Technical / Manuals. Dimension: 234 x 156 x 11. Weight in Grams: 426. . 1999. Hardback. . . . .…