Lingua: Inglese
Editore: Materials Research Society, 2011
ISBN 10: 1605113123 ISBN 13: 9781605113128
Da: Basi6 International, Irving, TX, U.S.A.
Condizione: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
Da: Chiron Media, Wallingford, Regno Unito
EUR 127,35
Quantità: Più di 20 disponibili
Aggiungi al carrelloHardcover. Condizione: New.
EUR 144,96
Quantità: 3 disponibili
Aggiungi al carrelloCondizione: New. pp. 404 14:B&W 6 x 9 in or 229 x 152 mm Case Laminate on White w/Gloss Lam.
Da: Revaluation Books, Exeter, Regno Unito
EUR 144,34
Quantità: 2 disponibili
Aggiungi al carrelloHardcover. Condizione: Brand New. 2nd edition. 385 pages. 9.00x6.25x1.25 inches. In Stock.
Condizione: New. pp. 404 2nd Edition.
EUR 165,22
Quantità: 3 disponibili
Aggiungi al carrelloCondizione: New. pp. 404.
Da: THE SAINT BOOKSTORE, Southport, Regno Unito
EUR 161,17
Quantità: Più di 20 disponibili
Aggiungi al carrelloHardback. Condizione: New. New copy - Usually dispatched within 4 working days.
Da: Brook Bookstore On Demand, Napoli, NA, Italia
EUR 138,55
Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: new. Questo è un articolo print on demand.
Lingua: Inglese
Editore: Elsevier Science & Technology, Elsevier, 2014
ISBN 10: 0080999298 ISBN 13: 9780080999296
Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germania
EUR 150,00
Quantità: 2 disponibili
Aggiungi al carrelloBuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The second edition of Internal Photoemission Spectroscopy thoroughly updates this vital, practical guide to internal photoemission (IPE) phenomena and measurements. The book's discussion of fundamental physical and technical aspects of IPE spectroscopic applications is supplemented by an extended overview of recent experimental results in swiftly advancing research fields. These include the development of insulating materials for advanced SiMOS technology, metal gate materials, development of heterostructures based on high-mobility semiconductors, and more. Recent results concerning the band structure of important interfaces in novel materials are covered as well. Internal photoemission involves the physics of charge carrier photoemission from one solid to another, and different spectroscopic applications of this phenomenon to solid state heterojunctions. This technique complements conventional external photoemission spectroscopy by analyzing interfaces separated from the sample surface by a layer of a different solid or liquid. Internal photoemission provides the most straightforward, reliable information regarding the energy spectrum of electron states at interfaces. At the same time, the method enables the analysis of heterostructures relevant to modern micro- and nano-electronic devices as well as new materials involved in their design and fabrication. Englisch.
Lingua: Inglese
Editore: Elsevier Science & Technology, Elsevier, 2014
ISBN 10: 0080999298 ISBN 13: 9780080999296
Da: AHA-BUCH GmbH, Einbeck, Germania
EUR 165,99
Quantità: 2 disponibili
Aggiungi al carrelloBuch. Condizione: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - The second edition of Internal Photoemission Spectroscopy thoroughly updates this vital, practical guide to internal photoemission (IPE) phenomena and measurements. The book's discussion of fundamental physical and technical aspects of IPE spectroscopic applications is supplemented by an extended overview of recent experimental results in swiftly advancing research fields. These include the development of insulating materials for advanced SiMOS technology, metal gate materials, development of heterostructures based on high-mobility semiconductors, and more. Recent results concerning the band structure of important interfaces in novel materials are covered as well. Internal photoemission involves the physics of charge carrier photoemission from one solid to another, and different spectroscopic applications of this phenomenon to solid state heterojunctions. This technique complements conventional external photoemission spectroscopy by analyzing interfaces separated from the sample surface by a layer of a different solid or liquid. Internal photoemission provides the most straightforward, reliable information regarding the energy spectrum of electron states at interfaces. At the same time, the method enables the analysis of heterostructures relevant to modern micro- and nano-electronic devices as well as new materials involved in their design and fabrication.