Al hashimi bashir (123 risultati)

Condizione: Good. Former library copy. Pages intact with minimal writing/highlighting. The binding may be loose and creased. Dust jackets/supplements are not included. Includes library markings. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good.

Condizione: Very Good. Former library copy. Pages intact with possible writing/highlighting. Binding strong with minor wear. Dust jackets/supplements may not be included. Includes library markings. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good.

Condizione: Good. Volume 18. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In good all round condition. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,1550grams, ISBN:9780863415524. …

Condizione: Fair. Volume 18. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In fair condition, suitable as a study copy. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,1550grams, ISBN:9780863415524.…

Condizione: Good. Volume 18. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In good all round condition. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,1550grams, ISBN:9780863415524. …

Hardcover. Condizione: Very Good. No Jacket. May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less.

Condizione: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.

Hardcover. Condizione: As New. Like new, never been used.

hardcover. Condizione: Very Good. No Dust Jacket. Hard cover with no jacket. Book is in very good condition. Very light wear in a few places at edges and corners. Previous owner's name to FEP. Thin mark vertically down inside of cover. Contents are otherwise clean, bright and tight. J. Used.

Condizione: Used. pp. 220.

Condizione: Used. pp. 220 Illus.

Condizione: Used. pp. 220.

Condizione: New.

Condizione: New.

Condizione: New.

Condizione: New.

Condizione: As New. Unread book in perfect condition.

Condizione: New.

Condizione: New.

Condizione: New.

Condizione: New. Focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. This text surveys existing techniques and presents several test automation techniques for reducing power in scan-based sequential circuits and BIST data paths. Series: Frontiers in Electronic Testing. Num Pages: 189 pages, biography. BIC Classification: TJFD. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 297 x 210 x 12. Weight in Grams: 990. . 2003. Hardback. . . . .…

Condizione: New. Addresses the development and validation of co-synthesis techniques that allow an effective design of embedded systems with low energy dissipation. This book provides an overview of a system-level co-design flow, illustrating how system performance is influenced at various steps of the flow including allocation, mapping, and scheduling. Num Pages: 194 pages, biography. BIC Classification: TJFD1. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly. Dimension: 235 x 155 x 14. Weight in Grams: 1080. . 2003. Hardback. . . . .…

Condizione: New. Brand New! Fast Delivery This is an International Edition and ship within 24-48 hours. Deliver by FedEx and Dhl, & Aramex, UPS, & USPS and we do accept APO and PO BOX Addresses. Order can be delivered worldwide within 6-10 days and we do have flat rate for up to 2LB. Extra shipping charges will be requested if the Book weight is more than 5 LB. This Item May be shipped from India, United states & United Kingdom. Depending on your location and availability.…

Condizione: New.

Condizione: New.

Gebunden. Condizione: New. This text focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. It surveys existing techniques and presents several test automation techniques for redu.

Condizione: As New. Unread book in perfect condition.

Condizione: New.

Condizione: New.

Condizione: New. pp. 214.