Da: Books Puddle, New York, NY, U.S.A.
Condizione: New. pp. xxiv + 536 1st Edition.
Da: Majestic Books, Hounslow, Regno Unito
EUR 126,27
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Aggiungi al carrelloCondizione: New. pp. xxiv + 536.
Da: Biblios, Frankfurt am main, HESSE, Germania
EUR 129,75
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Aggiungi al carrelloCondizione: New. pp. xxiv + 536.
Da: preigu, Osnabrück, Germania
EUR 184,85
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Aggiungi al carrelloTaschenbuch. Condizione: Neu. Modern Developments in X-Ray and Neutron Optics | Alexei Erko (u. a.) | Taschenbuch | Springer Series in Optical Sciences | xxiv | Englisch | 2010 | Springer | EAN 9783642093982 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
Da: Books Puddle, New York, NY, U.S.A.
Condizione: New. pp. XXIV + 536.
Lingua: Inglese
Editore: Springer Berlin Heidelberg, 2010
ISBN 10: 3642093981 ISBN 13: 9783642093982
Da: AHA-BUCH GmbH, Einbeck, Germania
EUR 213,99
Quantità: 1 disponibili
Aggiungi al carrelloTaschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - This volume describes modern developments in reflective, refractive and diffractive optics for short wavelength radiation as well as recent theoretical approaches to modelling and ray-tracing the X-ray and neutron optical systems. It is based on the joint research activities of specialists in X-ray and neutron optics from 11 countries, working together under the framework of the European Programme for Cooperation in Science and Technology (COST, Action P7) in the period 2002--2006. The chapters are written by leading specialists from European laboratories, universities and large facilities. In addition to new ideas and concepts, the contents provide a large amount of practical information about recently implemented devices and methods.
Lingua: Inglese
Editore: Springer Berlin Heidelberg, 2008
ISBN 10: 3540745602 ISBN 13: 9783540745600
Da: AHA-BUCH GmbH, Einbeck, Germania
EUR 213,99
Quantità: 1 disponibili
Aggiungi al carrelloBuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - This volume describes modern developments in reflective, refractive and diffractive optics for short wavelength radiation as well as recent theoretical approaches to modelling and ray-tracing the X-ray and neutron optical systems. It is based on the joint research activities of specialists in X-ray and neutron optics from 11 countries, working together under the framework of the European Programme for Cooperation in Science and Technology (COST, Action P7) in the period 2002--2006. The chapters are written by leading specialists from European laboratories, universities and large facilities. In addition to new ideas and concepts, the contents provide a large amount of practical information about recently implemented devices and methods.
Da: Mispah books, Redhill, SURRE, Regno Unito
EUR 316,93
Quantità: 1 disponibili
Aggiungi al carrelloPaperback. Condizione: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
Da: UK BOOKS STORE, London, LONDO, Regno Unito
EUR 374,28
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Aggiungi al carrelloCondizione: New. Brand New ! Fast Delivery "International Edition " and ship within 24-48 hours. Deliver by FedEx and Dhl, & Aramex, UPS, & USPS and we do accept APO and PO BOX Addresses. Order can be delivered worldwide within 4-6 Working days .and we do have flat rate for up to 2LB. Extra shipping charges will be requested This Item May be shipped from India, United states & United Kingdom. Depending on your location and availability.
Da: Mispah books, Redhill, SURRE, Regno Unito
EUR 383,41
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Aggiungi al carrelloHardcover. Condizione: Like New. Like New. book.
Da: Brook Bookstore On Demand, Napoli, NA, Italia
EUR 166,29
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Aggiungi al carrelloCondizione: new. Questo è un articolo print on demand.
Da: Brook Bookstore On Demand, Napoli, NA, Italia
EUR 166,29
Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: new. Questo è un articolo print on demand.
Lingua: Inglese
Editore: Springer Berlin Heidelberg, 2008
ISBN 10: 3540745602 ISBN 13: 9783540745600
Da: moluna, Greven, Germania
EUR 180,07
Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Summarizes current knowledge on neutron and x-ray opticsGives advice on the design of neutron and x-ray optical devicesValuable reference work for researchers, engineers and graduate students alikeAlexei Erko received PhD degree .
Lingua: Inglese
Editore: Springer Berlin Heidelberg, 2010
ISBN 10: 3642093981 ISBN 13: 9783642093982
Da: moluna, Greven, Germania
EUR 180,07
Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Summarizes current knowledge on neutron and x-ray opticsGives advice on the design of neutron and x-ray optical devicesValuable reference work for researchers, engineers and graduate students alikeAlexei Erko received PhD degree .
Lingua: Inglese
Editore: Springer Berlin Heidelberg Apr 2008, 2008
ISBN 10: 3540745602 ISBN 13: 9783540745600
Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germania
EUR 213,99
Quantità: 2 disponibili
Aggiungi al carrelloBuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This volume describes modern developments in reflective, refractive and diffractive optics for short wavelength radiation. It also covers recent theoretical approaches to modelling and ray-tracing the x-ray and neutron optical systems. It is based on the joint research activities of specialists in x-ray and neutron optics, working together under the framework of the European Programme for Cooperation in Science and Technology (COST, Action P7) in the period 2002-2006. 564 pp. Englisch.
Lingua: Inglese
Editore: Springer Berlin Heidelberg Nov 2010, 2010
ISBN 10: 3642093981 ISBN 13: 9783642093982
Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germania
EUR 213,99
Quantità: 2 disponibili
Aggiungi al carrelloTaschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This volume describes modern developments in reflective, refractive and diffractive optics for short wavelength radiation. It also covers recent theoretical approaches to modelling and ray-tracing the x-ray and neutron optical systems. It is based on the joint research activities of specialists in x-ray and neutron optics, working together under the framework of the European Programme for Cooperation in Science and Technology (COST, Action P7) in the period 2002-2006. 560 pp. Englisch.
Da: preigu, Osnabrück, Germania
EUR 186,70
Quantità: 5 disponibili
Aggiungi al carrelloBuch. Condizione: Neu. Modern Developments in X-Ray and Neutron Optics | Alexei Erko (u. a.) | Buch | Springer Series in Optical Sciences | xxiv | Englisch | 2008 | Springer | EAN 9783540745600 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu Print on Demand.
Da: Majestic Books, Hounslow, Regno Unito
EUR 270,95
Quantità: 4 disponibili
Aggiungi al carrelloCondizione: New. Print on Demand pp. XXIV + 536 299 Illus. (5 Col.).
Lingua: Inglese
Editore: Springer Vieweg, Springer Apr 2008, 2008
ISBN 10: 3540745602 ISBN 13: 9783540745600
Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germania
EUR 213,99
Quantità: 1 disponibili
Aggiungi al carrelloBuch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Theoretical Approaches and Calculations.- X-Ray and Neutron Optical Systems.- The BESSY Raytrace Program RAY.- Neutron Beam Phase Space Mapping.- Raytrace of Neutron Optical Systems with RESTRAX.- Wavefront Propagation.- Theoretical Analysis of X-Ray Waveguides.- Focusing Optics for Neutrons.- Volume Effects in Zone Plates.- Nano-Optics Metrology.- Slope Error and Surface Roughness.- The Long Trace Profilers.- The Nanometer Optical Component Measuring Machine.- Shape Optimization of High Performance X-Ray Optics.- Measurement of Groove Density of Diffraction Gratings.- The COST P7 Round Robin for Slope Measuring Profilers.- Hartmann and Shack-Hartmann Wavefront Sensors for Sub-nanometric Metrology.- Extraction of Multilayer Coating Parameters from X-Ray Reflectivity Data.- Refection/Refraction Optics.- Hard X-Ray Microoptics.- Capillary Optics for X-Rays.- Reflective Optical Arrays.- Reflective Optical Structures and Imaging Detector Systems.- CLESSIDRA: Focusing Hard X-Rays Efficiently with Small Prism Arrays.- Multilayer Optics Developments.- Neutron Supermirror Development.- Stress Reduction in Multilayers Used for X-Ray and Neutron Optics.- Multilayers with Ultra-Short Periods.- Specially Designed Multilayers.- Diffraction Optics.- Diffractive-Refractive Optics: X-ray Crystal Monochromators with Profiled Diffracting Surfaces.- Neutron Multiple Reflections Excited in Cylindrically Bent Perfect Crystals and Their Possible use for High-Resolution Neutron Scattering.- Volume Modulated Diffraction X-Ray Optics.- High Resolution 1D and 2D Crystal Optics Based on Asymmetric Diffractors.- Thermal Effects under Synchrotron Radiation Power Absorption.Springer-Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 564 pp. Englisch.
Lingua: Inglese
Editore: Springer, Springer Nov 2010, 2010
ISBN 10: 3642093981 ISBN 13: 9783642093982
Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germania
EUR 213,99
Quantità: 1 disponibili
Aggiungi al carrelloTaschenbuch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Theoretical Approaches and Calculations.- X-Ray and Neutron Optical Systems.- The BESSY Raytrace Program RAY.- Neutron Beam Phase Space Mapping.- Raytrace of Neutron Optical Systems with RESTRAX.- Wavefront Propagation.- Theoretical Analysis of X-Ray Waveguides.- Focusing Optics for Neutrons.- Volume Effects in Zone Plates.- Nano-Optics Metrology.- Slope Error and Surface Roughness.- The Long Trace Profilers.- The Nanometer Optical Component Measuring Machine.- Shape Optimization of High Performance X-Ray Optics.- Measurement of Groove Density of Diffraction Gratings.- The COST P7 Round Robin for Slope Measuring Profilers.- Hartmann and Shack-Hartmann Wavefront Sensors for Sub-nanometric Metrology.- Extraction of Multilayer Coating Parameters from X-Ray Reflectivity Data.- Refection/Refraction Optics.- Hard X-Ray Microoptics.- Capillary Optics for X-Rays.- Reflective Optical Arrays.- Reflective Optical Structures and Imaging Detector Systems.- CLESSIDRA: Focusing Hard X-Rays Efficiently with Small Prism Arrays.- Multilayer Optics Developments.- Neutron Supermirror Development.- Stress Reduction in Multilayers Used for X-Ray and Neutron Optics.- Multilayers with Ultra-Short Periods.- Specially Designed Multilayers.- Diffraction Optics.- Diffractive-Refractive Optics: X-ray Crystal Monochromators with Profiled Diffracting Surfaces.- Neutron Multiple Reflections Excited in Cylindrically Bent Perfect Crystals and Their Possible use for High-Resolution Neutron Scattering.- Volume Modulated Diffraction X-Ray Optics.- High Resolution 1D and 2D Crystal Optics Based on Asymmetric Diffractors.- Thermal Effects under Synchrotron Radiation Power Absorption.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 560 pp. Englisch.
Da: Biblios, Frankfurt am main, HESSE, Germania
EUR 274,26
Quantità: 4 disponibili
Aggiungi al carrelloCondizione: New. PRINT ON DEMAND pp. XXIV + 536.