Anand asundi (17 risultati)

Soft cover. Condizione: Good. No Jacket. First. 267pp. wear, soil, W/full markings. Weight is 2.5 lb. Ex-Library Size: 4to. Book.

hardcover. Condizione: Very Good. Legacy smart filter userdata3=general (pricing criteria).

Condizione: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.

Condizione: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.

hardcover. Condizione: New. In shrink wrap. Looks like an interesting title.

Condizione: New. pp. xii + 327.

Condizione: New. pp. xii + 327 Illus.

Condizione: New. pp. 232.

Condizione: New. pp. 232.

HRD. Condizione: New. New Book. Shipped from UK. Established seller since 2000.

Condizione: New. By taking a practical approach to the industrial inspection of digital holography, Digital Holography for MEMS and Microsystem Metrology offers a description of the use of digital holography and its growing applications for MEMS characterization, residual stress measurement, design and evaluation and device testing and inspection. Editor(s): Asundi, Anand. Series: Microsystem and Nanotechnology Series (ME20). Num Pages: 232 pages, Illustrations. BIC Classification: TGMT1; TJ. Category: (P) Professional & Vocational. Dimension: 237 x 164 x 19. Weight in Grams: 486. . 2011. 1st Edition. Hardcover. . . . .…

Condizione: New. Brand new! Please provide a physical shipping address.

Hardback. Condizione: New. New copy - Usually dispatched within 4 working days.

Condizione: New. By taking a practical approach to the industrial inspection of digital holography, Digital Holography for MEMS and Microsystem Metrology offers a description of the use of digital holography and its growing applications for MEMS characterization, residual stress measurement, design and evaluation and device testing and inspection. Editor(s): Asundi, Anand. Series: Microsystem and Nanotechnology Series (ME20). Num Pages: 232 pages, Illustrations. BIC Classification: TGMT1; TJ. Category: (P) Professional & Vocational. Dimension: 237 x 164 x 19. Weight in Grams: 486. . 2011. 1st Edition. Hardcover. . . . . Books ship from the US and Ireland.…

Hardcover. Condizione: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

Buch. Condizione: Neu. Neuware - Approaching the topic of digital holography from the practical perspective of industrial inspection, Digital Holography for MEMS and Microsystem Metrology describes the process of digital holography and its growing applications for MEMS characterization, residual stress measurement, design and evaluation, and device testing and inspection. Asundi also provides a thorough theoretical grounding that enables the reader to understand basic concepts and thus identify areas where this technique can be adopted. This combination of both practical and theoretical approach will ensure the book's relevance and appeal to both researchers and engineers keen to evaluate the potential of digital holography for integration into their existing machines and processes.\* Addresses particle characterization where digital holography has proven capability for dynamic measurement of particles in 3D for sizing and shape characterization, with applications in microfluidics as well as crystallization and aerosol detection studies.\* Discusses digital reflection holography, digital transmission holography, digital in-line holography, and digital holographic tomography and applications.\* Covers other applications including micro-optical and diffractive optical systems and the testing of these components, and bio-imaging.…

Condizione: Sehr gut. Zustand: Sehr gut | Seiten: 776 | Sprache: Englisch | Produktart: Bücher | Keine Beschreibung verfügbar.