Baptiste gault (30 risultati)
Vie de Nicolas Poussin, considéré comme chef de l'École françoise -Language: french
Gault De Saint-Germain, Pierre-Marie; Massard, Jean; Massard, Jean Baptiste Louis
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Vie de Nicolas Poussin, considéré comme chef de l'École françoise -Language: french
Gault De Saint-Germain, Pierre-Marie; Massard, Jean; Massard, Jean Baptiste Louis
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Da: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
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EUR 13,71
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Vie de Nicolas Poussin, Considéré Comme Chef de l'École Françoise: Précédé d'Un Précis Historique Des Peintres François, Suivie de Notes Inédites Et Authentiques (French Edition)
Gault De Saint-Germain, Pierre-Marie; Massard, Jean; Massard, Jean Baptiste Louis
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Da: California Books, Miami, FL, U.S.A.California Books
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EUR 16,21
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Vie de Nicolas Poussin, considéré comme chef de l'École françoise -Language: french
Gault De Saint-Germain, Pierre-Marie; Massard, Jean; Massard, Jean Baptiste Louis
- Brossura
Da: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
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Vie de Nicolas Poussin, Considéré Comme Chef de l'École Françoise (French Edition)
Gault De Saint-Germain, Pierre-Marie; Massard, Jean; Massard, Jean Baptiste Louis
- Brossura
Da: California Books, Miami, FL, U.S.A.California Books
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EUR 21,61
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Vie de Nicolas Poussin, considéré comme chef de l'École françoise -Language: french
Gault De Saint-Germain, Pierre-Marie; Massard, Jean; Massard, Jean Baptiste Louis
- Brossura
Da: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
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Vie de Nicolas Poussin, Considéré Comme Chef de l'École Françoise: Précédé d'Un Précis Historique Des Peintres François, Suivie de Notes Inédites Et Authentiques (French Edition)
Gault De Saint-Germain, Pierre-Marie; Massard, Jean; Massard, Jean Baptiste Louis
- Brossura
Da: Ria Christie Collections, Uxbridge, Regno UnitoRia Christie Collections
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Vie de Nicolas Poussin, considéré comme chef de l'École françoise -Language: french
Gault De Saint-Germain, Pierre-Marie; Massard, Jean; Massard, Jean Baptiste Louis
- Brossura
Da: GreatBookPricesUK, Woodford Green, Regno UnitoGreatBookPricesUK
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Vie de Nicolas Poussin, Considéré Comme Chef de l'École Françoise (French Edition)
Gault De Saint-Germain, Pierre-Marie; Massard, Jean; Massard, Jean Baptiste Louis
- Brossura
Da: Ria Christie Collections, Uxbridge, Regno UnitoRia Christie Collections
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Vie de Nicolas Poussin, considéré comme chef de l'École françoise -Language: french
Gault De Saint-Germain, Pierre-Marie; Massard, Jean; Massard, Jean Baptiste Louis
- Brossura
Da: GreatBookPricesUK, Woodford Green, Regno UnitoGreatBookPricesUK
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EUR 18,69
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Condizione: As New. Unread book in perfect condition.
Vie de Nicolas Poussin, considéré comme chef de l'École françoise -Language: french
Gault De Saint-Germain, Pierre-Marie; Massard, Jean; Massard, Jean Baptiste Louis
- Brossura
Da: GreatBookPricesUK, Woodford Green, Regno UnitoGreatBookPricesUK
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EUR 19,66
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Vie de Nicolas Poussin, considéré comme chef de l'École françoise -Language: french
Gault De Saint-Germain, Pierre-Marie; Massard, Jean; Massard, Jean Baptiste Louis
- Brossura
Da: GreatBookPricesUK, Woodford Green, Regno UnitoGreatBookPricesUK
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Vie de Nicolas Poussin, Considéré Comme Chef de l École Françoise: Précédé d Un Précis Historique Des Peintres François, Suivie de Notes Inédites Et A
Gault de Saint-Germain, Pierre-Marie|Massard, Jean|Massard, Jean Baptiste Louis
- Brossura
Da: moluna, Greven, Germaniamoluna
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Condizione: New.
Atom Probe Microscopy (Springer Series in Materials Science (160))
Gault, Baptiste; Moody, Michael P.; Cairney, Julie M.; Ringer, Simon P.
Lingua: Inglese
Editore: Springer, 2012
Serie: Springer Series in Materials Science, Libro 39 di 233. Libro 39 di 233 - Springer Series in Materials Science
- Rilegato
Da: Greenway, Chattanooga, TN, U.S.A.Greenway
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Hardcover. Condizione: Good condition. good condition,fast ship.
Vie de Nicolas Poussin, Considere Comme Chef de l\ Ecole Francoise
Gault de Saint-Germain, Pierre-Marie|Massard, Jean|Massard, Jean Baptiste Louis
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Da: moluna, Greven, Germaniamoluna
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Condizione: New.
Atom Probe Microscopy (Springer Series in Materials Science, 160)
Gault, Baptiste; Moody, Michael P.; Cairney, Julie M.; Ringer, Simon P.
Lingua: Inglese
Editore: Springer, 2014
Serie: Springer Series in Materials Science, Libro 39 di 233. Libro 39 di 233 - Springer Series in Materials Science
- Brossura
Da: Ria Christie Collections, Uxbridge, Regno UnitoRia Christie Collections
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EUR 251,93
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Condizione: New. In.
Lingua: Inglese
Editore: Springer New York, 2014
Serie: Springer Series in Materials Science, Libro 39 di 233. Libro 39 di 233 - Springer Series in Materials Science
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Da: moluna, Greven, Germaniamoluna
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EUR 250,30
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Condizione: New.
Lingua: Inglese
Editore: Springer New York, 2012
Serie: Springer Series in Materials Science, Libro 39 di 233. Libro 39 di 233 - Springer Series in Materials Science
- Rilegato
Da: moluna, Greven, Germaniamoluna
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EUR 250,30
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Gebunden. Condizione: New.
Altre immaginiLingua: Inglese
Editore: Springer, 2014
Serie: Springer Series in Materials Science, Libro 39 di 233. Libro 39 di 233 - Springer Series in Materials Science
- Brossura
Da: preigu, Osnabrück, Germaniapreigu
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EUR 256,65
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Taschenbuch. Condizione: Neu. Atom Probe Microscopy | Baptiste Gault (u. a.) | Taschenbuch | Springer Series in Materials Science | xxiv | Englisch | 2014 | Springer | EAN 9781489989390 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbie…ter: preigu.
Lingua: Inglese
Editore: Springer, Humana, 2014
Serie: Springer Series in Materials Science, Libro 39 di 233. Libro 39 di 233 - Springer Series in Materials Science
- Brossura
Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH
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EUR 310,11
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Taschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last decade with the… development of wide-field-of-view detectors and pulsed-laser-assisted evaporation that have significantly enhanced the instrument's capabilities. The field is flourishing, and atom probe microscopy is being embraced as a mainstream characterization technique. This book covers all facets of atom probe microscopy-including field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography.Atom Probe Microscopy is aimed at researchers of all experience levels. It will provide the beginner with the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques. This includes detailed explanations of the fundamentals and the instrumentation, contemporary specimen preparation techniques, experimental details, and an overview of the results that can be obtained. The book emphasizes processes for assessing data quality, and the proper implementation of advanced data mining algorithms. Those more experienced in the technique will benefit from the book as a single comprehensive source of indispensable reference information, tables and techniques. Both beginner and expert will value the way that Atom Probe Microscopy is set out in the context of materials science and engineering, and includes references to key recent research outcomes.
Lingua: Inglese
Editore: Springer, Humana, 2012
Serie: Springer Series in Materials Science, Libro 39 di 233. Libro 39 di 233 - Springer Series in Materials Science
- Rilegato
Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 310,11
EUR 63,97 spedizioneSpedito da Germania a U.S.A.Quantità: 1 disponibili
Buch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last decade with the develo…pment of wide-field-of-view detectors and pulsed-laser-assisted evaporation that have significantly enhanced the instrument's capabilities. The field is flourishing, and atom probe microscopy is being embraced as a mainstream characterization technique. This book covers all facets of atom probe microscopy-including field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography.Atom Probe Microscopy is aimed at researchers of all experience levels. It will provide the beginner with the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques. This includes detailed explanations of the fundamentals and the instrumentation, contemporary specimen preparation techniques, experimental details, and an overview of the results that can be obtained. The book emphasizes processes for assessing data quality, and the proper implementation of advanced data mining algorithms. Those more experienced in the technique will benefit from the book as a single comprehensive source of indispensable reference information, tables and techniques. Both beginner and expert will value the way that Atom Probe Microscopy is set out in the context of materials science and engineering, and includes references to key recent research outcomes.
Lingua: Inglese
Editore: Springer, 2014
Serie: Springer Series in Materials Science, Libro 39 di 233. Libro 39 di 233 - Springer Series in Materials Science
- Brossura
Da: Books Puddle, New York, NY, U.S.A.Books Puddle
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EUR 411,27
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Condizione: New. pp. 422.
Lingua: Inglese
Editore: Springer, 2014
Serie: Springer Series in Materials Science, Libro 39 di 233. Libro 39 di 233 - Springer Series in Materials Science
- Brossura
Da: Majestic Books, Hounslow, Regno UnitoMajestic Books
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EUR 441,75
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Condizione: New. pp. 422.
- Brossura
Da: liu xing, Nanjing, JS, Cinaliu xing
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EUR 142,93
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paperback. Condizione: New. Paperback. Pub Date: 2016-03-01 Pages: 326 Language: Chinese Publisher: science press co. LTD. the atom probe microscopy includes theoretical basis. practical aspects of atom probe and its application in material science three parts. first summarizes the development course of atom probe technology. in…troduces the prototype of atom probe field from.
Lingua: Inglese
Editore: Springer, 2012
Serie: Springer Series in Materials Science, Libro 39 di 233. Libro 39 di 233 - Springer Series in Materials Science
- Rilegato
- Print on Demand
Da: Brook Bookstore On Demand, Napoli, NA, ItaliaBrook Bookstore On Demand
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EUR 230,32
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Condizione: new. Questo è un articolo print on demand.
Lingua: Inglese
Editore: Springer, 2014
Serie: Springer Series in Materials Science, Libro 39 di 233. Libro 39 di 233 - Springer Series in Materials Science
- Brossura
- Print on Demand
Da: Brook Bookstore On Demand, Napoli, NA, ItaliaBrook Bookstore On Demand
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EUR 230,32
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Condizione: new. Questo è un articolo print on demand.
Lingua: Inglese
Editore: Springer, Humana Jun 2014, 2014
Serie: Springer Series in Materials Science, Libro 39 di 233. Libro 39 di 233 - Springer Series in Materials Science
- Brossura
- Print on Demand
Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermaniaBuchWeltWeit Ludwig Meier e.K.
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EUR 299,59
EUR 23,00 spedizioneSpedito da Germania a U.S.A.Quantità: 2 disponibili
Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last… decade with the development of wide-field-of-view detectors and pulsed-laser-assisted evaporation that have significantly enhanced the instrument's capabilities. The field is flourishing, and atom probe microscopy is being embraced as a mainstream characterization technique. This book covers all facets of atom probe microscopy-including field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography.Atom Probe Microscopy is aimed at researchers of all experience levels. It will provide the beginner with the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques. This includes detailed explanations of the fundamentals and the instrumentation, contemporary specimen preparation techniques, experimental details, and an overview of the results that can be obtained. The book emphasizes processes for assessing data quality, and the proper implementation of advanced data mining algorithms. Those more experienced in the technique will benefit from the book as a single comprehensive source of indispensable reference information, tables and techniques. Both beginner and expert will value the way that Atom Probe Microscopy is set out in the context of materials science and engineering, and includes references to key recent research outcomes. 420 pp. Englisch.
Lingua: Inglese
Editore: Springer, Humana Mai 2012, 2012
Serie: Springer Series in Materials Science, Libro 39 di 233. Libro 39 di 233 - Springer Series in Materials Science
- Rilegato
- Print on Demand
Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermaniaBuchWeltWeit Ludwig Meier e.K.
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 299,59
EUR 23,00 spedizioneSpedito da Germania a U.S.A.Quantità: 2 disponibili
Buch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last decade… with the development of wide-field-of-view detectors and pulsed-laser-assisted evaporation that have significantly enhanced the instrument's capabilities. The field is flourishing, and atom probe microscopy is being embraced as a mainstream characterization technique. This book covers all facets of atom probe microscopy-including field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography.Atom Probe Microscopy is aimed at researchers of all experience levels. It will provide the beginner with the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques. This includes detailed explanations of the fundamentals and the instrumentation, contemporary specimen preparation techniques, experimental details, and an overview of the results that can be obtained. The book emphasizes processes for assessing data quality, and the proper implementation of advanced data mining algorithms. Those more experienced in the technique will benefit from the book as a single comprehensive source of indispensable reference information, tables and techniques. Both beginner and expert will value the way that Atom Probe Microscopy is set out in the context of materials science and engineering, and includes references to key recent research outcomes. 420 pp. Englisch.
Lingua: Inglese
Editore: Springer, Humana Mai 2012, 2012
Serie: Springer Series in Materials Science, Libro 39 di 233. Libro 39 di 233 - Springer Series in Materials Science
- Rilegato
- Print on Demand
Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germaniabuchversandmimpf2000
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 299,59
EUR 60,00 spedizioneSpedito da Germania a U.S.A.Quantità: 1 disponibili
Buch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last decade wit…h the development of wide-field-of-view detectors and pulsed-laser-assisted evaporation that have significantly enhanced the instrument¿s capabilities. The field is flourishing, and atom probe microscopy is being embraced as a mainstream characterization technique. This book covers all facets of atom probe microscopy¿including field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography.Atom Probe Microscopy is aimed at researchers of all experience levels. It will provide the beginner with the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques. This includes detailed explanations of the fundamentals and the instrumentation, contemporary specimen preparation techniques, experimental details, and an overview of the results that can be obtained. The book emphasizes processes for assessing data quality, and the proper implementation of advanced data mining algorithms. Those more experienced in the technique will benefit from the book as a single comprehensive source of indispensable reference information, tables and techniques. Both beginner and expert will value the way that Atom Probe Microscopy is set out in the context of materials science and engineering, and includes references to key recent research outcomes.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 420 pp. Englisch.
Lingua: Inglese
Editore: Springer, Humana Jun 2014, 2014
Serie: Springer Series in Materials Science, Libro 39 di 233. Libro 39 di 233 - Springer Series in Materials Science
- Brossura
- Print on Demand
Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germaniabuchversandmimpf2000
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 299,59
EUR 60,00 spedizioneSpedito da Germania a U.S.A.Quantità: 1 disponibili
Taschenbuch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last dec…ade with the development of wide-field-of-view detectors and pulsed-laser-assisted evaporation that have significantly enhanced the instrument¿s capabilities. The field is flourishing, and atom probe microscopy is being embraced as a mainstream characterization technique. This book covers all facets of atom probe microscopy¿including field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography.Atom Probe Microscopy is aimed at researchers of all experience levels. It will provide the beginner with the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques. This includes detailed explanations of the fundamentals and the instrumentation, contemporary specimen preparation techniques, experimental details, and an overview of the results that can be obtained. The book emphasizes processes for assessing data quality, and the proper implementation of advanced data mining algorithms. Those more experienced in the technique will benefit from the book as a single comprehensive source of indispensable reference information, tables and techniques. Both beginner and expert will value the way that Atom Probe Microscopy is set out in the context of materials science and engineering, and includes references to key recent research outcomes.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 420 pp. Englisch.
