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Da: Ria Christie Collections, Uxbridge, Regno Unito
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Da: GreatBookPricesUK, Woodford Green, Regno Unito
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Da: GreatBookPrices, Columbia, MD, U.S.A.
EUR 191,88
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Da: GreatBookPrices, Columbia, MD, U.S.A.
EUR 196,01
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Aggiungi al carrelloCondizione: As New. Unread book in perfect condition.
Lingua: Inglese
Editore: Springer International Publishing, 2019
ISBN 10: 303009121X ISBN 13: 9783030091217
Da: moluna, Greven, Germania
EUR 153,73
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Aggiungi al carrelloCondizione: New.
Lingua: Inglese
Editore: Springer International Publishing, 2018
ISBN 10: 3319749889 ISBN 13: 9783319749884
Da: moluna, Greven, Germania
EUR 153,73
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Aggiungi al carrelloGebunden. Condizione: New.
Da: GreatBookPricesUK, Woodford Green, Regno Unito
EUR 198,30
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Aggiungi al carrelloCondizione: As New. Unread book in perfect condition.
Condizione: New. pp. 336.
Da: Mispah books, Redhill, SURRE, Regno Unito
EUR 198,30
Quantità: 1 disponibili
Aggiungi al carrelloPaperback. Condizione: New. New. book.
Condizione: New. 1st ed. 2018 edition NO-PA16APR2015-KAP.
Lingua: Inglese
Editore: Springer International Publishing, Springer Nature Switzerland, 2019
ISBN 10: 303009121X ISBN 13: 9783030091217
Da: AHA-BUCH GmbH, Einbeck, Germania
EUR 181,89
Quantità: 1 disponibili
Aggiungi al carrelloTaschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book summarizes the most recent and compelling experimental results for complex oxide interfaces. The results of this book were obtained with the cutting-edge photoemission technique at highest energy resolution. Due to their fascinating properties for new-generation electronic devices and the challenge of investigating buried regions, the book chiefly focuses on complex oxide interfaces. The crucial feature of exploring buried interfaces is the use of soft X-ray angle-resolved photoemission spectroscopy (ARPES) operating on the energy range of a few hundred eV to increase the photoelectron mean free path, enabling the photons to penetrate through the top layers - in contrast to conventional ultraviolet (UV)-ARPES techniques. The results presented here, achieved by different research groups around the world, are summarized in a clearly structured way and discussed in comparison with other photoemission spectroscopy techniques and other oxide materials. They are complemented and supported by the most recent theoretical calculations as well as results of complementary experimental techniques including electron transport and inelastic resonant X-ray scattering.
Lingua: Inglese
Editore: Springer International Publishing, Springer International Publishing, 2018
ISBN 10: 3319749889 ISBN 13: 9783319749884
Da: AHA-BUCH GmbH, Einbeck, Germania
EUR 181,89
Quantità: 1 disponibili
Aggiungi al carrelloBuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book summarizes the most recent and compelling experimental results for complex oxide interfaces. The results of this book were obtained with the cutting-edge photoemission technique at highest energy resolution. Due to their fascinating properties for new-generation electronic devices and the challenge of investigating buried regions, the book chiefly focuses on complex oxide interfaces. The crucial feature of exploring buried interfaces is the use of soft X-ray angle-resolved photoemission spectroscopy (ARPES) operating on the energy range of a few hundred eV to increase the photoelectron mean free path, enabling the photons to penetrate through the top layers - in contrast to conventional ultraviolet (UV)-ARPES techniques. The results presented here, achieved by different research groups around the world, are summarized in a clearly structured way and discussed in comparison with other photoemission spectroscopy techniques and other oxide materials. They are complemented and supported by the most recent theoretical calculations as well as results of complementary experimental techniques including electron transport and inelastic resonant X-ray scattering.
Da: Mispah books, Redhill, SURRE, Regno Unito
EUR 253,26
Quantità: 1 disponibili
Aggiungi al carrelloHardcover. Condizione: New. New. book.
Da: Revaluation Books, Exeter, Regno Unito
EUR 276,88
Quantità: 2 disponibili
Aggiungi al carrelloHardcover. Condizione: Brand New. 336 pages. 9.25x6.10x1.02 inches. In Stock.
Da: Brook Bookstore On Demand, Napoli, NA, Italia
EUR 142,27
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Aggiungi al carrelloCondizione: new. Questo è un articolo print on demand.
Da: Brook Bookstore On Demand, Napoli, NA, Italia
EUR 142,27
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Aggiungi al carrelloCondizione: new. Questo è un articolo print on demand.
Lingua: Inglese
Editore: Springer International Publishing, Springer Nature Switzerland Jan 2019, 2019
ISBN 10: 303009121X ISBN 13: 9783030091217
Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germania
EUR 181,89
Quantità: 2 disponibili
Aggiungi al carrelloTaschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book summarizes the most recent and compelling experimental results for complex oxide interfaces. The results of this book were obtained with the cutting-edge photoemission technique at highest energy resolution. Due to their fascinating properties for new-generation electronic devices and the challenge of investigating buried regions, the book chiefly focuses on complex oxide interfaces. The crucial feature of exploring buried interfaces is the use of soft X-ray angle-resolved photoemission spectroscopy (ARPES) operating on the energy range of a few hundred eV to increase the photoelectron mean free path, enabling the photons to penetrate through the top layers - in contrast to conventional ultraviolet (UV)-ARPES techniques. The results presented here, achieved by different research groups around the world, are summarized in a clearly structured way and discussed in comparison with other photoemission spectroscopy techniques and other oxide materials. They are complemented and supported by the most recent theoretical calculations as well as results of complementary experimental techniques including electron transport and inelastic resonant X-ray scattering. 336 pp. Englisch.
Lingua: Inglese
Editore: Springer International Publishing, Springer Nature Switzerland Apr 2018, 2018
ISBN 10: 3319749889 ISBN 13: 9783319749884
Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germania
EUR 181,89
Quantità: 2 disponibili
Aggiungi al carrelloBuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book summarizes the most recent and compelling experimental results for complex oxide interfaces. The results of this book were obtained with the cutting-edge photoemission technique at highest energy resolution. Due to their fascinating properties for new-generation electronic devices and the challenge of investigating buried regions, the book chiefly focuses on complex oxide interfaces. The crucial feature of exploring buried interfaces is the use of soft X-ray angle-resolved photoemission spectroscopy (ARPES) operating on the energy range of a few hundred eV to increase the photoelectron mean free path, enabling the photons to penetrate through the top layers - in contrast to conventional ultraviolet (UV)-ARPES techniques. The results presented here, achieved by different research groups around the world, are summarized in a clearly structured way and discussed in comparison with other photoemission spectroscopy techniques and other oxide materials. They are complemented and supported by the most recent theoretical calculations as well as results of complementary experimental techniques including electron transport and inelastic resonant X-ray scattering. 336 pp. Englisch.
Da: Majestic Books, Hounslow, Regno Unito
EUR 234,28
Quantità: 4 disponibili
Aggiungi al carrelloCondizione: New. Print on Demand pp. 336.
Lingua: Inglese
Editore: Springer International Publishing, Springer International Publishing Apr 2018, 2018
ISBN 10: 3319749889 ISBN 13: 9783319749884
Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germania
EUR 181,89
Quantità: 1 disponibili
Aggiungi al carrelloBuch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book summarizes the most recent and compelling experimental results for complex oxide interfaces. The results of this book were obtained with the cutting-edge photoemission technique at highest energy resolution. Due to their fascinating properties for new-generation electronic devices and the challenge of investigating buried regions, the book chiefly focuses on complex oxide interfaces.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 336 pp. Englisch.
Lingua: Inglese
Editore: Springer International Publishing, Springer Nature Switzerland Jan 2019, 2019
ISBN 10: 303009121X ISBN 13: 9783030091217
Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germania
EUR 181,89
Quantità: 1 disponibili
Aggiungi al carrelloTaschenbuch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book summarizes the most recent and compelling experimental results for complex oxide interfaces. The results of this book were obtained with the cutting-edge photoemission technique at highest energy resolution. Due to their fascinating properties for new-generation electronic devices and the challenge of investigating buried regions, the book chiefly focuses on complex oxide interfaces.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 336 pp. Englisch.
Da: Biblios, Frankfurt am main, HESSE, Germania
EUR 236,30
Quantità: 4 disponibili
Aggiungi al carrelloCondizione: New. PRINT ON DEMAND pp. 336.
Da: Majestic Books, Hounslow, Regno Unito
EUR 247,82
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Da: Biblios, Frankfurt am main, HESSE, Germania
EUR 248,81
Quantità: 4 disponibili
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