Dack vant (22 risultati)
Judean-Syrian-Egyptian Conflict of 103-101 B.C. : A Multilingual Dossier Concerning a "War of Scepters"
Dack, E. Van't; Clarysse, W.; Cohen, G.; Quaegebeur, J.; Winnicki, J. K.
- Brossura
Da: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
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EUR 48,03
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Condizione: As New. Unread book in perfect condition.
Lingua: Francese
Editore: Bruxelles: Association Égyptologique Reine Élisabeth, 1951
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Da: Borkert, Schwarz und Zerfaß GbR, Berlin, GermaniaBorkert, Schwarz und Zerfaß GbR
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EUR 10,00
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Extrait. Condizione: Gut. p. 386-390. De la bibliothèque du professeur Wolfgang Haase, éditeur de longue date de l'ANRW et de l'International Journal of the Classical Tradition (IJCT). - Un peu abîmé, noms des auteurs soulignés sur la couverture, sinon propre. - Extrait du texte: Au sixième Congrès International de Papyrologie,…qui sest tenu à Paris en 1949, nous avons eu loccasion dénumérer les principales difficultés que nous rencontrions dans nos recherches prosopographiques concernant lÉgypte ptolémaïque. Depuis lors, nous avons publié en 1950 le premier volume de la Prosopographia Ptolemaica, dont lintroduction a défini la méthode suivie pour résoudre les problèmes envisagés. Dans les pages qui suivent, nous voudrions montrer, à laide de quelques exemples choisis dans lexposé oral fait à ce congrès, le profit quon peut tirer de létude prosopographique des textes, lorsquil sagit dinterpréter certains titres ou de dater certains documents. Sprache: Französisch Gewicht in Gramm: 550.
Altre immaginiL'administration civile et financière n°1 à 1824 - prosopographie ptolemaica 6 / Studia hellenistica
Editore: G.P. Maisonneuve / E.J. Brill, 1950
Da: crealivres, la fontennelle, Franciacrealivres
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EUR 23,00
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Condizione: Poor. Envoi rapide dos fendus défaît couverture défraîchie intérieur propre ex libris. in8. 1950. Broché. Poor.
Judean-Syrian-Egyptian Conflict of 103-101 B.C. : A Multilingual Dossier Concerning a "War of Scepters"
Dack, E. Van't; Clarysse, W.; Cohen, G.; Quaegebeur, J.; Winnicki, J. K.
- Brossura
Da: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
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EUR 97,05
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Condizione: New.
Microbeam And Nanobeam Analysis
Benoit, Daniele; Bresse, Jean-Francois; Van't dack, Luc; Werner, Helmut; Wernisch, Johann
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Da: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
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EUR 116,64
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Condizione: New.
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Da: California Books, Miami, FL, U.S.A.California Books
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EUR 119,03
Spedizione gratuitaSpedito in U.S.A.Quantità: Più di 20 disponibili
Condizione: New.
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Da: Ria Christie Collections, Uxbridge, Regno UnitoRia Christie Collections
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EUR 116,53
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Condizione: New. In.
Microbeam And Nanobeam Analysis
Benoit, Daniele; Bresse, Jean-Francois; Van't dack, Luc; Werner, Helmut; Wernisch, Johann
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Da: GreatBookPricesUK, Woodford Green, Regno UnitoGreatBookPricesUK
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EUR 116,51
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Condizione: New.
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Da: Chiron Media, Wallingford, Regno UnitoChiron Media
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EUR 114,55
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Paperback. Condizione: New.
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Da: Rarewaves.com USA, London, LONDO, Regno UnitoRarewaves.com USA
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EUR 162,05
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Paperback. Condizione: New. This supplement of Mikrochimica Acta contains selected papers from the Fourth Workshop of the European Microanalysis Society (EMAS) on "Modern Develop- ments and Applications in Microbeam Analysis" which took place in May 1995 in Saint Malo (France). EMAS was founded in 1986 by members from almost all… european countries in order to stimulate research, applications and development of all forms of microbeam methods. One important EMAS activity is the organisation of biennial workshops for demonstrating the current status and developing trends of microanalytical techniques. For this meeting, EMAS chose to highlight the following topics: Monte-Carlo simula- tions, transport calculations and use of soft X-rays for electron probe microanalysis (EPMA), dynamic secondary ion mass spectrometry (SIMS), detection of small quan- tities using different techniques: synchrotron radiation X-ray fluorescence, particle in- duced X-ray emission (PIXE), cathodoluminescence microscopy (CL). Two new kinds of instrumental techniques were also presented: atomic probe and scanning probe microscopy (STM).The aim of the conference is to give introductory lectures corresponding to the topics of the meeting and to have contributions in the form of po- ster sessions. More than 80 posters were presented. Most of them gave a short oral pre- sentation. The poster subjects were related to the use of microanalytical techniques: EPMA with wavelength dispersive spectrometry (WDS) and energy dispersive spec- trometry (EDS), Auger electron spectrometry (AES), secondary ion mass spectro- metry (SIMS), scanning electron microscopy and other topographical methods like scanning tunneling microscopy (STM) or atomic force microscopy (AFM). Softcover reprint of the original 1st ed. 1996.
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Da: preigu, Osnabrück, Germaniapreigu
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Taschenbuch. Condizione: Neu. Microbeam and Nanobeam Analysis | Daniele Benoit (u. a.) | Taschenbuch | xi | Englisch | 1996 | Springer | EAN 9783211828748 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
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Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH
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EUR 116,27
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Taschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - This supplement of Mikrochimica Acta contains selected papers from the Fourth Workshop of the European Microanalysis Society (EMAS) on 'Modern Develop ments and Applications in Microbeam Analysis' which took place in May 1995 in Saint Malo (France…). EMAS was founded in 1986 by members from almost all european countries in order to stimulate research, applications and development of all forms of microbeam methods. One important EMAS activity is the organisation of biennial workshops for demonstrating the current status and developing trends of microanalytical techniques. For this meeting, EMAS chose to highlight the following topics: Monte-Carlo simula tions, transport calculations and use of soft X-rays for electron probe microanalysis (EPMA), dynamic secondary ion mass spectrometry (SIMS), detection of small quan tities using different techniques: synchrotron radiation X-ray fluorescence, particle in duced X-ray emission (PIXE), cathodoluminescence microscopy (CL). Two new kinds of instrumental techniques were also presented: atomic probe and scanning probe microscopy (STM). The aim of the conference is to give introductory lectures corresponding to the topics of the meeting and to have contributions in the form of po ster sessions. More than 80 posters were presented. Most of them gave a short oral pre sentation. The poster subjects were related to the use of microanalytical techniques: EPMA with wavelength dispersive spectrometry (WDS) and energy dispersive spec trometry (EDS), Auger electron spectrometry (AES), secondary ion mass spectro metry (SIMS), scanning electron microscopy and other topographical methods like scanning tunneling microscopy (STM) or atomic force microscopy (AFM).
Microbeam And Nanobeam Analysis
Benoit, Daniele; Bresse, Jean-Francois; Van't dack, Luc; Werner, Helmut; Wernisch, Johann
- Brossura
Da: GreatBookPricesUK, Woodford Green, Regno UnitoGreatBookPricesUK
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EUR 169,57
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Condizione: As New. Unread book in perfect condition.
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Da: Mispah books, Redhill, SURRE, Regno UnitoMispah books
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EUR 159,96
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Paperback. Condizione: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
Microbeam And Nanobeam Analysis
Benoit, Daniele/ Bresse, Jean-Francois/ Van't dack, Luc/ Werner, Helmut/ Wernisch, Johann
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Da: Revaluation Books, Exeter, Regno UnitoRevaluation Books
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EUR 166,63
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Paperback. Condizione: Brand New. 650 pages. 10.94x8.27x1.50 inches. In Stock.
Microbeam And Nanobeam Analysis
Benoit, Daniele; Bresse, Jean-Francois; Van't dack, Luc; Werner, Helmut; Wernisch, Johann
- Brossura
Da: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
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EUR 192,44
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Condizione: As New. Unread book in perfect condition.
Microbeam and Nanobeam Analysis: 13 (Mikrochimica Acta Supplementa, 13)
Daniele Benoit, Jean-Francois Bresse, Luc Van't dack, Helmut Werner, Johann Wernisch
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Da: Rarewaves.com UK, London, Regno UnitoRarewaves.com UK
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EUR 152,19
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Paperback. Condizione: New. Softcover reprint of the original 1st ed. 1996.
The Judean-Syrian-Egyptian conflict of 103-101 B. C. A multilingual dossier concerning a "war of sceptres"
VAN'T DACK Edmond - CLARYSSE Willy - QUAEGEBEUR Jan - WINNICKI Jan Krzysztof
Lingua: Inglese
Da: Meretseger Books, Paris, FranciaMeretseger Books
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EUR 56,00
EUR 15,00 spedizioneSpedito da Francia a U.S.A.Quantità: 1 disponibili
Collectanea Hellenistica 1. Comite klassieke studies Subcomité hellénisme Koninklijke Academie voor wetenschappen letteren en schone kunsten van België, Brussels, 1989. First edition. In-4, 172 pages, 16 plates. Original softcover, a fine copy. From the library of Egyptologist Charles Cornell Van Siclen III (VSX). Language: Engl…ish. This book ships from the USA, shipping costs will be updated accordingly (TXR). Relevant subjects: Egypt: Greco-Roman, Levant.
Altre immaginiEditore: Nauwelaerts / E.J. Brill, 1953
Da: crealivres, la fontennelle, Franciacrealivres
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EUR 70,00
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Condizione: Fair. Envoi rapide dos recollé couverture défraîchie intérieur propre présence de quelques annotations au crayon à papier. in8. 1953. Broché. Fair.
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Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermaniaBuchWeltWeit Ludwig Meier e.K.
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EUR 106,99
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Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This supplement of Mikrochimica Acta contains selected papers from the Fourth Workshop of the European Microanalysis Society (EMAS) on 'Modern Develop ments and Applications in Microbeam Analysis' which took place in May 1995 in Sa…int Malo (France). EMAS was founded in 1986 by members from almost all european countries in order to stimulate research, applications and development of all forms of microbeam methods. One important EMAS activity is the organisation of biennial workshops for demonstrating the current status and developing trends of microanalytical techniques. For this meeting, EMAS chose to highlight the following topics: Monte-Carlo simula tions, transport calculations and use of soft X-rays for electron probe microanalysis (EPMA), dynamic secondary ion mass spectrometry (SIMS), detection of small quan tities using different techniques: synchrotron radiation X-ray fluorescence, particle in duced X-ray emission (PIXE), cathodoluminescence microscopy (CL). Two new kinds of instrumental techniques were also presented: atomic probe and scanning probe microscopy (STM). The aim of the conference is to give introductory lectures corresponding to the topics of the meeting and to have contributions in the form of po ster sessions. More than 80 posters were presented. Most of them gave a short oral pre sentation. The poster subjects were related to the use of microanalytical techniques: EPMA with wavelength dispersive spectrometry (WDS) and energy dispersive spec trometry (EDS), Auger electron spectrometry (AES), secondary ion mass spectro metry (SIMS), scanning electron microscopy and other topographical methods like scanning tunneling microscopy (STM) or atomic force microscopy (AFM). 660 pp. Englisch.
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Da: moluna, Greven, Germaniamoluna
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Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Monte Carlo Simulation Techniques for Quantitative X-Ray Microanalysis.- Transport Equation Approach to Electron Microbeam Analysis: Fundamentals and Applications.- Use of Soft X-Rays in Microanalysis.- Intensity Mea…surement of Wavelength Dispersive X-Ray E.
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Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germaniabuchversandmimpf2000
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EUR 106,99
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Taschenbuch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This supplement of Mikrochimica Acta contains selected papers from the Fourth Workshop of the European Microanalysis Society (EMAS) on 'Modern Develop ments and Applications in Microbeam Analysis' which took place in May 1995 in Saint…Malo (France). EMAS was founded in 1986 by members from almost all european countries in order to stimulate research, applications and development of all forms of microbeam methods. One important EMAS activity is the organisation of biennial workshops for demonstrating the current status and developing trends of microanalytical techniques. For this meeting, EMAS chose to highlight the following topics: Monte-Carlo simula tions, transport calculations and use of soft X-rays for electron probe microanalysis (EPMA), dynamic secondary ion mass spectrometry (SIMS), detection of small quan tities using different techniques: synchrotron radiation X-ray fluorescence, particle in duced X-ray emission (PIXE), cathodoluminescence microscopy (CL). Two new kinds of instrumental techniques were also presented: atomic probe and scanning probe microscopy (STM). The aim of the conference is to give introductory lectures corresponding to the topics of the meeting and to have contributions in the form of po ster sessions. More than 80 posters were presented. Most of them gave a short oral pre sentation. The poster subjects were related to the use of microanalytical techniques: EPMA with wavelength dispersive spectrometry (WDS) and energy dispersive spec trometry (EDS), Auger electron spectrometry (AES), secondary ion mass spectro metry (SIMS), scanning electron microscopy and other topographical methods like scanning tunneling microscopy (STM) or atomic force microscopy (AFM).Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 660 pp. Englisch.
