Da: Universitätsbuchhandlung Herta Hold GmbH, Berlin, Germania
EUR 13,00
Quantità: 2 disponibili
Aggiungi al carrelloxiii, 113p. Hardcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Stamped. Bumped.Little flexed. Sprache: Englisch.
EUR 62,84
Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: As New. Unread book in perfect condition.
EUR 70,24
Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New.
EUR 64,81
Quantità: 3 disponibili
Aggiungi al carrelloCondizione: New. pages cm.
EUR 72,78
Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New.
EUR 77,89
Quantità: Più di 20 disponibili
Aggiungi al carrelloPAP. Condizione: New. New Book. Shipped from UK. Established seller since 2000.
Condizione: New. pages cm 1.
Da: PBShop.store UK, Fairford, GLOS, Regno Unito
EUR 73,22
Quantità: Più di 20 disponibili
Aggiungi al carrelloPAP. Condizione: New. New Book. Shipped from UK. Established seller since 2000.
Da: Ria Christie Collections, Uxbridge, Regno Unito
EUR 66,80
Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New. In.
Da: GreatBookPricesUK, Woodford Green, Regno Unito
EUR 63,85
Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: As New. Unread book in perfect condition.
Lingua: Inglese
Editore: Institution of Engineering & Technology, 2019
ISBN 10: 1839530537 ISBN 13: 9781839530531
Da: Recycle Bookstore, San Jose, CA, U.S.A.
Hardcover. Condizione: Near Fine. Book has light wear to the edges and corners, otherwise in near new condition.
Da: GreatBookPricesUK, Woodford Green, Regno Unito
EUR 66,79
Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New.
Da: THE SAINT BOOKSTORE, Southport, Regno Unito
EUR 67,55
Quantità: 1 disponibili
Aggiungi al carrelloPaperback / softback. Condizione: New. New copy - Usually dispatched within 4 working days.
Da: Biblios, Frankfurt am main, HESSE, Germania
EUR 73,72
Quantità: 3 disponibili
Aggiungi al carrelloCondizione: New. pages cm.
paperback. Condizione: Very Good.
Da: SpringBooks, Berlin, Germania
Prima edizione
EUR 59,55
Quantità: 1 disponibili
Aggiungi al carrelloHardcover. Condizione: Very Good. 1. Auflage. unread, some shelfwear - will be dispatched immediately.
Da: Homeless Books, Berlin, Germania
Prima edizione
EUR 80,00
Quantità: 1 disponibili
Aggiungi al carrelloSoftcover. Condizione: Wie neu. 1. Auflage. As good as new, unread book in perfect condition. Language - English. Ships from Berlin.
EUR 94,05
Quantità: 2 disponibili
Aggiungi al carrelloPaperback. Condizione: Brand New. 298 pages. 9.18x6.12x9.21 inches. In Stock.
Condizione: New.
Da: California Books, Miami, FL, U.S.A.
EUR 118,60
Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New.
Da: Buchpark, Trebbin, Germania
EUR 10,53
Quantità: 1 disponibili
Aggiungi al carrelloCondizione: Sehr gut. Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher | The book provides a detailed analysis of issues related to sub-threshold interconnect performance from the perspective of analytical approach and design techniques. Particular emphasis is laid on the performance analysis of coupling noise and variability issues in sub-threshold domain to develop efficient compact models. The proposed analytical approach gives physical insight of the parameters affecting the transient behavior of coupled interconnects. Remedial design techniques are also suggested to mitigate the effect of coupling noise. The effects of wire width, spacing between the wires, wire length are thoroughly investigated. In addition, the effect of parameters like driver strength on peak coupling noise has also been analyzed. Process, voltage and temperature variations are prominent factors affecting sub-threshold design and have also been investigated. The process variability analysis has been carried out using parametric analysis, process corner analysis and Monte Carlo technique. The book also provides a qualitative summary of the work reported in the literature by various researchers in the design of digital sub-threshold circuits. This book should be of interest for researchers and graduate students with deeper insights into sub-threshold interconnect models in particular. In this sense, this book will best fit as a text book and/or a reference book for students who are initiated in the area of research and advanced courses in nanotechnology, interconnect design and modeling.
Da: Buchpark, Trebbin, Germania
EUR 10,53
Quantità: 1 disponibili
Aggiungi al carrelloCondizione: Sehr gut. Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher | The book provides a detailed analysis of issues related to sub-threshold interconnect performance from the perspective of analytical approach and design techniques. Particular emphasis is laid on the performance analysis of coupling noise and variability issues in sub-threshold domain to develop efficient compact models. The proposed analytical approach gives physical insight of the parameters affecting the transient behavior of coupled interconnects. Remedial design techniques are also suggested to mitigate the effect of coupling noise. The effects of wire width, spacing between the wires, wire length are thoroughly investigated. In addition, the effect of parameters like driver strength on peak coupling noise has also been analyzed. Process, voltage and temperature variations are prominent factors affecting sub-threshold design and have also been investigated. The process variability analysis has been carried out using parametric analysis, process corner analysis and Monte Carlo technique. The book also provides a qualitative summary of the work reported in the literature by various researchers in the design of digital sub-threshold circuits. This book should be of interest for researchers and graduate students with deeper insights into sub-threshold interconnect models in particular. In this sense, this book will best fit as a text book and/or a reference book for students who are initiated in the area of research and advanced courses in nanotechnology, interconnect design and modeling.
Condizione: As New. Unread book in perfect condition.
Da: Ria Christie Collections, Uxbridge, Regno Unito
EUR 111,06
Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New. In.
Lingua: Inglese
Editore: The Institution of Engineering and Technology, 2019
ISBN 10: 1839530510 ISBN 13: 9781839530517
Da: GreatBookPrices, Columbia, MD, U.S.A.
EUR 123,83
Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: As New. Unread book in perfect condition.
Da: Ria Christie Collections, Uxbridge, Regno Unito
EUR 112,39
Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New. In.
Lingua: Inglese
Editore: The Institution of Engineering and Technology, 2019
ISBN 10: 1839530510 ISBN 13: 9781839530517
Da: GreatBookPricesUK, Woodford Green, Regno Unito
EUR 109,44
Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New.
Da: GreatBookPricesUK, Woodford Green, Regno Unito
EUR 111,05
Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New.
Lingua: Inglese
Editore: The Institution of Engineering and Technology, 2019
ISBN 10: 1839530510 ISBN 13: 9781839530517
Da: GreatBookPrices, Columbia, MD, U.S.A.
EUR 128,46
Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New.
Lingua: Inglese
Editore: Institution of Engineering and Technology, GB, 2019
ISBN 10: 1839530510 ISBN 13: 9781839530517
Da: Rarewaves USA, OSWEGO, IL, U.S.A.
EUR 130,84
Quantità: Più di 20 disponibili
Aggiungi al carrelloHardback. Condizione: New. VLSI, or Very-Large-Scale-Integration, is the practice of combining billions of transistors to create an integrated circuit. At present, VLSI circuits are realised using CMOS technology. However, the demand for ever smaller, more efficient circuits is now pushing the limits of CMOS. Post-CMOS refers to the possible future digital logic technologies beyond the CMOS scaling limits. This 2-volume set addresses the current state of the art in VLSI technologies and presents potential options for post-CMOS processes. VLSI and Post-CMOS Electronics is a useful reference guide for researchers, engineers and advanced students working in the area of design and modelling of VLSI and post-CMOS devices and their circuits. Volume 1 focuses on design, modelling and simulation, including applications in low voltage and low power VLSI, and post-CMOS devices and circuits. Volume 2 addresses a wide range of devices, circuits and interconnects.