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Defect Recognition and Image Processing in Semiconductors 1997 Proceedings of the Seventh International Conference on Defect Recognition and Image Processing in Semiconductors (DRIP VII) Held in Templin, Germany, 7-10 September 1997
Donecker, J. (editor)
Editore: Institute of Physics, 1998
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Hardcover. Condizione: Very Good. Professional book dealer with storefront since 1975. All orders are processed promptly and carefully packaged. ; 524 pages.