Eman gawish (6 risultati)

Perfeziona la tua ricerca

  • Libri (6)

  • Nuovo (6)

a

Fascia di prezzo personalizzata (EUR)

a

  • Lingua: Inglese

    Editore: LAP LAMBERT Academic Publishing, 2015

    3659660906 / 9783659660900

    • Brossura

    Da: preigu, Osnabrück, Germaniapreigu

    Venditore con 5 stelle
    Contatta il venditore

    Condizione: Nuovo

    EUR 53,35

    EUR 70,00 spedizione 
    Spedito da Germania a U.S.A.

    Quantità: 5 disponibili

    Taschenbuch. Condizione: Neu. Variability Tolerant Networks on Chip | Eman Gawish | Taschenbuch | 132 S. | Englisch | 2015 | LAP LAMBERT Academic Publishing | EAN 9783659660900 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de | Anbieter: preigu.…

  • Lingua: Inglese

    Editore: LAP LAMBERT Academic Publishing, 2015

    3659660906 / 9783659660900

    • Brossura

    Da: Mispah books, Redhill, SURRE, Regno UnitoMispah books

    Venditore con 4 stelle
    Contatta il venditore

    Condizione: Nuovo

    EUR 172,10

    EUR 29,42 spedizione 
    Spedito da Regno Unito a U.S.A.

    Quantità: 1 disponibile

    paperback. Condizione: New. NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

  • Lingua: Inglese

    Editore: LAP LAMBERT Academic Publishing Apr 2015, 2015

    3659660906 / 9783659660900

    • Brossura
    • Print on Demand

    Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermaniaBuchWeltWeit Ludwig Meier e.K.

    Venditore con 5 stelle
    Contatta il venditore

    Condizione: Nuovo

    EUR 61,90

    EUR 23,00 spedizione 
    Spedito da Germania a U.S.A.

    Quantità: 2 disponibili

    Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -NoC have been successfully replacing interconnects in multi-core chip. As technology scales down, process variations cause NoC links designed to be identical to have different electrical properties. We propose statistical design methodology that uses a statistical guard to tolerate variations with lower guard than conventional worst-case design. Thus saving power at low failure rate. A variability-aware NoC topology and geometry scaling, in addition to topology evaluation from variation perspective help the designer to perform scaling and choose the topology with lower variations for different technology nodes and NoC size. Finally, variability-aware routing algorithms make use of process variability link failure probability and adapt routing to reduce the NoC failure rate. 132 pp. Englisch.…

  • Lingua: Inglese

    Editore: LAP LAMBERT Academic Publishing, 2015

    3659660906 / 9783659660900

    • Brossura
    • Print on Demand

    Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH

    Venditore con 5 stelle
    Contatta il venditore

    Condizione: Nuovo

    EUR 62,64

    EUR 35,00 spedizione 
    Spedito da Germania a U.S.A.

    Quantità: 1 disponibile

    Taschenbuch. Condizione: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - NoC have been successfully replacing interconnects in multi-core chip. As technology scales down, process variations cause NoC links designed to be identical to have different electrical properties. We propose statistical design methodology that uses a statistical guard to tolerate variations with lower guard than conventional worst-case design. Thus saving power at low failure rate. A variability-aware NoC topology and geometry scaling, in addition to topology evaluation from variation perspective help the designer to perform scaling and choose the topology with lower variations for different technology nodes and NoC size. Finally, variability-aware routing algorithms make use of process variability link failure probability and adapt routing to reduce the NoC failure rate.…

  • Lingua: Inglese

    Editore: LAP LAMBERT Academic Publishing, 2015

    3659660906 / 9783659660900

    • Brossura
    • Print on Demand

    Da: moluna, Greven, Germaniamoluna

    Venditore con 5 stelle
    Contatta il venditore

    Condizione: Nuovo

    EUR 50,66

    EUR 48,99 spedizione 
    Spedito da Germania a U.S.A.

    Quantità: Più di 20 disponibili

    Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: Gawish EmanEman Kamel Gawish received the Ph.D. in Electronics and Electrical Communications Engineering from Cairo University, Giza, Egypt, in 2013. Her general research interests are in advanced system architectures, especially net.…

  • Lingua: Inglese

    Editore: LAP LAMBERT Academic Publishing Apr 2015, 2015

    3659660906 / 9783659660900

    • Brossura
    • Print on Demand

    Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germaniabuchversandmimpf2000

    Venditore con 5 stelle
    Contatta il venditore

    Condizione: Nuovo

    EUR 61,90

    EUR 60,00 spedizione 
    Spedito da Germania a U.S.A.

    Quantità: 1 disponibile

    Taschenbuch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -NoC have been successfully replacing interconnects in multi-core chip. As technology scales down, process variations cause NoC links designed to be identical to have different electrical properties. We propose statistical design methodology that uses a statistical guard to tolerate variations with lower guard than conventional worst-case design. Thus saving power at low failure rate. A variability-aware NoC topology and geometry scaling, in addition to topology evaluation from variation perspective help the designer to perform scaling and choose the topology with lower variations for different technology nodes and NoC size. Finally, variability-aware routing algorithms make use of process variability link failure probability and adapt routing to reduce the NoC failure rate.VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 132 pp. Englisch.…