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Editore: Springer, 2008
ISBN 10: 3540850481ISBN 13: 9783540850489
Da: Broad Street Books, Branchville, NJ, U.S.A.
Libro
hardcover. Condizione: As New. Book is in excellent condition, text is unmarked and pages are tight.
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Editore: Springer, 2008
ISBN 10: 3540740791ISBN 13: 9783540740797
Da: Irish Booksellers, Portland, ME, U.S.A.
Libro
Condizione: Good. SHIPS FROM USA. Used books have different signs of use and do not include supplemental materials such as CDs, Dvds, Access Codes, charts or any other extra material. All used books might have various degrees of writing, highliting and wear and tear and possibly be an ex-library with the usual stickers and stamps. Dust Jackets are not guaranteed and when still present, they will have various degrees of tear and damage. All images are Stock Photos, not of the actual item. book.
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Editore: Springer, New York, NY, 2007
ISBN 10: 3540373209ISBN 13: 9783540373209
Libro
Cloth. Condizione: Very Good. 380236 pp. Tightly bound. Corners not bumped. Text is Free of Markings. Published without dust jacket. NOTE: The word "USED" neatly stamped on top fore-edge.
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Editore: Springer, 2008
ISBN 10: 3540850368ISBN 13: 9783540850366
Da: Broad Street Books, Branchville, NJ, U.S.A.
Libro
hardcover. Condizione: As New. Book is in excellent condition, text is unmarked and pages are tight.
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Editore: Springer, 2008
ISBN 10: 3540740848ISBN 13: 9783540740841
Da: Broad Street Books, Branchville, NJ, U.S.A.
Libro
hardcover. Condizione: As New. Book is in excellent condition, text is unmarked and pages are tight.
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Editore: Springer, 2006
ISBN 10: 3540373152ISBN 13: 9783540373155
Da: Zubal-Books, Since 1961, Cleveland, OH, U.S.A.
Libro
Condizione: Fine. xlv, 344 pp., Hardcover, a tiny scuff to bottom edge of back cover else fine. - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country.
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Editore: Springer, 2008
ISBN 10: 3540850384ISBN 13: 9783540850380
Da: Books Puddle, New York, NY, U.S.A.
Libro
Condizione: New. pp. lvi + 224.
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Editore: Springer, 2006
ISBN 10: 3540262423ISBN 13: 9783540262428
Da: Basi6 International, Irving, TX, U.S.A.
Libro
Condizione: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
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Editore: Springer, 2006
ISBN 10: 3540269096ISBN 13: 9783540269090
Da: Paisleyhaze Books, New Hartford, CT, U.S.A.
Libro
Hardcover. Condizione: New. NEW: Springer pictorial hardcover, 2006, unused, No remainder marks or "shelf wear" (as New). We will bubble-wrap the book and ship it in a BOX with delivery confirmation/tracking.
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Editore: Springer, 2008
ISBN 10: 3540740821ISBN 13: 9783540740827
Da: Books Puddle, New York, NY, U.S.A.
Libro
Condizione: New. pp. lx + 387 1st Edition.
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Editore: Springer, 2010
ISBN 10: 3642024041ISBN 13: 9783642024047
Da: WeBuyBooks, Rossendale, LANCS, Regno Unito
Libro
Condizione: VeryGood. Most items will be dispatched the same or the next working day.
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Editore: Springer, 2004
ISBN 10: 3540005277ISBN 13: 9783540005278
Da: Edmonton Book Store, Edmonton, AB, Canada
Libro
Condizione: Very Good. 8vo pp. 496, "Examining the physical and technical foundation for recent progress with this technique, Applied Scanning Probe Methods offers a timely and comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. First it lays the theoretical background of?. book.
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Editore: Springer, 2006
ISBN 10: 3540269126ISBN 13: 9783540269120
Da: Basi6 International, Irving, TX, U.S.A.
Libro
Condizione: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
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Editore: Springer Berlin Heidelberg Nov 2010, 2010
ISBN 10: 3642093418ISBN 13: 9783642093418
Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germania
Libro Print on Demand
Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. This is the first book to summarize the state-of-the-art of this technique. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely and comprehensive overview of SPM applications. 448 pp. Englisch.
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Editore: Springer, 2010
ISBN 10: 3642072119ISBN 13: 9783642072116
Da: booksXpress, Bayonne, NJ, U.S.A.
Libro
Soft Cover. Condizione: new.
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Editore: Springer, 2010
ISBN 10: 3642072135ISBN 13: 9783642072130
Da: booksXpress, Bayonne, NJ, U.S.A.
Libro
Soft Cover. Condizione: new.
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Editore: Springer, 2010
ISBN 10: 3642093426ISBN 13: 9783642093425
Da: booksXpress, Bayonne, NJ, U.S.A.
Libro
Soft Cover. Condizione: new.
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Editore: Springer Berlin Heidelberg Feb 2010, 2010
ISBN 10: 3642065694ISBN 13: 9783642065699
Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germania
Libro Print on Demand
Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The Nobel Prize of 1986 on Sc- ningTunnelingMicroscopysignaled a new era in imaging. The sc- ning probes emerged as a new - strument for imaging with a p- cision suf cient to delineate single atoms. At rst there were two - the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample. These were quickly followed by the M- netic Force Microscope, MFM, and the Electrostatic Force Microscope, EFM. The MFM will image a single magnetic bit with features as small as 10nm. With the EFM one can monitor the charge of a single electron. Prof. Paul Hansma at Santa Barbara opened the door even wider when he was able to image biological objects in aqueous environments. At this point the sluice gates were opened and a multitude of different instruments appeared. There are signi cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM. The probe microscopes do not require preparation of the sample and they operate in ambient atmosphere, whereas, the SEM must operate in a vacuum environment and the sample must be cross-sectioned to expose the proper surface. However, the SEM can record 3D image and movies, features that are not available with the scanning probes. 464 pp. Englisch.
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Editore: Springer Berlin Heidelberg Feb 2010, 2010
ISBN 10: 3642065961ISBN 13: 9783642065965
Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germania
Libro Print on Demand
Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The Nobel Prize of 1986 on Sc- ning Tunneling Microscopy sig- led a new era in imaging. The sc- ning probes emerged as a new i- trument for imaging with a pre- sion suf cient to delineate single atoms. At rst there were two - the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample. These were quickly followed by the - gneticForceMicroscope,MFM,and the Electrostatic Force Microscope, EFM. The MFM will image a single magnetic bit with features as small as 10nm. With the EFM one can monitor the charge of a single electron. Prof. Paul Hansma at Santa Barbara opened the door even wider when he was able to image biological objects in aqueous environments. At this point the sluice gates were opened and a multitude of different instruments appeared. There are signi cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM. The probe microscopes do not require preparation of the sample and they operate in ambient atmosphere, whereas, the SEM must operate in a vacuum environment and the sample must be cross-sectioned to expose the proper surface. However, the SEM can record 3D image and movies, features that are not available with the scanning probes. 424 pp. Englisch.
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Editore: Springer Berlin Heidelberg Nov 2010, 2010
ISBN 10: 364209340XISBN 13: 9783642093401
Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germania
Libro Print on Demand
Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. This is the first book to summarize the state-of-the-art of this technique. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications. 528 pp. Englisch.
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Editore: Springer Berlin Heidelberg Dez 2010, 2010
ISBN 10: 3642056024ISBN 13: 9783642056024
Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germania
Libro Print on Demand
Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Examining the physical and technical foundation for recent progress with this technique, Applied Scanning Probe Methods offers a timely and comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. First it lays the theoretical background of static and dynamic force microscopies, including sensor technology and tip characterization, contributions detail applications such as macro- and nanotribology, polymer surfaces, and roughness investigations. The final part on industrial research addresses special applications of scanning force nanoprobes such as atomic manipulation and surface modification, as well as single electron devices based on SPM. 500 pp. Englisch.
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Editore: Springer Berlin Heidelberg Nov 2010, 2010
ISBN 10: 364209872XISBN 13: 9783642098727
Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germania
Libro Print on Demand
Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth volumes in early 2006 and the fifth to seventh volumes in late 2006. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications. After introducing scanning probe microscopy, including sensor technology and tip characterization, chapters on use in various industrial applications are presented. Industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters have been written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective. 296 pp. Englisch.
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Editore: Springer Berlin Heidelberg, 2010
ISBN 10: 3642098703ISBN 13: 9783642098703
Da: moluna, Greven, Germania
Libro Print on Demand
Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. First book summarizing the state of the art of this techniqueReal industrial applications includedCrack initiation and growth are key issues when it comes to the mechanical reliab- ity of microelectronic devices and microelectromechanical .
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Editore: Springer Berlin Heidelberg, 2010
ISBN 10: 364209869XISBN 13: 9783642098697
Da: moluna, Greven, Germania
Libro Print on Demand
Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. First book summarizing the state of the art of this techniqueReal industrial applications includedOscillation Control in Dynamic SPM with Quartz Sensors.- Atomic Force Microscope Cantilevers Used as Sensors for Monitoring Microdrop Evapora.
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Editore: Springer, 2010
ISBN 10: 364206597XISBN 13: 9783642065972
Da: booksXpress, Bayonne, NJ, U.S.A.
Libro
Soft Cover. Condizione: new.
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Editore: Springer, 2016
ISBN 10: 3662519194ISBN 13: 9783662519196
Da: booksXpress, Bayonne, NJ, U.S.A.
Libro
Soft Cover. Condizione: new.
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