Paperback. Condizione: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
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Aggiungi al carrelloCondizione: Very good.
Lingua: Inglese
Editore: LAP LAMBERT Academic Publishing, 2012
ISBN 10: 384734417X ISBN 13: 9783847344179
Da: Mispah books, Redhill, SURRE, Regno Unito
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Aggiungi al carrelloPaperback. Condizione: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
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Lingua: Inglese
Editore: LAP LAMBERT Academic Publishing, 2012
ISBN 10: 384734417X ISBN 13: 9783847344179
Da: moluna, Greven, Germania
EUR 48,50
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Aggiungi al carrelloCondizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: Dolah RozzetaShe has 6 years experience as etching engineer at a multinational semiconductor company. With Six Sigma focused on DOE,etching defect had significantly reduced.Due to DOE field interest, she made this dissertation on etc.