Jeffrey soo kim (2 risultati)

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  • Lingua: Inglese

    Editore: Kendall Hunt Publishing (edition 1), 2025

    9798385160877

    • Brossura

    Da: BooksRun, Philadelphia, PA, U.S.A.BooksRun

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    Condizione: Usato - Molto buono

    EUR 29,02

     Spedizione gratuita 
    Spedito in U.S.A.

    Quantità: 2 disponibili

    Paperback. Condizione: Very Good. 1. It's a well-cared-for item that has seen limited use. The item may show minor signs of wear. All the text is legible, with all pages included. It may have slight markings and/or highlighting.

  • Editore: MRS MATERIALS RESEARCH SOCIETY, 2009

    • Rilegato

    Da: Book Grocer, Tullamarine, VIC, AustraliaBook Grocer

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    Condizione: Usato

    EUR 63,66

    EUR 26,69 spedizione 
    Spedito da Australia a U.S.A.

    Quantità: 1 disponibile

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    Hardback. Michael Mastro, Jeffrey Laroche, Jun Bae, Jin-Woo Kim, Myung-Soo Kim, MRS MATERIALS RESEARCH SOCIETY. Author: Michael Mastro, Jeffrey Laroche, Jun Bae, Jin-Woo Kim, Myung-Soo KimBinding: HardbackPublisher: MRS MATERIALS RESEARCH SOCIETY, 2009Condition remarks:Book: Good Jacket: N/APages: Good Markings: No markingsThis academic text addresses the critical aspects of semiconductor device engineering. It details the intricate mechanisms governing the operational performance and long-term reliability of various semiconductor components. The work presents comprehensive analyses of failure modes and degradation processes, offering insights crucial for advanced device design. It further illustrates methodologies for enhancing durability and ensuring consistent functionality in cutting-edge electronic systems. This authoritative volume is an essential resource for researchers and professionals in materials science and electrical engineering. Hardback. …