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  • Condizione: Usato - Come nuovo

    EUR 120,74

    EUR 2,37 spedizione 
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    Quantità: 1 disponibile

    Condizione: As New. Unread book in perfect condition.

  • Condizione: Nuovo

    EUR 135,05

    EUR 2,37 spedizione 
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    Condizione: New.

  • Lingua: Inglese

    Editore: Springer, 2011

    364272969X / 9783642729690

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    Da: GreatBookPricesUK, Woodford Green, Regno UnitoGreatBookPricesUK

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    Condizione: Nuovo

    EUR 124,17

    EUR 18,00 spedizione 
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    Quantità: 1 disponibile

    Condizione: New.

  • Lingua: Inglese

    Editore: Springer, 2011

    364272969X / 9783642729690

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    Da: GreatBookPricesUK, Woodford Green, Regno UnitoGreatBookPricesUK

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    Condizione: Usato - Come nuovo

    EUR 127,93

    EUR 18,00 spedizione 
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    Quantità: Più di 20 disponibili

    Condizione: As New. Unread book in perfect condition.

  • Lingua: Inglese

    Editore: Springer Berlin Heidelberg, 2011

    364272969X / 9783642729690

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    Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH

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    Condizione: Nuovo

    EUR 124,85

    EUR 35,00 spedizione 
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    Quantità: 1 disponibile

    Taschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - The trend towards miniaturisation of microelectronic devices and the search for exotic new optoelectronic devices based on multilayers confer a crucial role on semiconductor interfaces. Great advances have recently been achieved in the elaboration of new thin film materials and in the characterization of their interfacial properties, down to the atomic scale, thanks to the development of sophisticated new techniques. This book is a collection of lectures that were given at the International Winter School on Semiconductor Interfaces: Formation and Properties held at the Centre de Physique des Rouches from 24 February to 6 March, 1987. The aim of this Winter School was to present a comprehensive review of this field, in particular of the materials and methods, and to formulate recom mendations for future research. The following topics are treated: (i) Interface formation. The key aspects of molecular beam epitaxy are emphasized, as well as the fabrication of artificially layered structures, strained layer superlattices and the tailoring of abrupt doping profiles. (ii) Fine characterization down to the atomic scale using recently devel oped, powerful techniques such as scanning tunneling microscopy, high reso lution transmission electron microscopy, glancing incidence x-ray diffraction, x-ray standing waves, surface extended x-ray absorption fine structure and surface extended energy-loss fine structure. (iii) Specific physical properties of the interfaces and their prospective applications in devices. We wish to thank warmly all the lecturers and participants, as well as the organizing committee, who made this Winter School a success.…

  • Lingua: Inglese

    Editore: Springer, 2011

    364272969X / 9783642729690

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    Da: Books Puddle, Woodside, NY, U.S.A.Books Puddle

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    Condizione: Nuovo

    EUR 163,87

    EUR 3,58 spedizione 
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    Quantità: 4 disponibili

    Condizione: New. pp. 408.

  • Condizione: Nuovo

    EUR 161,53

    EUR 15,00 spedizione 
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    Quantità: 2 disponibili

    Paperback. Condizione: Brand New. reprint edition. 400 pages. 9.60x6.80x1.00 inches. In Stock.

  • Lingua: Inglese

    Editore: Springer, 2011

    364272969X / 9783642729690

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    Da: Brook Bookstore On Demand, Napoli, NA, ItaliaBrook Bookstore On Demand

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    Condizione: Nuovo

    EUR 86,24

    EUR 11,00 spedizione 
    Spedito da Italia a U.S.A.

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    Condizione: new. Questo è un articolo print on demand.

  • Lingua: Inglese

    Editore: Springer Berlin Heidelberg Dez 2011, 2011

    364272969X / 9783642729690

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    Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermaniaBuchWeltWeit Ludwig Meier e.K.

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    Condizione: Nuovo

    EUR 106,99

    EUR 23,00 spedizione 
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    Quantità: 2 disponibili

    Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The trend towards miniaturisation of microelectronic devices and the search for exotic new optoelectronic devices based on multilayers confer a crucial role on semiconductor interfaces. Great advances have recently been achieved in the elaboration of new thin film materials and in the characterization of their interfacial properties, down to the atomic scale, thanks to the development of sophisticated new techniques. This book is a collection of lectures that were given at the International Winter School on Semiconductor Interfaces: Formation and Properties held at the Centre de Physique des Rouches from 24 February to 6 March, 1987. The aim of this Winter School was to present a comprehensive review of this field, in particular of the materials and methods, and to formulate recom mendations for future research. The following topics are treated: (i) Interface formation. The key aspects of molecular beam epitaxy are emphasized, as well as the fabrication of artificially layered structures, strained layer superlattices and the tailoring of abrupt doping profiles. (ii) Fine characterization down to the atomic scale using recently devel oped, powerful techniques such as scanning tunneling microscopy, high reso lution transmission electron microscopy, glancing incidence x-ray diffraction, x-ray standing waves, surface extended x-ray absorption fine structure and surface extended energy-loss fine structure. (iii) Specific physical properties of the interfaces and their prospective applications in devices. We wish to thank warmly all the lecturers and participants, as well as the organizing committee, who made this Winter School a success. 408 pp. Englisch.…

  • Lingua: Inglese

    Editore: Springer Berlin Heidelberg, 2011

    364272969X / 9783642729690

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    Da: moluna, Greven, Germaniamoluna

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    Condizione: Nuovo

    EUR 92,27

    EUR 48,99 spedizione 
    Spedito da Germania a U.S.A.

    Quantità: Più di 20 disponibili

    Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. The trend towards miniaturisation of microelectronic devices and the search for exotic new optoelectronic devices based on multilayers confer a crucial role on semiconductor interfaces. Great advances have recently been achieved in the elaboration of new th. …

  • Lingua: Inglese

    Editore: Springer, Springer Spektrum Dez 2011, 2011

    364272969X / 9783642729690

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    Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germaniabuchversandmimpf2000

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    Condizione: Nuovo

    EUR 106,99

    EUR 60,00 spedizione 
    Spedito da Germania a U.S.A.

    Quantità: 1 disponibile

    Taschenbuch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -The trend towards miniaturisation of microelectronic devices and the search for exotic new optoelectronic devices based on multilayers confer a crucial role on semiconductor interfaces. Great advances have recently been achieved in the elaboration of new thin film materials and in the characterization of their interfacial properties, down to the atomic scale, thanks to the development of sophisticated new techniques. This book is a collection of lectures that were given at the International Winter School on Semiconductor Interfaces: Formation and Properties held at the Centre de Physique des Rouches from 24 February to 6 March, 1987. The aim of this Winter School was to present a comprehensive review of this field, in particular of the materials and methods, and to formulate recom mendations for future research. The following topics are treated: (i) Interface formation. The key aspects of molecular beam epitaxy are emphasized, as well as the fabrication of artificially layered structures, strained layer superlattices and the tailoring of abrupt doping profiles. (ii) Fine characterization down to the atomic scale using recently devel oped, powerful techniques such as scanning tunneling microscopy, high reso lution transmission electron microscopy, glancing incidence x-ray diffraction, x-ray standing waves, surface extended x-ray absorption fine structure and surface extended energy-loss fine structure. (iii) Specific physical properties of the interfaces and their prospective applications in devices. We wish to thank warmly all the lecturers and participants, as well as the organizing committee, who made this Winter School a success.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 408 pp. Englisch.…

  • Lingua: Inglese

    Editore: Springer, 2011

    364272969X / 9783642729690

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    Da: Majestic Books, Hounslow, Regno UnitoMajestic Books

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    Condizione: Nuovo

    EUR 170,15

    EUR 7,80 spedizione 
    Spedito da Regno Unito a U.S.A.

    Quantità: 4 disponibili

    Condizione: New. Print on Demand pp. 408 67:B&W 6.69 x 9.61 in or 244 x 170 mm (Pinched Crown) Perfect Bound on White w/Gloss Lam.

  • Lingua: Inglese

    Editore: Springer, 2011

    364272969X / 9783642729690

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    • Print on Demand

    Da: Biblios, frankfurt am main, HESSE, GermaniaBiblios

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    Condizione: Nuovo

    EUR 169,78

    EUR 9,95 spedizione 
    Spedito da Germania a U.S.A.

    Quantità: 4 disponibili

    Condizione: New. PRINT ON DEMAND pp. 408.