Da: Anybook.com, Lincoln, Regno Unito
EUR 13,65
Quantità: 1 disponibili
Aggiungi al carrelloCondizione: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In good all round condition. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,650grams, ISBN:9780131474307.
Da: UK BOOKS STORE, London, LONDO, Regno Unito
EUR 81,99
Quantità: 19 disponibili
Aggiungi al carrelloCondizione: New. Brand New! Fast Delivery This is an International Edition and ship within 24-48 hours. Deliver by FedEx and Dhl, & Aramex, UPS, & USPS and we do accept APO and PO BOX Addresses. Order can be delivered worldwide within 6-10 days and we do have flat rate for up to 2LB. Extra shipping charges will be requested if the Book weight is more than 5 LB. This Item May be shipped from India, United states & United Kingdom. Depending on your location and availability.
EUR 233,84
Quantità: Più di 20 disponibili
Aggiungi al carrelloGebunden. Condizione: New. Focuses on the principles of solid-state sensor operations, demonstrating the interdisciplinary science that governs modern sensing devices. The text covers fabrication technology, device performance, areas of application and integration/multiplexing trends.
Lingua: Inglese
Editore: Springer, 2001
Da: Books in my Basket, New Delhi, India
EUR 149,59
Quantità: 1 disponibili
Aggiungi al carrelloN.A. Condizione: New. ISBN:9780387951492.
Lingua: Inglese
Editore: Springer Berlin Heidelberg, 2011
ISBN 10: 3642839479 ISBN 13: 9783642839474
Da: moluna, Greven, Germania
EUR 48,37
Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Review articles by leading scientists in their fields are brought together in this volume to provide a comprehensive treatment of photoacoustic, photothermal and photochemical processes at surfaces and in thin films. The articles introduce the fields, revie.